US4357364A
Expired / Lapsed
US
⏱️ 0.0 years remaining
High rate resist polymerization method
Assignee: Conexant Systems LLC
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Filing: 1981-04-27
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Granted: 1982-11-02
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Expires: 2001-04-27
Abstract
Abstract An improvement in the method of forming polymerization resists by directing high energy particles such as electron beams along a path across a vacuum chamber and onto polymerizable molecular species at a substrate surface with sufficient energy to polymerize the polymerizable molecular species in situ is provided, comprising maintaining a chamber-isolated relatively higher pressure layer of polymerizable molecular species vapor locally at the substrate surface during, e.g. electron beam exposure to form the resist while maintaining the beam path free of polymerizable molecular species during beam traverse of the chamber. Polymerization resist generation apparatus is also provided comprising a high energy particle, e.g. electron beam source including an electron beam gun and a vacuum chamber therebeyond, means adapted to support a substrate having a surface on which a resist is to be generated in electron beam exposed relation, means defining a closed volume between the supported substrate and the electron beam source, and means to introduce polymerizable molecular species vapor into the closed volume for electron beam exposure and polymerization in situ on the substrate surface.
Inventors
- 👤 Addison B. Jones
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 04:59
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/20; G03F7/2051; G03F7/2059; Y; Y10; Y10S; Y10S438/00; Y10S438/942
Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
84 words
In the method of forming polymerization resists, which includes directing high energy particles along a path across a vacuum chamber and onto polymerizable molecular species at a substrate surface with sufficient energy to polymerize the polymerizable molecular species in situ, the improvement comprising maintaining a chamber-isolated relatively higher pressure layer of polymerizable molecular species vapor locally at said substrate surface during high energy particle exposure to form the resist while maintaining said particle path free of said vapor during beam traverse of said chamber.
Claim 2
Dependent Claim
84 words
In the method of forming polymerization resists, which includes directing high energy particles along a path across a vacuum chamber and onto polymerizable molecular species at a substrate surface with sufficient energy to polymerize the polymerizable molecular species in situ, the improvement comprising maintaining a chamber-isolated relatively higher pressure layer of polymerizable molecular species vapor locally at said substrate surface during high energy particle exposure to form the resist while maintaining said particle path free of said vapor during beam traverse of said chamber.
Claim 3
Dependent Claim
47 words
The method according to claim 1, wherein said polymerizable molecular species vapor layer is at a vapor pressure which at a given thickness is normally disruptive of electron beam travel, and including also maintaining said polymerizable molecular species layer at a lesser thickness than said given thickness.
Claim 4
Dependent Claim
28 words
The method according to claim 2, including also maintaining said polymerizable molecular species layer at a pressure between about 10 -4 and 1 Torr. during electron beam exposure.
Claim 5
Dependent Claim
16 words
The method according to claim 1, wherein said polymerizable molecular species is a crosslinkable polymer precursor.
Claim 6
Dependent Claim
20 words
The method according to claim 1, including also selectively communicating said layer with a polymerizable vapor supply beyond said chamber.
Claim 7
Dependent Claim
23 words
The method according to claim 1, including also generating an electron beam or ion beam as the source of said high energy particles.
Claim 8
Dependent Claim
50 words
The method according to claim 1, including also partitioning said chamber into two zones including a relatively lower pressure chamber first zone which is maintained at a pressure less than 10 -4 Torr., and a relatively higher pressure chamber second zone containing said polymerizable vapor in chamber first zone-isolated relation.
Claim 9
Dependent Claim
21 words
The method according to claim 7, including also defining a wall of said chamber second zone with said substrate surface portion.
Claim 10
Dependent Claim
45 words
The method according to claim 8, including also extending an electron beam transparent, polymerizable molecular species impermeable, self-supporting membrane across the chamber parallel to said substrate surface and spaced therefrom a distance defining a second wall of said chamber second zone in chamber partitioning relation.
Claim 11
Dependent Claim
42 words
The method according to claim 7, including also generating an electron beam as the source of said high energy particles, effecting partitioning of said chamber with an electron beam transparent, polymerizable molecular species-impermeable, self-supporting membrane extended across said chamber above said substrate.
Claim 12
Dependent Claim
57 words
The method according to claim 10, wherein said polymerizable molecular species layer is at a vapor pressure between 10 -4 and 1 Torr. which at a given thickness for the polymerizable molecular species is normally disruptive of electron beam travel, and including also maintaining said polymerizable molecular species layer at a lesser thickness than said given thickness.
Claim 13
Dependent Claim
24 words
The method according to claim 11, wherein said polymerizable molecular species in an electron beam crosslinkable silicone oil, paraxylylene or imide or hydrocarbon material.
Claim 14
Dependent Claim
27 words
The method according to claim 12, including also selectively communicating said chamber second zone with a polymerizable vapor supply of said species beyond said chamber second zone.
Claim 15
Dependent Claim
21 words
The method according to claim 13, including also defining the lower wall of said chamber second zone with said substrate surface.
Claim 16
Dependent Claim
35 words
The method according to claim 14, including also extending said membrane across the chamber parallel to said substrate surface and spaced therefrom to define the upper wall of said second chamber in chamber partitioning relation.
References Cited (Backward Citations)
US3560258A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1985-11-01 | 1986-05-03 | 1986-11-02 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1989-11-01 | 1990-05-03 | 1990-11-02 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1993-11-01 | 1994-05-03 | 1994-11-02 | $7700.00 | Window Closed / Lapsed |