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US4354251A Expired / Lapsed US ⏱️ 0.0 years remaining

Device for testing programs for numerical control of machine tools

Assignee: Siemens AG
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Filing: 1980-03-06
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Granted: 1982-10-12
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Expires: 2000-03-06
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Abstract

Abstract In numerical controls of machine tools, the downwards (lengthwise) sum of the programmed information of each system program memory (SP1) is stored in an additional memory. For later checking of the memory contents, the downwards sums of the respective memories on the control side are formed and are compared with the stored information. If a sum deviates, a trouble signal is given out as an indication of the defective memory.

Inventors

  • 👤 Friedrich-Wilhelm Hellwig
  • 👤 Christian Seeliger

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-25 20:10
CPC Classifications
G; G06; G06F; G06F11/00; G06F11/07; G06F11/08; G06F11/10; G06F11/1008; G05; G05B; G05B19/00; G05B19/02; G05B19/18; G05B19/406; G06F11/1076

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 125 words
A device for testing the system program of a numerical control in a machine tool, said system program being for the internal control of the command cycle and being permanently stored in a plurality of system semiconductor memories, comprising: an additional semiconductor memory in which a word sum of the information permanently stored in each of said system semiconductor memories is individually stored for each system semiconductor memory; means for taking new word sums of each system semiconductor memory; means for comparing each new word sum with the corresponding sum stored in the said additional memory; and display means for indicating which memory is defective, in the event there is a difference between said new sum and the corresponding stored sum in said additional memory.
Claim 2
Independent Claim 125 words
A device for testing the system program of a numerical control in a machine tool, said system program being for the internal control of the command cycle and being permanently stored in a plurality of system semiconductor memories, comprising: an additional semiconductor memory in which a word sum of the information permanently stored in each of said system semiconductor memories is individually stored for each system semiconductor memory; means for taking new word sums of each system semiconductor memory; means for comparing each new word sum with the corresponding sum stored in the said additional memory; and display means for indicating which memory is defective, in the event there is a difference between said new sum and the corresponding stored sum in said additional memory.
Claim 3
Dependent Claim 30 words
A device in accordance with claim 1, further comprising: the semiconductor memories being connected, via a summing device, to the comparator and the additional memory being connected to the comparator.
Claim 4
Dependent Claim 16 words
A device in accordance with claim 2, further comprising a display connected to the summing device.

References Cited (Backward Citations)

US3519988A Cited
US3838264A Cited
US3831144A Cited
US4118789A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1985-10-11 1986-04-12 1986-10-12 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1989-10-11 1990-04-12 1990-10-12 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1993-10-11 1994-04-12 1994-10-12 $7700.00 Window Closed / Lapsed

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