Semiconductor memory circuit

Claim 2

A semiconductor memory circuit comprising: a plurality of word lines which are selectively activated in response to an address signal; a plurality of memory cell bit lines; a plurality of memory cells each connected to one of said word lines for activation thereby and connected to one of said memory cell bit lines for data transfer therethrough; a data line; means responsive to an address signal for selectively connecting one of said memory cell bit lines to said data line; a reference bit line; a plurality of reference cells connected respectively to said word lines for activation thereby said reference cells connected to provide a reference signal at said reference bit line, said reference signal having a static state when one of said reference cells is activated for a time period greater than the discharge time of said reference bit line and said reference signal having a dynamic state when said reference cells are accessed at a rate having a period less than the discharge time of said reference bit line; means for clamping said memory cell bit lines to limit a voltage excursion thereof to a first clamp voltage, and for clamping said reference bit line to limit a voltage excursion thereof to a second clamp voltage different from said first clamp voltage; and a sense amplifier having first and second inputs connected respectively to said data line and to said reference bit line for generating a data output signal which is a function of the amplitudes of said reference signal and the voltage on said data line.

Claim 3

The semiconductor memory circuit recited in claim 1 wherein each of said memory cells is fabricated to have one of a plurality of voltage thresholds wherein each of said voltage thresholds correspond to data states, said memory circuit functioning as a read only memory, and each of said reference cells fabricated to have one of said voltage thresholds.

Claim 4

The semiconductor memory circuit recited in claim 1 wherein each of said reference cells in a transistor having a predetermined threshold voltage and having the gate terminal thereof connected to the corresponding word line and the source and drain terminals thereof connected between said reference bit line and a column line.

Claim 5

The semiconductor memory circuit recited in claim 1 wherein said means for clamping comprises: a plurality of serially connected resistors having first and second taps and connected between first and second power terminals; a plurality of first transistors corresponding respectively to said memory cell bit line, each of said first transistors having the gate terminal thereof connected to said first tap, the drain terminal thereof connected to said first power terminal and the source terminal thereof connected to the corresponding memory cell bit line; and a second transistor having the gate terminal thereof connected to said second tap, the drain terminal thereof connected to said first power terminal and the source terminal thereof connected to said bit line.

Claim 6

The semiconductor memory circuit recited in claim 1 including means for pulling said bit lines and said data line toward a selected voltage state.

Claim 7

A semiconductor read only memory circuit, comprising: a plurality of word lines which are selectively activated in response to an address signal; a plurality of memory transistor bit lines; a plurality of memory transistor column lines; a plurality of memory transistors each fabricated to have one of a plurality of predetermined voltage thresholds which correspond to data states, each of said memory transistors having the gate terminal thereof connected to a corresponding one of said word lines, the drain and source terminals thereof connected between corresponding ones of said bit lines and said column lines; means responsive to an address signal for selecting one of said memory transistor bit lines and one of said memory transistor column lines and connecting the selected memory transistor bit lines to said data line and for connecting said selected memory transistor column line to a common node; a reference bit line; a reference column line; a plurality of reference transistors each fabricated to have one of said threshold voltages, said reference transistors having the gate terminals thereof connected respectively to said word lines and having the source and drain terminals thereof connected between said reference bit line and said reference column line, said reference transistors providing a reference signal to said reference bit line; means for clamping said memory transistor bit lines to limit a voltage excursion thereof to a first clamp voltage and for clamping said reference bit line to limit a voltage excursion thereof to a second clamp voltage different from said first clamp voltage; and a sense amplifier having first and second inputs connected respectively to said data line and to said reference bit line for generating a data output signal which is a function of the amplitudes of said reference signal and the voltage on said data line.

Claim 8

A semiconductor read only memory circuit, comprising: a plurality of word lines which are selectively activated in response to an address signal; a plurality of memory transistor bit lines; a plurality of memory transistor column lines; a plurality of memory transistors each fabricated to have one of a plurality of predetermined voltage thresholds which correspond to data states, each of said memory transistors having the gate terminal thereof connected to a corresponding one of said word lines, the drain and source terminals thereof connected between corresponding ones of said bit lines and said column lines; means responsive to an address signal for selecting one of said memory transistor bit lines and one of said memory transistor column lines and connecting the selected memory transistor bit lines to said data line and for connecting said selected memory transistor column line to a common node; a reference bit line; a reference column line; a plurality of reference transistors each fabricated to have one of said threshold voltages, said reference transistors having the gate terminals thereof connected respectively to said word lines and having the source and drain terminals thereof connected between said reference bit line and said reference column line, said reference transistors providing a reference signal to said reference bit line; means for clamping said memory transistor bit lines to limit a voltage excursion thereof to a first clamp voltage and for clamping said reference bit line to limit a voltage excursion thereof to a second clamp voltage different from said first clamp voltage; and a sense amplifier having first and second inputs connected respectively to said data line and to said reference bit line for generating a data output signal which is a function of the amplitudes of said reference signal and the voltage on said data line.

Claim 9

The semiconductor read only memory circuit recited in claim 1 wherein said means for clamping comprises: a plurality of serially connected resistors forming a voltage divider having first and second taps and connected between first and second power terminals; a plurality of first transistors corresponding respectively to said memory transistor bit lines, each of said first transistors having the gate terminal thereof connected to said first tap, the drain terminal thereof connected to said first power terminal and the source terminal thereof connected to the corresponding memory transistor bit line; and a second transistor having the gate terminal thereof connected to said second tap, the drain terminal thereof connected to said first power terminal and the source terminal thereof connected to said reference bit line.