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US4411978A Expired / Lapsed US ⏱️ 0.0 years remaining

Photoresist materials and processes of using with photosensitive naphthoquinone diazides and nitrones

Assignee: Agfa Gevaert NV
•
Filing: 1978-03-13
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Granted: 1983-10-25
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Expires: 1998-03-13
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Abstract

Abstract A photosensitive recording material which includes in a supported layer a mixture of photosensitive substances in admixture with one or more polymers that are soluble in an alkaline aqueous liquid, characterized in that such mixture of photosensitive substances essentially consists of: (A) at least one photosensitive nitrone of the formula: ##STR1## in which: R is an aromatic hydrocarbon group including a substituted aromatic hydrocarbon group, R 1 is an aromatic or heterocyclic group including these groups in substituted form, n represents zero or 1, and (B) at least one photosensitive naphthoquinone-(1,2)-diazide (2) compound, that has a higher ultraviolet absorption in the wavelength range of 350 to 400 nm and a higher visible light absorption above 400 nm than each such nitrone has, the (A) and (B) compounds being present in such relative quantities to each other that the layer exhibits a relative decrease in solubility in an alkaline aqueous liquid upon a sufficient exposure to a UV-light and a relative increase in solubilty in such alkaline aqueous liquid upon a lesser exposure to visible light or to UV-light.

Inventors

  • 👤 Urbain L. Laridon
  • 👤 Hendrik E. Kokelenberg
  • 👤 Rafael P. Samijn

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 16:11
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/004; G03F7/09; G03F7/095

Claims Analysis

Total Claims: 16
Claim 1
Independent Claim 167 words
A photosensitive recording material which comprises a supported layer containing a mixture of photosensitive substances in admixture with at least one polymer that is soluble in an alkaline aqueous liquid, characterized in that said mixture of photosensitive substances consists essentially of: (A) at least one negative-working photosensitive nitrone of the formula: ##STR17## in which: R is an aromatic hydrocarbon group R 1 is an aromatic or heterocyclic group, n represents zero or 1, and (B) at least one positive-working photosensitive naphthoquinone(1,2)-diazide (2) compound, having a higher ultraviolet absorption in the wavelength range of 350 to 400 nm and a higher visible light absorption above 400 nm than each such nitrone has, said (A) and (B) compounds being present in such relative quantities to each other that the layer exhibits a relative decrease in solubility in an alkaline aqueous liquid upon a sufficient exposure to a UV-light and a relative increase in solubility in an alkaline aqueous liquid upon a lesser exposure to visible light or to UV-light.
Claim 2
Dependent Claim 167 words
A photosensitive recording material which comprises a supported layer containing a mixture of photosensitive substances in admixture with at least one polymer that is soluble in an alkaline aqueous liquid, characterized in that said mixture of photosensitive substances consists essentially of: (A) at least one negative-working photosensitive nitrone of the formula: ##STR17## in which: R is an aromatic hydrocarbon group R 1 is an aromatic or heterocyclic group, n represents zero or 1, and (B) at least one positive-working photosensitive naphthoquinone(1,2)-diazide (2) compound, having a higher ultraviolet absorption in the wavelength range of 350 to 400 nm and a higher visible light absorption above 400 nm than each such nitrone has, said (A) and (B) compounds being present in such relative quantities to each other that the layer exhibits a relative decrease in solubility in an alkaline aqueous liquid upon a sufficient exposure to a UV-light and a relative increase in solubility in an alkaline aqueous liquid upon a lesser exposure to visible light or to UV-light.
Claim 3
Dependent Claim 26 words
A material according to claim 1, wherein in the nitrone R is phenyl and R 1 is phenyl, naphthyl, hydroxyphenyl, nitrophenyl, alkoxyphenyl, furyl, thienyl or bromothienyl.
Claim 4
Dependent Claim 54 words
A material according to claim 1 wherein the naphthoquinone-(1,2)-diazide (2) compound corresponds to one of the following general formulae (I) or (II): ##STR18## wherein: R 2 represents a fluorine atom, a chlorine atom, an aryl group, an aryloxy group or an arylamino group, and R 3 represents a fluorine atom or any aryloxy group.
Claim 5
Dependent Claim 19 words
A material according to claim 3, wherein the naphthoquinone-(1,2)-diazide(2) compound is naphthoquinone(1,2)-diazide-(2)-5-sulphonic acid ester of 2,3,4-trihydroxybenzophenone or naphthoquinone(1,2)-diazide(2)-5-sulphonyl fluoride.
Claim 6
Dependent Claim 13 words
A material according to claim 1, wherein the alkali-soluble polymer is a novolak.
Claim 7
Dependent Claim 18 words
A material according to claim 1, wherein the alkali-soluble polymer is a copolymer of an unsaturated carboxylic acid.
Claim 8
Dependent Claim 25 words
A material according to claim 1, wherein the weight ratio of alkali-soluble polymer to the mixture of said photosensitive compounds is between 1:1 and 7:1.
Claim 9
Dependent Claim 29 words
A material according to claim 1, wherein the layer contains from 2 to 6 parts by weight of nitrone with respect to 1 part by weight of naphthoquinone(1,2)-diazide(2) compound.
Claim 10
Dependent Claim 20 words
A material according to claim 1, wherein said layer has a thickness in the range of 0.5 to 20 μm.
Claim 11
Dependent Claim 15 words
A material according to claim 1, wherein said layer is present on a metal support.
Claim 12
Dependent Claim 23 words
A material according to claim 1, wherein said layer is present on a metallic layer that is present on a polymeric film support.
Claim 13
Dependent Claim 31 words
A material according to claim 11, wherein said metallic layer is made of tellurium or a tellurium alloy and has a thickness in the range of 50 nm to 500 nm.
Claim 14
Dependent Claim 27 words
A material according to claim 11, wherein said metallic layer is made of bismuth and has a thickness in the range of 25 nm to 300 nm.
Claim 15
Dependent Claim 76 words
A method for producing a positive photoresist comprising the steps of: (1) information-wise exposing the photosensitive layer of the material according to claim 1 to ultraviolet radiation and/or visible light of a dose sufficient to increase the solubility of the exposed portions by phototransformation of the naphthoquinone-(1,2)-diazide(2) compound without substantially affecting the nitrone, and (2) overall contacting the exposed photosensitive layer with an aqueous alkaline liquid to remove selectively the exposed portions of the photosensitive layer.
Claim 16
Dependent Claim 120 words
A method for producing a negative photoresist comprising the steps of: (1) information-wise exposing the photosensitive layer of the material according to claim 1 to ultraviolet radiation of a dose sufficient to decrease the solubility of the exposed portions by the photoproducts of the nitrone which are formed by such exposure in a higher amount than are the photoproducts of the naphthoquinone-(1,2)-diazide(2) compound(s), (2) overall exposing the photosensitive layer to ultraviolet radiation and/or visible light of a dose substantially less than that of step 1 but sufficient to improve the solubility of the initially non-exposed portions, and (3) overall contacting the exposed photosensitive layer with an aqueous alkaline liquid to remove selectively the initially non-exposed portions of the photosensitive layer.

References Cited (Backward Citations)

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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1986-10-24 1987-04-25 1987-10-25 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1990-10-24 1991-04-25 1991-10-25 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1994-10-24 1995-04-25 1995-10-25 $7700.00 Window Closed / Lapsed

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