Abstract A quartz crystal plate (L) is used in determining the frequency of a frequency generator, and the frequency determined by said plate is variable as a function of temperature. The quartz plate constitutes the substrate for a surface acoustic wave device, e.g. a resonator or a delay line using comb transducers (1 & 2). The orientation in the quartz crystal of the plane over which the acoustic wave propagates, and the direction of propagation in said plane are defined in terms of a doubly rotated frame of reference as follows: the plate being a double rotation cutting plate defined by yxwl: φ/θ, one large surface of which is used for the propagation of a surface wave whose direction of propagation makes an angle ψ with the second axis of rotation, where the first angle φ lies in the range 9°24' to 13°24', the second angle θ lies in the range 57°24' to 61°24', and the angle ψ lies in the range 33° to 37°.
Inventors
👤 Jean-Jacques Gagnepain
👤 Daniel Hauden
👤 Roger Coquerel
👤 Claude Pegeot
Bibliographic Details
Application Number—
JurisdictionUS
Data Sourcegoogle_patents
Last Synchronized2026-10-31 06:05
CPC Classifications
G; G01; G01K; G01K7/00; G01K7/32
Claims Analysis
Total Claims: 3
Claim 1
Independent Claim
82 words
A temperature probe comprising a surface acoustic wave propagation device used in a frequency generator device, said surface acoustic wave propagation device having a characteristic frequency which varies in accordance with the temperature and being composed of a doubly rotated quartz cutting plate defined by: yxwl: 9°24' to 13°24'/57°24' to 61°24' the surface wave being propagated on a large surface of the plate in accordance with a direction making an angle of between 33° and 37° with the axis of second rotation.
Claim 2
Dependent Claim
82 words
A temperature probe comprising a surface acoustic wave propagation device used in a frequency generator device, said surface acoustic wave propagation device having a characteristic frequency which varies in accordance with the temperature and being composed of a doubly rotated quartz cutting plate defined by: yxwl: 9°24' to 13°24'/57°24' to 61°24' the surface wave being propagated on a large surface of the plate in accordance with a direction making an angle of between 33° and 37° with the axis of second rotation.
Claim 3
Dependent Claim
38 words
The temperature probe of claim 1, wherein the quartz cutting plate is defined by: yxwl: 11°24'/59°24' and the surface wave is propagated in accordance with a direction making an angle of 35° with the axis of second rotation.