US4362991A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Integrated circuit test probe assembly
Assignee: Unisys Corp
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Filing: 1980-12-12
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Granted: 1982-12-07
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Expires: 2000-12-12
Abstract
Abstract The present disclosure describes a probe assembly for use in the testing of integrated circuits. More specifically, the probe assembly finds particular application in high density printed circuit board configurations of flat pack integrated circuit (IC) packages. The invention is characterized by its ability to be readily positioned in either coordinate axis, so as to access all of the IC packages regardless of their mounting position. The probe itself is designed to separate and insulate the IC package leads from one another. Moreover, the point of electrical contact of the probe on the leads is predetermined and reproducible. Finally, the probe automatically locks on to the desired IC leads and exerts a force thereon which is independent of that applied by the operator. Electrical and mechanical damage which might otherwise result to the printed circuit board and the IC package is virtually eliminated by the probe assembly.
Inventors
- 👤 Joseph C. Carbine
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 17:40
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/06705
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
334 words
An integrated circuit test probe assembly for probing selected leads of operational integrated circuit packages mounted on an interconnection medium comprising in combination: a probing frame removably mounted over said interconnection medium, said frame including a pair of opposed planar sides having respective bars elevated from the surfaces thereof and oriented parallel thereto, a probe support slidably mounted in one rectangular coordinate axis on said bars of said probing frame and oriented in orthogonal relation thereto, said probe support comprising a pair of end blocks for engaging the respective pair of bars of said probing frame and a plurality of parallel spaced-apart rods, each of said rods having its opposite extremities supported by the respective pair of end blocks, a test probe adapted to be carried by said rods of said probe support and being movable above said interconnection medium in the opposite rectangular coordinate axis, said test probe comprising a body and a cover therefor, said body including a plurality of spaced-apart tooth-like projections at its forward extremity, a plurality of spring-actuated plunger type contacts mounted in said body and protruding externally thereof between respective adjacent ones of said tooth-like projections, a plurality of electrical conductors each having an extremity connected to one of said plurality of contacts and its opposite extremity external to said body, a spring member attached within said body, a plurality of slots in said body and said cover for permitting portions of said spring member to appear externally thereto, said test probe being further adapted to be moved toward said selected leads of an integrated circuit package in a direction substantially orthogonal to the surface of said interconnection medium, said contacts engaging said selected leads and said tooth-like projections separating and insulating the latter from one another, said spring member causing said body of said test probe to be locked onto one of said rods of said probe support in substantial concurrence with the attainment of contact of said tooth-like projections with said surface of said interconnection medium.
Claim 2
Dependent Claim
334 words
An integrated circuit test probe assembly for probing selected leads of operational integrated circuit packages mounted on an interconnection medium comprising in combination: a probing frame removably mounted over said interconnection medium, said frame including a pair of opposed planar sides having respective bars elevated from the surfaces thereof and oriented parallel thereto, a probe support slidably mounted in one rectangular coordinate axis on said bars of said probing frame and oriented in orthogonal relation thereto, said probe support comprising a pair of end blocks for engaging the respective pair of bars of said probing frame and a plurality of parallel spaced-apart rods, each of said rods having its opposite extremities supported by the respective pair of end blocks, a test probe adapted to be carried by said rods of said probe support and being movable above said interconnection medium in the opposite rectangular coordinate axis, said test probe comprising a body and a cover therefor, said body including a plurality of spaced-apart tooth-like projections at its forward extremity, a plurality of spring-actuated plunger type contacts mounted in said body and protruding externally thereof between respective adjacent ones of said tooth-like projections, a plurality of electrical conductors each having an extremity connected to one of said plurality of contacts and its opposite extremity external to said body, a spring member attached within said body, a plurality of slots in said body and said cover for permitting portions of said spring member to appear externally thereto, said test probe being further adapted to be moved toward said selected leads of an integrated circuit package in a direction substantially orthogonal to the surface of said interconnection medium, said contacts engaging said selected leads and said tooth-like projections separating and insulating the latter from one another, said spring member causing said body of said test probe to be locked onto one of said rods of said probe support in substantial concurrence with the attainment of contact of said tooth-like projections with said surface of said interconnection medium.
Claim 3
Dependent Claim
104 words
A test probe assembly as defined in claim 1 further characterized in that the end blocks each include a pair of apertures substantially centrally disposed with respect to its longitudinal axis for loosely receiving the respective opposite extremities of a first and a second of said plurality of rods, said end blocks each further having a third aperture adjacent one extremity thereof for loosely holding the extremities of a third of said plurality of rods, the first and second of said rods being coplanar in one axis and said second and third of said rods being coplanar in an axis orthogonal to the former.
Claim 4
Dependent Claim
123 words
A test probe assembly as defined in claim 2 further characterized in that each of said end blocks includes at its other extremity a pair of longitudinally disposed spaced-apart openings connected to each other by a slotted region and oriented in a direction parallel to that of said bars of said support frame, said last mentioned extremity being thereby formed into two leg sections, a bore and a counterbore oriented substantially transverse to said pair of spaced apart openings and disposed in said slotted region, a threaded sleeve mounted within said counterbore, and a thumbscrew for engaging said sleeve via said bore, the one of said openings in proximity to the extremities of said leg sections engaging a bar of said support frame.
Claim 5
Dependent Claim
142 words
A test probe assembly as defined in claim 3 further characterized in that said spring member is of unitary construction having a generally U-shaped geometry, the open ends of said spring member being affixed within said body of said test probe in substantial planar relationship therewith, said spring member having succeeding adjacent symmetrical portions which include hairpin loops angularly protruding through said slots in said cover, sloped portions protruding through said slots in one surface of said body, straight portions commencing external to the last mentioned surface and exiting through said last mentioned slots in said cover and angled portions terminating in a common rectangular loop, said test probe being locked in position during the probing operation by virtue of the disposition of said third of said plurality of rods of said probe support behind said straight portions of said spring member.
Claim 6
Dependent Claim
37 words
A test probe assembly as defined in claim 4 further including a substantially planar section fastened to the rearward extremity of said test probe for providing a finger grip for manipulating the test probe into operating position.
Claim 7
Dependent Claim
33 words
A test probe assembly as defined in claim 5 further characterized in that said interconnection medium is a printed circuit board and that said integrated circuit packages are of the flat pack type.
Claim 8
Dependent Claim
71 words
A test probe assembly as defined in claim 6 wherein the length of the leads measured between the edge of the flat pack and the right angle bend toward the printed circuit board is uniform, the distance between the edge of the body of said test probe and the center of said contacts being chosen such that said leads may be repeatedly engaged at a point just prior to said bend.
Claim 9
Dependent Claim
24 words
A test probe assembly as defined in claim 7 wherein said body and said cover of said test probe are formed of insulative material.
Claim 10
Dependent Claim
67 words
A test probe assembly as defined in claim 8 further including a fixture for holding said printed circuit board, said fixture having a plurality of pins, each pin having a conical head and a spring loaded disc, said probing frame having a plurality of keyhole shaped slots homologously positioned with respect to said pins for receiving the conical heads and for being seated against the discs thereof.
References Cited (Backward Citations)
US3787768A
Cited
US4195258A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1985-12-06 | 1986-06-07 | 1986-12-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1989-12-06 | 1990-06-07 | 1990-12-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1993-12-06 | 1994-06-07 | 1994-12-07 | $7700.00 | Window Closed / Lapsed |