US4332077A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of making electrically programmable control gate injected floating gate solid state memory transistor
Assignee: Intersil Corp
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Filing: 1981-07-16
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Granted: 1982-06-01
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Expires: 2001-07-16
Abstract
Abstract A non-volatile memory structure of the floating gate type is described wherein current carriers are injected onto the floating gate from the control gate as distinguished from the prior art which injects current carriers into the floating gate from the substrate. This invention teaches that by tailoring the capacitance between the control gate and the floating gate and the capacitance between the floating gate and the substrate different field intensities are created in the region between the floating gate and the control gate and in the region between the substrate and the floating gate. When the field intensity across the capacitor formed between the control gate and the floating gate is greater than the field intensity across the capacitor formed between the floating gate and the substrate, current carriers will be injected onto the floating gate from the control gate.
Inventors
- 👤 Sheng T. Hsu
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 12:36
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/60; H10D30/67; H10D30/6729; H10D30/673; H10D30/6733; G; G11; G11C; G11C16/00; G11C16/02; G11C16/04; G11C16/0408; G11C16/0425; H10D30/6758; H10D30/6759; H10D30/68; H10D30/681; H10D30/684; H10D30/686
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
179 words
A method of forming a non-volatile memory structure comprising the steps of: forming a first layer of insulating material on a surface of a body of semiconductor material of a first conductivity type; forming a polycrystalline silicon floating gate member over the layer of insulating material, the floating gate member having a leading edge and a trailing edge, the region of the body of semiconductor material underlying the floating gate member representing the channel region; forming a second layer of insulating material over the floating gate member; forming a polycrystalline silicon control gate member having a leading edge and a trailing edge over the second layer of insulating material, the trailing edge thereof overlapping a portion of the leading edge of the floating gate member; forming source and drain regions of an opposite conductivity type in the body of semiconductor material with the trailing edge of the floating gate member aligned with the junction of the source and channel regions and the leading edge of the control gate member aligned with the junction of the drain and channel regions.
Claim 2
Independent Claim
179 words
A method of forming a non-volatile memory structure comprising the steps of: forming a first layer of insulating material on a surface of a body of semiconductor material of a first conductivity type; forming a polycrystalline silicon floating gate member over the layer of insulating material, the floating gate member having a leading edge and a trailing edge, the region of the body of semiconductor material underlying the floating gate member representing the channel region; forming a second layer of insulating material over the floating gate member; forming a polycrystalline silicon control gate member having a leading edge and a trailing edge over the second layer of insulating material, the trailing edge thereof overlapping a portion of the leading edge of the floating gate member; forming source and drain regions of an opposite conductivity type in the body of semiconductor material with the trailing edge of the floating gate member aligned with the junction of the source and channel regions and the leading edge of the control gate member aligned with the junction of the drain and channel regions.
Claim 3
Dependent Claim
40 words
The method of claim 1, wherein: portions of the semiconductor body and both gate members are simultaneously doped with conductivity modifiers of the opposite type to form the source and drain regions and the floating gate and control gate members.
Claim 4
Dependent Claim
62 words
The method of claim 1 comprising the further steps of: forming the source and drain regions and the floating gate member by ion implantation; masking a portion of the floating gate member at the trailing edge thereof; removing a portion of the floating gate member at the unmasked leading edge thereof; and removing the mask prior to forming the second insulating layer.
Claim 5
Dependent Claim
63 words
The method of claim 3 comprising the further steps of: masking a portion of the second insulating layer; etching the unmasked portion of the second insulating layer to expose a portion of the floating gate member; regrowing a thin layer of insulating material on the exposed portion of the floating gate member; and removing the mask prior to forming the control gate member.
Claim 6
Dependent Claim
25 words
The method of claim 4, wherein: the unmasked portion of the second insulating layer is positioned over the central portion of the floating gate member.
Claim 7
Dependent Claim
25 words
The method of claim 4, wherein: the unmasked portion of the second insulating layer is adjacent the leading edge portion of the floating gate member.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1985-05-31 | 1985-11-30 | 1986-06-01 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1989-05-31 | 1989-11-30 | 1990-06-01 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1993-05-31 | 1993-11-30 | 1994-06-01 | $7700.00 | Window Closed / Lapsed |