US4358891A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of forming a metal semiconductor field effect transistor
Assignee: Unisys Corp
•
Filing: 1981-08-31
•
Granted: 1982-11-16
•
Expires: 2001-08-31
Abstract
Abstract A metal silicon field effect transistor and the method of producing such a transistor whereby all of the elements of the transistor are defined by a single masking step. These elements include the channel of the first effect transistor as well as the source and drain regions therefor and also the gate which completes the transistor. The transistor is formed by depositing a doped polysilicon layer on the surface of the semiconductor substrate, depositing an oxide layer thereover and opening a via in the insulating layer and the doped polysilicon layer to expose the silicon substrate. The channel is formed by ion implant through the via thus opened. The doped polysilicon layer serves as a diffusant source for the formation of the source and drain regions of the transistor which regions are defined by the via. The via then serves to define the area where the gate is to be formed in contact with the substrate region containing the channel.
Inventors
- 👤 Bruce Roesner
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 04:25
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/061; H10D30/80; H10D30/87; H10D30/0612; H10D30/0616; H10D62/00; H10D62/80; H10D62/83; H10P; H10P32/00; H10P32/10; H10P32/14; H10P32/1408; H10P32/1414; H10P32/17; H10P32/171; Y; Y10; Y10S; Y10S148/00; Y10S148/018; Y10S148/02; Y10S148/082; Y10S148/088; Y10S148/147
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
168 words
A method of forming a metal semiconductor field effect transistor, said method comprising the steps of: forming a conductor which contains dopant atoms on a surface of a semiconductor substrate; forming a first insulating layer over said conductor and said surface of said substrate; opening a first via in said first insulating layer and said conductor to expose said substrate and said conductor; implanting impurities of a given conductivity through said via into said substrate to form a lightly doped channel region of said transistor; forming a second insulating layer in said first via such that it covers the exposed substrate and conductor; diffusing said dopant atoms from said conductor into said substrate to form heavily doped source and drain regions of said transistor; opening a second via in said second insulating layer to expose said substrate between said diffused dopant atoms without exposing said conductor; and depositing a metal layer in said second via in electrical contact with said substrate to form a gate of said transistor.
Claim 2
Independent Claim
168 words
A method of forming a metal semiconductor field effect transistor, said method comprising the steps of: forming a conductor which contains dopant atoms on a surface of a semiconductor substrate; forming a first insulating layer over said conductor and said surface of said substrate; opening a first via in said first insulating layer and said conductor to expose said substrate and said conductor; implanting impurities of a given conductivity through said via into said substrate to form a lightly doped channel region of said transistor; forming a second insulating layer in said first via such that it covers the exposed substrate and conductor; diffusing said dopant atoms from said conductor into said substrate to form heavily doped source and drain regions of said transistor; opening a second via in said second insulating layer to expose said substrate between said diffused dopant atoms without exposing said conductor; and depositing a metal layer in said second via in electrical contact with said substrate to form a gate of said transistor.
Claim 3
Dependent Claim
37 words
A method according to claim 1 wherein said second via is opened by a plasma etch which preferentially removes said second insulating layer over said substrate as compared to removing said second insulating layer over said conductor.
Claim 4
Dependent Claim
43 words
A method according to claim 1 wherein said second via is opened by implanting said second insulator parallel to said surface, and thereafter removing said implanted insulator by a chemical etch which preferentially etches said implanted insulator as compared to the non-implanted insulator.
Claim 5
Dependent Claim
30 words
A method according to claim 1 wherein said first insulating layer is undercut so as to extend beyond said conductor in a cantilevered fashion when said first via is opened.
Claim 6
Dependent Claim
14 words
A method according to claim 1 wherein said conductor is comprised of doped polysilicon.
Claim 7
Dependent Claim
16 words
A method according to claim 1 wherein said dopant atoms are of an N type conductivity.
Claim 8
Dependent Claim
13 words
A method according to claim 1 wherein said substrate is comprised of silicon.
Claim 9
Dependent Claim
46 words
A method according to claim 1 wherein metal layer is deposited by forming platinum silicide on said substrate in said second via, forming a layer of material selected from the group of tungsten and titanium-tungsten over said platinum silicide and, forming a layer of aluminum thereover.
Claim 10
Dependent Claim
225 words
For use in fabricating a metal semiconductor field effect transistor, a single mask method of fabricating a channel for said transfer and a gate in self-alignment with said channel said method including the steps of: forming a conductor on a surface of a semiconductor substrate; forming a first insulating layer over said conductor and said surface of said substrate; using said single mask to open a first via in said first insulating layer and said conductor which divides said conductor into two spaced-apart portions, exposes said substrate between said spaced-apart portions, and exposes respective sidewalls of said two conductor portions that undercut said first insulating layer; implanting impurities of a given conductivity through said via into said substrate to form said channel; forming a second insulating layer in said first via such that it covers said exposed substrate and respective conductor sidewalls; selectively removing said second insulating layer on said substrate between said respective sidewalls to there expose a portion of said substrate while leaving said second insulating layer on said respective sidewalls, said selective removing being performed without the aid of another mask by an etching step that preferentially etches said insulating layer on said substrate surface as opposed to said insulating layer on said sidewalls; and depositing a metal layer in electrical contact with said portion of said substrate to form said gate.
Claim 11
Dependent Claim
225 words
For use in fabricating a metal semiconductor field effect transistor, a single mask method of fabricating a channel for said transfer and a gate in self-alignment with said channel said method including the steps of: forming a conductor on a surface of a semiconductor substrate; forming a first insulating layer over said conductor and said surface of said substrate; using said single mask to open a first via in said first insulating layer and said conductor which divides said conductor into two spaced-apart portions, exposes said substrate between said spaced-apart portions, and exposes respective sidewalls of said two conductor portions that undercut said first insulating layer; implanting impurities of a given conductivity through said via into said substrate to form said channel; forming a second insulating layer in said first via such that it covers said exposed substrate and respective conductor sidewalls; selectively removing said second insulating layer on said substrate between said respective sidewalls to there expose a portion of said substrate while leaving said second insulating layer on said respective sidewalls, said selective removing being performed without the aid of another mask by an etching step that preferentially etches said insulating layer on said substrate surface as opposed to said insulating layer on said sidewalls; and depositing a metal layer in electrical contact with said portion of said substrate to form said gate.
References Cited (Backward Citations)
US3804681A
Cited
US3639186A
Cited
US3942241A
Cited
US3906540A
Cited
US4045248A
Cited
US4048712A
Cited
US4304042A
Cited
US4305760A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1985-11-15 | 1986-05-17 | 1986-11-16 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1989-11-15 | 1990-05-17 | 1990-11-16 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1993-11-15 | 1994-05-17 | 1994-11-16 | $7700.00 | Window Closed / Lapsed |