US4355232A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Apparatus for measuring specimen potential in electron microscope
Assignee: Hitachi Ltd
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Filing: 1980-05-23
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Granted: 1982-10-19
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Expires: 2000-05-23
Abstract
Abstract An apparatus for measuring the specimen potential in an electron microscope includes a first grid arranged to enclose a specimen which is to be irradiated with a primary charged particle beam emitted from the electron source of the electron microscope and to which is supplied a voltage sufficient to attract the secondary electrons emitted from the specimen. A second grid supplied with a voltage sufficient to analyze the energy of the secondary electrons which have passed through the first grid is disposed outside the first grid, and a secondary electron detecting arrangement for detecting the secondary electrons which have passed through the second grid is disposed adjacent the second grid. A current detecting arrangement partly for impressing the voltage upon the first grid and partly for detecting the current flowing through the first grid is provided along with a dividing and amplifying arrangement for dividing the output of the secondary electron detecting arrangement by the output of the current detecting arrangement, whereby the potential at said specimen of the electron microscope is measured with increased sensitivity.
Inventors
- 👤 Hideo Todokoro
- 👤 Satoru Fukuhara
- 👤 Yoshio Sakitani
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 19:19
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/244; G; G01; G01R; G01R31/00; G01R31/28; G01R31/302; G01R31/305; H01J2237/00; H01J2237/244; H01J2237/2443; H01J2237/2448; H01J2237/2449; H01J2237/245; H01J2237/24507
Claims Analysis
Total Claims: 15
Claim 1
Independent Claim
189 words
An apparatus for measuring specimen potential in an electron microscope, comprising: first grid means arranged to at least partially enclose a specimen which is to be irradiated with a primary charged particle beam emitted from the electron source of the electron microscope; means for applying to said first grid means a first voltage sufficient to attract the secondary electrons emitted from said specimen; second grid means disposed on the side of said first grid means opposite said specimen; means for applying to said second grid means a second voltage so as to allow only those secondary electrons that have passed through the first grid means and which have an energy level greater than a selected value to pass through said second grid means; secondary electron detecting means for detecting the secondary electrons which have passed through the second grid means; current detecting means for detecting the current flowing through the first grid means; and dividing means for dividing the output of said secondary electron detecting means by the output of said current detecting means, whereby an output representing the potential at said specimen of said electron microscope is provided.
Claim 2
Independent Claim
189 words
An apparatus for measuring specimen potential in an electron microscope, comprising: first grid means arranged to at least partially enclose a specimen which is to be irradiated with a primary charged particle beam emitted from the electron source of the electron microscope; means for applying to said first grid means a first voltage sufficient to attract the secondary electrons emitted from said specimen; second grid means disposed on the side of said first grid means opposite said specimen; means for applying to said second grid means a second voltage so as to allow only those secondary electrons that have passed through the first grid means and which have an energy level greater than a selected value to pass through said second grid means; secondary electron detecting means for detecting the secondary electrons which have passed through the second grid means; current detecting means for detecting the current flowing through the first grid means; and dividing means for dividing the output of said secondary electron detecting means by the output of said current detecting means, whereby an output representing the potential at said specimen of said electron microscope is provided.
Claim 3
Dependent Claim
36 words
A potential measuring apparatus as set forth in claim 1 wherein the first grid means includes a grid arranged to semispherically enclose said specimen in a manner to attract the secondary electrons emitted from said specimen.
Claim 4
Dependent Claim
25 words
A potential measuring apparatus as set forth in claim 2 wherein said second grid means includes a grid arranged semispherically around said first grid means.
Claim 5
Dependent Claim
31 words
A potential measuring apparatus as set forth in claim 2 or 3 wherein the first grid means is supplied with a higher voltage than that applied to the second grid means.
Claim 6
Dependent Claim
30 words
A potential measuring apparatus as set forth in claim 3 wherein said secondary electron detecting means includes a collector arranged semispherically around the semispherical grid of the second grid means.
Claim 7
Dependent Claim
37 words
A potential measuring apparatus as set forth in claim 3 wherein the second grid means and the semispherical collector acting as said secondary electron detecting means are arranged around the semispherical grid of the first grid means.
Claim 8
Dependent Claim
33 words
A potential measuring apparatus as set forth in claim 4 further comprising display means connected to the output of said dividing means for displaying the potential at said specimen of said electron microscope.
