US4383885A
Expired / Lapsed
US
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Reactive sputter etching of polysilicon utilizing a chlorine etch gas
Assignee: AT&T Inc
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Filing: 1981-09-08
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Granted: 1983-05-17
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Expires: 2001-09-08
Abstract
Abstract In a chlorine plasma, reactive sputter etching of monocrystalline silicon, undoped polycrystalline silicon or doped polycrystalline silicon is achieved. The etching processes are substantially free of any loading effects and are characterized by high resolution, excellent uniformity and high selectivity with respect to, for example, silicon dioxide. For silicon and undoped polysilicon, the edge profile of the etched material is anisotropic. For doped polysilicon, the edge profile can be controlled to occur anywhere in the range from completely isotropic to completely anisotropic.
Inventors
- 👤 Dan Maydan
- 👤 David N. Wang
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 00:50
CPC Classifications
C; C04; C04B; C04B41/00; C04B41/53; C04B41/5338; C04B41/5346; H; H10; H10P; H10P50/00; H10P50/20; H10P50/24; H10P50/242; H10P50/26; H10P50/264; H10P50/266; H10P50/267; H10P50/268
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
163 words
A method for fabricating a microminiature device in accordance with a process sequence that includes at least one step in which a doped polycrystalline silicon layer of the device is to be anisotropically etched in a reactive sputter etching apparatus that comprises a plasma established between an anode electrode and a cathode electrode which holds the device to be etched, the plasma resulting from imposition of an electric field across a gaseous environment established between said electrodes, wherein the gaseous environment comprises essentially pure chlorine, wherein in said apparatus a chlorine pressure of approximately 2-to-50 microns is established and in which apparatus the power density at the surface of the member being etched is set at approximately 0.30-to-2 watts per square centimeter, wherein said doped polycrystalline silicon layer includes on the top surface thereof to be etched a patterned masking layer, and wherein in the etching apparatus the bottom surface of said device is maintained in direct electrical contact with said cathode electrode.
Claim 2
Independent Claim
163 words
A method for fabricating a microminiature device in accordance with a process sequence that includes at least one step in which a doped polycrystalline silicon layer of the device is to be anisotropically etched in a reactive sputter etching apparatus that comprises a plasma established between an anode electrode and a cathode electrode which holds the device to be etched, the plasma resulting from imposition of an electric field across a gaseous environment established between said electrodes, wherein the gaseous environment comprises essentially pure chlorine, wherein in said apparatus a chlorine pressure of approximately 2-to-50 microns is established and in which apparatus the power density at the surface of the member being etched is set at approximately 0.30-to-2 watts per square centimeter, wherein said doped polycrystalline silicon layer includes on the top surface thereof to be etched a patterned masking layer, and wherein in the etching apparatus the bottom surface of said device is maintained in direct electrical contact with said cathode electrode.
Claim 3
Independent Claim
172 words
A method for fabricating a microminiature device in accordance with a process sequence that includes at least one dry etching step in which a workpiece comprising a doped polysilicon layer having a patterned masking layer on the surface thereof is to be anisotropically etched in a reactive sputter etching apparatus that comprises a plasma established between spaced-apart electrodes only one of which holds a member to be etched and the other of which is grounded, said one electrode being smaller in area than the other electrode, said plasma resulting from imposition of an electric field across a gaseous environment introduced between said electrodes, said field resulting from the capacitive coupling of a radio-frequency source to said one electrode to dc bias said electrode to constitute the cathode electrode in said apparatus during the entirety of said etching step, wherein said gaseous environment comprises essentially pure chlorine, and wherein in the etching apparatus said workpiece including said doped polysilicon layer to be etched is maintained in direct electrical contact with said cathode electrode.
Claim 4
Independent Claim
172 words
A method for fabricating a microminiature device in accordance with a process sequence that includes at least one dry etching step in which a workpiece comprising a doped polysilicon layer having a patterned masking layer on the surface thereof is to be anisotropically etched in a reactive sputter etching apparatus that comprises a plasma established between spaced-apart electrodes only one of which holds a member to be etched and the other of which is grounded, said one electrode being smaller in area than the other electrode, said plasma resulting from imposition of an electric field across a gaseous environment introduced between said electrodes, said field resulting from the capacitive coupling of a radio-frequency source to said one electrode to dc bias said electrode to constitute the cathode electrode in said apparatus during the entirety of said etching step, wherein said gaseous environment comprises essentially pure chlorine, and wherein in the etching apparatus said workpiece including said doped polysilicon layer to be etched is maintained in direct electrical contact with said cathode electrode.
Claim 5
Dependent Claim
43 words
A method as in claim 2 wherein in said apparatus a chlorine pressure of approximately 2-to-50 microns is established and in which apparatus the power density at the surface of the member being etched is set at approximately 0.03-to-2 watts per square centimeter.
Claim 6
Dependent Claim
24 words
A method as in claim 3 wherein chlorine gas is flowed into said apparatus at a rate of approximately 2-to-150 cubic centimeters per minute.
Claim 7
Dependent Claim
133 words
In a device fabrication sequence, a method for anisotropically etching a layer of doped polysilicon disposed on a semiconductor member, said method comprising the steps of forming a patterned masking layer on the surface of said doped polysilicon layer, placing said member in direct electrical contact with one of two spaced-apart electrodes in the reaction chamber of a reactive sputter etching apparatus, establishing a gaseous atmosphere in the space between said electrodes, said atmosphere comprising at least approximately 50 volume percent chlorine and being characterized in that chlorine is the only source in said gaseous atmosphere of reactive etching species for the doped polysilicon layer, and applying an electric potential between said electrodes to activate said gaseous atmosphere to produce a plasma that contains reactive species that etch said doped polysilicon layer anisotropically.
Claim 8
Dependent Claim
133 words
In a device fabrication sequence, a method for anisotropically etching a layer of doped polysilicon disposed on a semiconductor member, said method comprising the steps of forming a patterned masking layer on the surface of said doped polysilicon layer, placing said member in direct electrical contact with one of two spaced-apart electrodes in the reaction chamber of a reactive sputter etching apparatus, establishing a gaseous atmosphere in the space between said electrodes, said atmosphere comprising at least approximately 50 volume percent chlorine and being characterized in that chlorine is the only source in said gaseous atmosphere of reactive etching species for the doped polysilicon layer, and applying an electric potential between said electrodes to activate said gaseous atmosphere to produce a plasma that contains reactive species that etch said doped polysilicon layer anisotropically.
Claim 9
Dependent Claim
14 words
A method as in claim 5 wherein said gaseous atmosphere comprises essentially pure chlorine.
Claim 10
Dependent Claim
20 words
A method as in claim 5 wherein said gaseous atmosphere comprises approximately 75-to-80 volume percent chlorine and a noble gas.
Claim 11
Dependent Claim
18 words
A method as in claim 5 wherein said gaseous atmosphere comprises approximately 75-to-80 volume percent chlorine and nitrogen.
Claim 12
Dependent Claim
18 words
A method as in claim 5 wherein said gaseous atmosphere comprises approximately 50 volume percent chlorine and helium.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-05-16 | 1986-11-15 | 1987-05-17 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-05-16 | 1990-11-15 | 1991-05-17 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-05-16 | 1994-11-15 | 1995-05-17 | $7700.00 | Window Closed / Lapsed |