US4328264A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for making apparatus for testing traces on a printed circuit board substrate
Assignee: Printed Circuits International Inc
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Filing: 1979-12-10
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Granted: 1982-05-04
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Expires: 1999-12-10
Abstract
Abstract Method and apparatus to test continuity of miniature printed circuit board traces prior to installation of components. A short circuits probe and an open circuits probe are each provided which are specific to the pattern of traces to be tested. The probes are constructed by adapting a mirror image of the traces to be tested as probe contact points and registering the adapted mirror image as plating on a second circuit board substrate. Interconnections between contact points are typically provided on the back side of the second substrate. The interconnections couple the contact points with a continuity indicator. The circuit pattern specific probes according to the invention are employed by aligning the contact points with the circuit board traces to be tested and then effecting contact therebetween. The plating forming the contact points is of sufficient uniformity and elevation to provide desired clearance between adjacent traces. Short circuits are identified by indicated continuity between a test of traces, typically adjacent traces, where no contact should exist, and open circuits are identified by lack of indicated continuity through tested traces. The probes are typically employed in "go, no-go" testing protocols of miniature circuit boards in a mass production environment. In particular, the probes are most useful in testing circuit board traces where intertrace spacing is less than about 0.5 millimeter and is typically as small as about 0.02 millimeter. The invention eliminates the need for primary visual inspection, which in the case of miniature circuit boards is tedious and unreliable.
Inventors
- 👤 William E. Johns
- 👤 David E. Locklin
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 17:31
CPC Classifications
H; H05; H05K; H05K13/00; H05K13/08; H05K13/082
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
110 words
A method for constructing a probe for a continuity test means for testing traces on a first planar printed circuit board substrate, said method comprising the steps of: providing a mirror image of a pattern of said traces to be tested to define selected regions of probe contact on a second substrate; registering said image as conductive plating on an obverse face of said second substrate; and interconnecting said conductive plating in a preselected pattern on a reverse face of said second substrate for coupling to said continuity testing means such that a continuity indication is provided upon aligned contact between said traces to be tested and said conductive plating.
Claim 2
Independent Claim
110 words
A method for constructing a probe for a continuity test means for testing traces on a first planar printed circuit board substrate, said method comprising the steps of: providing a mirror image of a pattern of said traces to be tested to define selected regions of probe contact on a second substrate; registering said image as conductive plating on an obverse face of said second substrate; and interconnecting said conductive plating in a preselected pattern on a reverse face of said second substrate for coupling to said continuity testing means such that a continuity indication is provided upon aligned contact between said traces to be tested and said conductive plating.
Claim 3
Dependent Claim
31 words
The method as defined in claim 1 wherein said image providing step comprises generating a spatially undistorted mirror image copy of art work employed to register said traces to be tested.
Claim 4
Dependent Claim
35 words
The method as defined in claim 2 wherein said image providing step further comprises eliminating regions of indicated plating on said copy except in areas corresponding to selected positions along said traces to be tested.
Claim 5
Dependent Claim
21 words
The method as defined in claim 3 wherein said regions indicated plating correspond to ends of said traces to be tested.
Claim 6
Dependent Claim
36 words
The method as defined in claim 1 wherein said interconnecting step comprises registering conductive traces on the side of said second substrate opposing said conductive plating and providing connections between said traces and said conductive plating.
Claim 7
Independent Claim
168 words
A method for constructing a probe of a continuity tester for a pattern of traces to be tested on a first planar printed circuit board substrate, said method comprising the steps of: providing a mirror image of said traces to be tested as a first trace pattern; eliminating selected regions of said first trace pattern to define electrically conductive probe locations to abut to selected electrically conductive locations of said traces to be tested; providing a second trace pattern for defining a pattern of traces for interconnecting said conductive probe locations; registering said first trace pattern as a first plating of conductive material on a first side of a second planar printed circuit board substrate; registering said second trace pattern as a second plating of conductive material on a second side of said second planar printed circuit board substrate, said second side opposing said first side; electrically coupling said first plating to said second plating at selected locations; and providing externally accessible electrical terminals to said second plating.
Claim 8
Independent Claim
168 words
A method for constructing a probe of a continuity tester for a pattern of traces to be tested on a first planar printed circuit board substrate, said method comprising the steps of: providing a mirror image of said traces to be tested as a first trace pattern; eliminating selected regions of said first trace pattern to define electrically conductive probe locations to abut to selected electrically conductive locations of said traces to be tested; providing a second trace pattern for defining a pattern of traces for interconnecting said conductive probe locations; registering said first trace pattern as a first plating of conductive material on a first side of a second planar printed circuit board substrate; registering said second trace pattern as a second plating of conductive material on a second side of said second planar printed circuit board substrate, said second side opposing said first side; electrically coupling said first plating to said second plating at selected locations; and providing externally accessible electrical terminals to said second plating.
Claim 9
Dependent Claim
106 words
The method as defined in claim 6 wherein said coupling step comprises connecting a first electrical probe location corresponding to a first trace to be tested through said second plating to a first one of said external terminals and connecting a second probe location corresponding to a second trace to be tested adjacent to said first trace to be tested through said second plating to a second one of said external terminals such that a positive continuity indication is provided upon aligned contact between such traces to be tested and said probe locations in the event of a short circuit between said traces to be tested.
Claim 10
Dependent Claim
95 words
The method as defined in claim 7 wherein said coupling step comprises connecting a first probe location corresponding to a first end of a trace to be tested through said second plating to a first of said external terminals; coupling a second probe location corresponding to a second end of said trace to be tested through said second plating to a second one of said external terminals such that a negative continuity indication is provided upon aligned contact between said probe locations and said trace to be tested in the event of an open circuit.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1985-05-03 | 1985-11-02 | 1986-05-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1989-05-03 | 1989-11-02 | 1990-05-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1993-05-03 | 1993-11-02 | 1994-05-04 | $7700.00 | Window Closed / Lapsed |