Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
47 words
A disilicide Schottky barrier contact having a barrier potential of about 0.4 eV, comprising: an n-type silicon substrate; and a rare earth metal deposited on said n-type silicon substrate, wherein said disilicide Schottky barrier contact is formed by heating said silicon substrate and said rare earth metal.
Claim 2
Dependent Claim
47 words
A disilicide Schottky barrier contact having a barrier potential of about 0.4 eV, comprising: an n-type silicon substrate; and a rare earth metal deposited on said n-type silicon substrate, wherein said disilicide Schottky barrier contact is formed by heating said silicon substrate and said rare earth metal.
Claim 3
Dependent Claim
31 words
A disilicide Schottky barrier contact as set forth in claim 1 wherein said rare earth metal is a member of the group consisting of Ho, Gd, Er, Dy, Y and La.
Claim 4
Dependent Claim
23 words
A disilicide Schottky barrier contact as set forth in claim 2 wherein said heating is at approximately 400° C. for about 30 minutes.
Claim 5
Dependent Claim
22 words
A disilicide Schottky barrier contact as set forth in claim 3 including an oxidation barrier layer deposited on said rare earth metal.
Claim 6
Dependent Claim
39 words
A disilicide Schottky barrier contact as set forth in claim 4 wherein said oxidation barrier layer is one member of the group consisting of a transition metal Pt, Pd, Ni and refractory metals W, V, Cr, Mo and Ti.
Claim 7
Dependent Claim
47 words
A disilicide Schottky barrier contact having a barrier potential of about 0.7 eV, comprising: an p-type silicon substrate; and a rare earth metal deposited on said p-type silicon substrate, wherein said disilicide Schottky barrier contact is formed by heating said silicon substrate and said rare earth metal.
Claim 8
Dependent Claim
47 words
A disilicide Schottky barrier contact having a barrier potential of about 0.7 eV, comprising: an p-type silicon substrate; and a rare earth metal deposited on said p-type silicon substrate, wherein said disilicide Schottky barrier contact is formed by heating said silicon substrate and said rare earth metal.
Claim 9
Dependent Claim
31 words
A disilicide Schottky barrier contact as set forth in claim 6 wherein said rare earth metal is a member of the group consisting of Ho, Gd, Er, Dy, Y and La.
Claim 10
Dependent Claim
23 words
A disilicide Schottky barrier contact as set forth in claim 7 wherein said heating is at approximately 400° C. for about 30 minutes.
Claim 11
Dependent Claim
22 words
A disilicide Schottky barrier contact as set forth in claim 8 including an oxidation barrier layer deposited on said rare earth metal.
Claim 12
Dependent Claim
39 words
A disilicide Schottky barrier contact as set forth in claim 9 wherein said oxidation barrier layer is one member of the group consisting of a transition metal Pt, Pd, Ni and refractory metals W, V. Cr, Mo and Ti.