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US4396459A Expired / Lapsed US ⏱️ 0.0 years remaining

Method and solution for etching indium antimonide

Assignee: United States Department of the Air Force
•
Filing: 1982-09-16
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Granted: 1983-08-02
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Expires: 2002-09-16
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Abstract

Abstract A method for delineating defects in the <111> surface of an indium antimonide crystal wafer by treating said surface with a 5 percent solution of iodine in N,N-dimethylacetamide to form triangularly shaped etch pits in the defect area.

Inventors

  • 👤 Paul E. Herning
  • 👤 Edward Y. Sutcliffe

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 06:23
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/60; H10P50/64; H10P50/642; H10P50/646; H10P50/648

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 20 words
A solution for etching the <111> surface of an indium antimonide crystalline wafer comprising a mixture of iodine and N,N-dimethylacetamide.
Claim 2
Dependent Claim 20 words
A solution for etching the <111> surface of an indium antimonide crystalline wafer comprising a mixture of iodine and N,N-dimethylacetamide.
Claim 3
Dependent Claim 24 words
A solution in accordance with claim 1 wherein said solution comprises about 5 parts by weight of iodine with the balance substantially all N,N-dimethylacetamide.
Claim 4
Independent Claim 50 words
A method for delineating the crystal lattice defects in the <111> surface of an indium antimonide crystalline wafer which comprises the steps of treating said surface with a single solution comprised of a mixture of iodine and N,N-dimethylacetamide whereby triangularly shaped etch pits are formed to delineate areas of defect.
Claim 5
Independent Claim 50 words
A method for delineating the crystal lattice defects in the <111> surface of an indium antimonide crystalline wafer which comprises the steps of treating said surface with a single solution comprised of a mixture of iodine and N,N-dimethylacetamide whereby triangularly shaped etch pits are formed to delineate areas of defect.
Claim 6
Dependent Claim 22 words
A method in accordance with claim 3 wherein said surface is treated for a period of about 20 minutes at room temperature.
Claim 7
Dependent Claim 25 words
A method in accordance with claim 4 wherein said mixture consists essentially of about 5 parts by weight iodine and the balance substantially all N,N-dimethylacetamide.

References Cited (Backward Citations)

US3143447A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1986-08-01 1987-01-31 1987-08-02 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1990-08-01 1991-01-31 1991-08-02 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1994-08-01 1995-01-31 1995-08-02 $7700.00 Window Closed / Lapsed

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