Mass spectrometer

Claim 3

The method of claim 1 in which the step of controlling the loss of sample includes the step of controlling the loss of sample by controlling the rate at which the increased pressure caused by the sample within the enclosure is reduced by loss of the sample within the region of detection of the analyzer cell from passing outside the disclosure into the main vacuum housing.

Claim 4

The method of claim 2 in which the step of controlling the loss of sample includes the step of permitting escape of sufficient sample through at least one opening in the enclosure to balance the loss of sample against the accumulation of unwanted particles created during analysis.

Claim 5

A method according to claim 3 in which the step of controlling the loss of sample includes the step of adjusting the size of the opening, whereby the rate at which sample and unwanted particles are lost may be adjusted to maximize sample-size sensitivity and reduce spurious peaks arising from the accumulation of unwanted particles.

Claim 6

A method according to claim 4 in which the step of adjusting the size of the opening includes the step of changing the size of the opening after the process of forming ions has begun.

Claim 7

A method according to claim 5 in which the step of adjusting the size of the opening includes the step of adjusting the size of the opening between cycles consisting of injecting sample, forming ionization and detecting at different frequencies.

Claim 8

A method according to claim 6 in which the cycles of injecting, ionizing and detecting and adjusting are performed repetitively, with adjustments between each cycle being performed to minimize spurious peaks from the accumulation of unwanted particles.

Claim 9

A mass spectrometer comprising: a main vacuum housing; means for maintaining a vacuum in the main vacuum housing; a one-region analyzer cell within the main vacuum housing having an enclosure, a source, an analyzer and a detection region; said source, analyzer and detection region being within said enclosure; means for injecting samples into the analyzer cell enclosure; means for forming ions of at least a portion of samples within the analyzer cell; means for orbiting the ions within the analyzer cell in a region in which certain of said ions may be detected in accordance with their charge-mass ratio; means for detecting ions having a certain chargemass ratio during ionization; and means for controlling the rate at which sample leaves the analyzer cell enclosure, whereas the time span of analysis may be increased.

Claim 10

A mass spectrometer comprising: a main vacuum housing; means for maintaining a vacuum in the main vacuum housing; a one-region analyzer cell within the main vacuum housing having an enclosure, a source, an analyzer and a detection region; said source, analyzer and detection region being within said enclosure; means for injecting samples into the analyzer cell enclosure; means for forming ions of at least a portion of samples within the analyzer cell; means for orbiting the ions within the analyzer cell in a region in which certain of said ions may be detected in accordance with their charge-mass ratio; means for detecting ions having a certain chargemass ratio during ionization; and means for controlling the rate at which sample leaves the analyzer cell enclosure, whereas the time span of analysis may be increased.

Claim 11

A mass spectrometer according to claim 8 in which the means for controlling the rate at which sample leaves the enclosure includes a means for controlling the decrease in pressure within the analyzer cell enclosure.

Claim 12

A mass spectrometer according to claim 9 in which: said enclosure at least partially surrounds the analyzer cell; and said means for controlling the rate at which sample leaves includes means for controlling the passage of sample from said enclosure to said main vacuum housing.

Claim 13

A mass spectrometer according to claim 10 in which said means for controlling the rate includes means for adjusting the size of an opening between said enclosure and said vacuum housing.

Claim 14

A mass spectrometer according to claim 11 in which said means for controlling the rate includes means for changing the size of said opening between the time said sample is injected and the termination of detection of ions, whereby unwanted particles are reduced after analysis starts.

Claim 15

A mass spectrometer according to claim 12 in which said means for controlling the rate includes means for adjusting the size of an opening after analysis.

Claim 16

A mass spectrometer according to claim 13 in which aid means for adjusting the size of an opening includes means for automatically adjusting the size of an opening between cycles of injecting a sample, ionizing the sample and analyzing the ions of the sample.

Claim 17

A method of mass spectrometry according to claim 14 in which the method of controlling the rate includes means for repetitively controlling the size of opening within a plurality of repetitive cycles of sample injection.

Claim 18

The method of claim 1 in which the step of controlling the loss of sample includes the step of permitting escape of sufficient sample through at least one opening in the enclosure to balance the loss of sample against the accumulation of unwanted particles created during analysis.

Claim 19

A method according to claim 16 in which the step of controlling the loss of sample includes the step of adjusting the size of the opening, whereby the rate at which sample and unwanted particles are lost may be adjusted to maximize sample-size sensitivity and reduce spurious peaks arising from the accumulation of unwanted particles.

Claim 20

A method according to claim 17 in which the step of adjusting the size of the opening includes the step of changing the size of the opening after the process of forming ions has begun.

Claim 21

A method according to claim 18 in which the step of adjusting the size of the opening includes the step of adjusting the size of the opening between cycles consisting of injecting sample, forming ionization and detecting at different frequencies.

Claim 22

A method according to claim 19 in which the cycles of injecting, ionizing and detecting and adjusting are performed repetitively, with adjustments between each cycle being performed to minimize spurious peaks from the accumulation of unwanted particles.

Claim 23

A method according to claim 16 in which the step of controlling the loss of sample includes the step of adjusting the size of the opening, whereby the rate at which sample and unwanted particles are lost may be adjusted to maximize sample-size sensitivity and reduce spurious peaks arising from the accumulation of unwanted particles.

Claim 24

A method according to claim 21 in which the step of adjusting the size of the opening includes the step of changing the size of the opening after the process of forming ions has begun.

Claim 25

A method according to claim 22 in which the step of adjusting the size of the opening includes the step of adjusting the size of the opening between cycles consisting of injecting sample, forming ionization and detecting at different frequencies.

Claim 26

A method according to claim 23 in which the cycles of injecting, ionizing and detecting and adjusting are performed repetitively, with adjustments between each cycle being performed to minimize spurious peaks from the accumulation of unwanted particles.

Claim 27

A mass spectrometer according to claim 8 in which: said enclosure at least partially surrounds analyzer cell; and said means for controlling the rate at which sample leaves includes means for controlling the passage of sample from said enclosure to said main vacuum housing.

Claim 28

A mass spectrometer according to claim 25 in which said means for controlling the rate includes means for adjusting the size of an opening between said enclosure and said vacuum housing.

Claim 29

A mass spectrometer according to claim 26 in which said means for controlling the rate includes means for changing the size of said opening between the time said sample is injected and the termination of detection of ions, whereby unwanted particles are reduced after analysis starts.

Claim 30

A mass spectrometer according to claim 27 in which said means for controlling the rate includes means for adjusting the size of an opening after analysis.

Claim 31

A mass spectrometer according to claim 28 in which said means for adjusting the size of an opening includes means for automatically adjusting the size of an opening between cycles of injecting a sample, ionizing the sample and analyzing the ions of the sample.

Claim 32

A method of mass spectrometry according to claim 29 in which the method of controlling the rate includes means for repetitively controlling the size of opening within a plurality of repetitive cycles of sample injection.

Claim 33

A mass spectrometer according to claim 8 in which said means for controlling the rate includes means for adjusting the size of an opening between said enclosure and said vacuum housing.

Claim 34

A mass spectrometer according to claim 31 in which said means for controlling includes means for changing the size of said opening between the time said sample is injected and the termination of detection of ions, whereby unwanted particles are reduced after analysis starts.

Claim 35

A mass spectrometer according to claim 32 in which said means for adjusting the size of an opening includes means for automatically adjusting the size of an opening between cycles of injecting a sample, ionizing the sample and analyzing the ions of the sample.