Abstract An electron beam testing device system for stroboscopic potential measurements of a test subject utilizes a scanning electron microscope having a beam suppression or blanking system. The blanking system deflects the electron beam across an aperture during each edge of a blanking pulse connected to control the blanking system so that two electron pulses are generated for each blanking pulse. A detector produces a signal responsive to a secondary electron beam resulting from impact of each of the electron pulses on the test subject. A signal processing unit with an associated gate circuit all preferably incorporated in a boxcar integrator processes only one of the two electron pulses associated with each blanking pulse. A phase control preferably within the boxcar integrator is connected to control the gate circuit and a blanking pulse generator for producing the blanking pulse.
An electron beam testing device system for stroboscopic potential measurements of a test subject, comprising: a scanning electron microscope having a beam suppression or blanking system in which an electron beam is deflected across an aperture in the blanking system during each edge of a blanking pulse connected to control the blanking system such that two electron pulses are generated per blanking pulse; blanking pulse generator means for producing said blanking pulse; detector means for producing a signal responsive to a secondary electron beam resulting from impact of each of the electron pulses on the test subject on which the potential measurements are being made; a signal processing means with an associated gate circuit for processing only the signal associated with one of said two electron pulses associated with each blanking pulse; and phase control means connected to control said gate circuit and said blanking pulse generator means.
Claim 2
Dependent Claim
148 words
An electron beam testing device system for stroboscopic potential measurements of a test subject, comprising: a scanning electron microscope having a beam suppression or blanking system in which an electron beam is deflected across an aperture in the blanking system during each edge of a blanking pulse connected to control the blanking system such that two electron pulses are generated per blanking pulse; blanking pulse generator means for producing said blanking pulse; detector means for producing a signal responsive to a secondary electron beam resulting from impact of each of the electron pulses on the test subject on which the potential measurements are being made; a signal processing means with an associated gate circuit for processing only the signal associated with one of said two electron pulses associated with each blanking pulse; and phase control means connected to control said gate circuit and said blanking pulse generator means.
Claim 3
Dependent Claim
23 words
A system according to claim 1 wherein the signal processing means with its associated gate circuit comprises a portion of a boxcar integrator.
Claim 4
Dependent Claim
59 words
A system according to claim 1 wherein a switching means is associated with said pulse generator means for selectively providing said blanking pulse with different reference potentials such that said blanking system produces either said two electron pulses for each side edge of the blanking pulse or one of electron pulse corresponding to a width of the blanking pulse.
Claim 5
Dependent Claim
33 words
A system according to claim 1 wherein the blanking system includes a first deflection plate which is connected to a reference potential and a second deflection plate connected to receive said blanking pulse.