US4382182A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of displaying an image of phase contrast in a scanning transmission electron microscope
Assignee: Hitachi Ltd
•
Filing: 1981-05-22
•
Granted: 1983-05-03
•
Expires: 2001-05-22
Abstract
Abstract A method of and apparatus for displaying an image of phase contrast in a scanning transmission electron microscope, in which an electron beam flux transmitted through a specimen is deflected with a high frequency and repeatedly moved on an aperture provided in a region where a transmitted electron beam and a scattered electron beam interfere, and among signal components detected by a detector through the aperture, only a signal synchronous with the high frequency is sampled and detection-rectified, whereby the difference of the intensities of the region where both the electron beams interfere is detected so as to display the image of phase contrast of the specimen.
Inventors
- 👤 Takashi Matsuzaka
- 👤 Hideo Todokoro
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 13:48
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/26; H01J37/28
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
137 words
A method of displaying an image of phase contrast in a scanning transmission electron microscope, which comprises the steps of: illuminating a specimen with a primary electron beam, deflecting a flux of electron beams transmitted through said specimen with high frequency, said flux of electron beams comprising a transmitted electron beam and scattered electron beams, so that said flux of electron beams is reciprocated of an aperture provided in an interfering region of said transmitted electron beam and said scattered electron beams, using a detector to detect electron beams that have passed through said aperture, said detector providing signals representative of said detected beams, picking out from the detector signals a signal component synchronized with said high frequency, detection-rectifying the synchronized signal component, and supplying the detection-rectified signal as an intensity modulation signal to a display equipment.
Claim 2
Independent Claim
137 words
A method of displaying an image of phase contrast in a scanning transmission electron microscope, which comprises the steps of: illuminating a specimen with a primary electron beam, deflecting a flux of electron beams transmitted through said specimen with high frequency, said flux of electron beams comprising a transmitted electron beam and scattered electron beams, so that said flux of electron beams is reciprocated of an aperture provided in an interfering region of said transmitted electron beam and said scattered electron beams, using a detector to detect electron beams that have passed through said aperture, said detector providing signals representative of said detected beams, picking out from the detector signals a signal component synchronized with said high frequency, detection-rectifying the synchronized signal component, and supplying the detection-rectified signal as an intensity modulation signal to a display equipment.
Claim 3
Dependent Claim
42 words
A method according to claim 1, wherein said step of deflecting is effected using a deflector between said specimen and said aperture, said deflector deflecting said flux of electron beams, and using a power supply for supplying high frequency to the deflector.
Claim 4
Dependent Claim
44 words
A method according to claim 2, comprising using a lock-in amplifier to supply the power at said high frequency to said deflector, to pick out said signal component synchronized with the high frequency from said detector signals, and to detection-rectify said synchronized signal component.
Claim 5
Dependent Claim
150 words
In a scanning transmission electron microscope, apparatus for displaying an image of phase contrast comprising means for illuminating a specimen with a primary electron beam; deflecting means for deflecting at high frequency a flux of electron beams transmitted through said specimen as a result of said primary electron beam, said flux of electron beams including a transmitted electron beam and scattered electron beams; an aperture plate having an aperture disposed in an interfering region of said transmitted electron beam and said scattered electron beams, said flux of electron beams being reciprocated at said high frequency across said aperture; detector means for detecting the electron beams passing through said aperture and producing an output signal representative thereof; signal processing means for picking out a signal component of said output signal which is synchronized with said high frequency and detection-rectifying said synchronized signal component; and display means for displaying said detection-rectified signal.
Claim 6
Dependent Claim
150 words
In a scanning transmission electron microscope, apparatus for displaying an image of phase contrast comprising means for illuminating a specimen with a primary electron beam; deflecting means for deflecting at high frequency a flux of electron beams transmitted through said specimen as a result of said primary electron beam, said flux of electron beams including a transmitted electron beam and scattered electron beams; an aperture plate having an aperture disposed in an interfering region of said transmitted electron beam and said scattered electron beams, said flux of electron beams being reciprocated at said high frequency across said aperture; detector means for detecting the electron beams passing through said aperture and producing an output signal representative thereof; signal processing means for picking out a signal component of said output signal which is synchronized with said high frequency and detection-rectifying said synchronized signal component; and display means for displaying said detection-rectified signal.
Claim 7
Dependent Claim
16 words
Apparatus according to claim 4, wherein said signal processing means is provided as a lock-in amplifier.
Claim 8
Dependent Claim
52 words
Apparatus according to claim 4, wherein said illuminating means includes means for scanning said primary electron beam on said specimen with a velocity v, and wherein said high frequency is such that v/f<d with f being equal to said high frequency and d being equal to the resolution of the electron microscope.
References Cited (Backward Citations)
US3908124A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-05-02 | 1986-11-01 | 1987-05-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-05-02 | 1990-11-01 | 1991-05-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-05-02 | 1994-11-01 | 1995-05-03 | $7700.00 | Window Closed / Lapsed |