Claim 9
Dependent Claim
40 words
A potential measuring apparatus as set forth in claim 3 wherein the voltage applied to said first grid is higher than 10 volts, and the voltage applied to said second grid is in the range of -10 to 0 volts.
Claim 10
Independent Claim
104 words
An apparatus for measuring specimen potential on the basis of detection of secondary electrons emitted from the specimen as a result of irradiation thereof by a charged particle beam, comprising: first means for detecting those secondary electrons emitted from said specimen which have an energy above a predetermined value and for generating a first signal representative thereof; second means for detecting those secondary electrons emitted from said specimen which have an energy below said predetermined value and for generating a second signal representative thereof; and divider means for dividing said first signal by said second signal to produce an output indicative of specimen potential.
Claim 11
Independent Claim
104 words
An apparatus for measuring specimen potential on the basis of detection of secondary electrons emitted from the specimen as a result of irradiation thereof by a charged particle beam, comprising: first means for detecting those secondary electrons emitted from said specimen which have an energy above a predetermined value and for generating a first signal representative thereof; second means for detecting those secondary electrons emitted from said specimen which have an energy below said predetermined value and for generating a second signal representative thereof; and divider means for dividing said first signal by said second signal to produce an output indicative of specimen potential.
Claim 12
Dependent Claim
102 words
In an electron microscope in which a specimen is irradiated by a primary charged particle beam so as to emit secondary electrons of different energy levels and including an apparatus for measuring specimen potential on the basis of said secondary electrons, the improvement comprising means for detecting a shifting of the energy distribution of the emitted secondary electrons with changes in specimen potential including means for generating a signal representing the ratio of emitted secondary electrons having an energy above a predetermined level to emitted secondary electrons having an energy below said predetermined level, said generated signal being indicative of specimen potential.
Claim 13
Dependent Claim
102 words
In an electron microscope in which a specimen is irradiated by a primary charged particle beam so as to emit secondary electrons of different energy levels and including an apparatus for measuring specimen potential on the basis of said secondary electrons, the improvement comprising means for detecting a shifting of the energy distribution of the emitted secondary electrons with changes in specimen potential including means for generating a signal representing the ratio of emitted secondary electrons having an energy above a predetermined level to emitted secondary electrons having an energy below said predetermined level, said generated signal being indicative of specimen potential.
Claim 14
Dependent Claim
201 words
Apparatus for measuring specimen potential in an electron microscope, comprising: first grid means arranged to at least partially enclose a specimen which is to be irradiated with a primary charged particle beam emitted from the electron source of the electron microscope; means for applying to said first grid means a first voltage sufficient to attract the secondary electrons emitted from said specimen; second grid means disposed on the side of said first grid means opposite said specimen; means for applying a second voltage to said second grid means to allow only a higher energy portion of the secondary electrons to pass through said second grid means, the remaining secondary electrons of lower energy falling back to said first grid means; secondary electron detecting means for detecting the secondary electrons which have enough energy to pass through the second grid means; current detecting means for detecting the current which flows in the first grid means according to the energy level of the secondary electrons attracted thereto; and dividing means for dividing the output of said secondary electron detecting means by the output of said current detecting means, whereby an output representing the potential at said specimen of said electron microscope is provided.
Claim 15
Dependent Claim
201 words
Apparatus for measuring specimen potential in an electron microscope, comprising: first grid means arranged to at least partially enclose a specimen which is to be irradiated with a primary charged particle beam emitted from the electron source of the electron microscope; means for applying to said first grid means a first voltage sufficient to attract the secondary electrons emitted from said specimen; second grid means disposed on the side of said first grid means opposite said specimen; means for applying a second voltage to said second grid means to allow only a higher energy portion of the secondary electrons to pass through said second grid means, the remaining secondary electrons of lower energy falling back to said first grid means; secondary electron detecting means for detecting the secondary electrons which have enough energy to pass through the second grid means; current detecting means for detecting the current which flows in the first grid means according to the energy level of the secondary electrons attracted thereto; and dividing means for dividing the output of said secondary electron detecting means by the output of said current detecting means, whereby an output representing the potential at said specimen of said electron microscope is provided.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1985-10-18 | 1986-04-19 | 1986-10-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1989-10-18 | 1990-04-19 | 1990-10-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1993-10-18 | 1994-04-19 | 1994-10-19 | $7700.00 | Window Closed / Lapsed |