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US4376947A Expired / Lapsed US ⏱️ 0.0 years remaining

Electrically programmable floating gate semiconductor memory device

Assignee: Texas Instruments Inc
•
Filing: 1979-09-04
•
Granted: 1983-03-15
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Expires: 1999-09-04
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Abstract

Abstract An N-channel, double level poly, MOS read only memory or ROM array is electrically programmable by floating gates positioned beneath control gates formed by row address lines. The cells may be electrically programmed by applying selected voltages to the source, drain, control gate and substrate; the floating gate is charged through an insulator between the floating gate and the channel. A simplified process for fabrication of the devices eliminates photoresist and implant steps yet produces improved characteristics in the form of higher gain and lower body effect.

Inventors

  • 👤 Te-Long Chiu
  • 👤 Jih-Chang Lien

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 01:17
CPC Classifications
H; H10; H10D; H10D62/00; H10D62/10; H10D62/13; H10D62/149; H10D62/151; G; G11; G11C; G11C16/00; G11C16/02; G11C16/04; G11C16/0408; G11C16/0416; H10D30/00; H10D30/60; H10D30/68; H10D30/681; H10D30/684; H10D30/685

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 130 words
An electrically programmable, nonvolatile, floating gate semiconductor memory cell comprising: an MOS transistor device formed in a face of a semiconductor body of one type and having a deep source and a deep drain of the opposite type as well as a shallow source and shallow drain of said opposite type, a channel area between said shallow source and drain, a floating gate and a control gate overlying the channel area, the control gate larger than the floating gate and the deep source and deep drain being self-aligned with the control gate, and a region of said one type doped more heavily than said body adjacent said shallow drain occupying part of the channel area but not all of the channel area, said region being self-aligned with said floating gate.
Claim 2
Dependent Claim 130 words
An electrically programmable, nonvolatile, floating gate semiconductor memory cell comprising: an MOS transistor device formed in a face of a semiconductor body of one type and having a deep source and a deep drain of the opposite type as well as a shallow source and shallow drain of said opposite type, a channel area between said shallow source and drain, a floating gate and a control gate overlying the channel area, the control gate larger than the floating gate and the deep source and deep drain being self-aligned with the control gate, and a region of said one type doped more heavily than said body adjacent said shallow drain occupying part of the channel area but not all of the channel area, said region being self-aligned with said floating gate.
Claim 3
Dependent Claim 16 words
A cell according to claim 1 wherein the control gate and floating gate are polycrystalline silicon.
Claim 4
Dependent Claim 44 words
A cell according to claim 1 wherein a second region of said one type doped more heavily than said body is included in said channel area adjacent said shallow source occupying a part of the channel area but not all of the channel area.

References Cited (Backward Citations)

US3868187A Cited
US4161039A Cited
US4199996A Cited
US4122544A Cited
US4151021A Cited
US4258378A Cited
US4222063A Cited
US4302766A Cited
US4317273A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1986-03-14 1986-09-13 1987-03-15 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1990-03-14 1990-09-13 1991-03-15 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1994-03-14 1994-09-13 1995-03-15 $7700.00 Window Closed / Lapsed

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