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US4399345A Expired / Lapsed US ⏱️ 0.0 years remaining

Laser trimming of circuit elements on semiconductive substrates

Assignee: Analog Devices Inc
•
Filing: 1981-06-09
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Granted: 1983-08-16
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Expires: 2001-06-09
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Abstract

Abstract A method of laser trimming thin film resistors on semiconductive substrates wherein the laser is set to a frequency equal to or less than E g /h, where E g is the optical band-gap energy of the doped semiconductor substrate, and h is Planck's constant.

Inventors

  • 👤 Jerome F. Lapham
  • 👤 Tommy D. Clark

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 16:37
CPC Classifications
H; H01; H01C; H01C17/00; H01C17/22; H01C17/24; H01C17/242

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 97 words
The method of laser trimming of elements on a doped semiconductive substrate, wherein a laser beam is directed onto the element from the side of the substrate carrying the element and is so controlled as to vaporize or otherwise remove or alter the material of the element so as to achieve a predetermined electrical characteristic for the element; said method further comprising the step of setting the frequency of the laser at a value no greater than E g /h, where E g is the optical band-gap energy of the doped substrate and h is Planck's constant.
Claim 2
Independent Claim 97 words
The method of laser trimming of elements on a doped semiconductive substrate, wherein a laser beam is directed onto the element from the side of the substrate carrying the element and is so controlled as to vaporize or otherwise remove or alter the material of the element so as to achieve a predetermined electrical characteristic for the element; said method further comprising the step of setting the frequency of the laser at a value no greater than E g /h, where E g is the optical band-gap energy of the doped substrate and h is Planck's constant.
Claim 3
Independent Claim 87 words
The method of laser trimming of elements on a doped semiconductive substrate, wherein a laser beam is directed onto the element from the side of the substrate carrying the element and is so controlled as to vaporize or otherwise remove or alter the material of the element so as to achieve a predetermined electrical characteristic for the element; said method comprising the step of setting the laser to operate at a wavelength producing photons having an energy less than the optical band-gap energy of the doped substrate.
Claim 4
Independent Claim 87 words
The method of laser trimming of elements on a doped semiconductive substrate, wherein a laser beam is directed onto the element from the side of the substrate carrying the element and is so controlled as to vaporize or otherwise remove or alter the material of the element so as to achieve a predetermined electrical characteristic for the element; said method comprising the step of setting the laser to operate at a wavelength producing photons having an energy less than the optical band-gap energy of the doped substrate.
Claim 5
Dependent Claim 45 words
The method of claim 2, wherein the substrate is Silicon, and said laser wavelength is greater than 1.065 microns and is set at a value resulting in an absorption coefficient for said doped substrate at least 10:1 less than the absorption coefficient at 1.065 microns.
Claim 6
Dependent Claim 19 words
The method of claim 3, wherein said laser wavelength is set at a value of at least 1.1 microns.
Claim 7
Dependent Claim 20 words
The method of claim 4, wherein said laser wavelength is set at a value between 1.1 microns and 10 microns.
Claim 8
Dependent Claim 30 words
The method of claim 5, wherein said elements are thin-film resistors, and said laser wavelength is set at a value within the range of from 1.1 microns to 9 microns.
Claim 9
Dependent Claim 25 words
The method of claim 3, wherein said laser beam is produced by a YAG neodynium doped laser operated at a wavelength of about 1.34 microns.

References Cited (Backward Citations)

US3439169A Cited
US4179310A Cited
US4272733A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1986-08-15 1987-02-14 1987-08-16 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1990-08-15 1991-02-14 1991-08-16 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1994-08-15 1995-02-14 1995-08-16 $7700.00 Window Closed / Lapsed

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