Light activated solid state switch

Claim 2

A light activated solid device for switching high voltages, including multi kilovolt level voltages, which comprises a body of semiconductor material having a pair of electrodes separated by a gap upon which light is incident when said device is activated, cryogenic means for cooling said body, and said body having a certain concentration of deep-lying charge carrier having centers therein sufficient to maintain the resistivity of said body in the presence of said high voltages and absence of said light.

Claim 3

The invention as set forth in claim 1 wherein said concentration, N, is in a range from a lower concentration of about 10 15 cm -3 to a higher concentration such that the charge carrier recovery time period of semiconductor material of said body, τ, is at least as long as a predetermined time period when said device is in closed switching condition, where τ=(1/ΣνN) Σ and ν are the capture cross-section for, and thermal velocity of, the charge carriers in said semiconductor material at the temperature to which said body is cooled.

Claim 4

The invention as set forth in claim 2 wherein τ is in the range from about 30 picoseconds to 100 nanoseconds.

Claim 5

The invention as set forth in claim 3 wherein said cryogenic means provides for cooling said body to about the temperature of liquid nitrogen.

Claim 6

The invention as set forth in claim 4 wherein said body has a certain concentration of a deep lying impurity to provide said trapping centers.

Claim 7

The invention as set forth in claim 5 wherein semiconductor material is silicon, said impurity is gold, and said concentration N is approximately 10 15 cm -3 .

Claim 8

The invention as set forth in claim 4 wherein semiconductor material is selected from the group consisting of Ge, Si, GaAs, CDS and InP.

Claim 9

The invention as set forth in claim 6 wherein said semiconductor material is selected from the group consisting of Ge, Si, GaAs, and InP and said impurity is selected from (a) the group consisting of Ag, Mn, Co when said material is Ge, (b) Au, Fe, Zn when said material is Si, (c) Cr, O when said material is GaAs and (d) Cr, O when said material is InP.

Claim 10

A high voltage pulse generator which comprises a body of semiconductor material having a pair of electrodes separated by a gap, said material having a predetermined concentration of deep-lying charge carrier trapping centers, means for applying a DC voltage to one of said electrodes, means for connecting the other set of electrodes to a load, means for cooling said body to a cryogenic temperature, and means for directing a pulse of light at said gap to reduce the resistivity of said body between said electrodes and to switch said high voltage to said load to generate a high voltage pulse at said load, said concentration being sufficient to maintain the resistivity of said body in the presence of said voltage and absence of said light pulse.

Claim 11

A high voltage pulse generator which comprises a body of semiconductor material having a pair of electrodes separated by a gap, said material having a predetermined concentration of deep-lying charge carrier trapping centers, means for applying a DC voltage to one of said electrodes, means for connecting the other set of electrodes to a load, means for cooling said body to a cryogenic temperature, and means for directing a pulse of light at said gap to reduce the resistivity of said body between said electrodes and to switch said high voltage to said load to generate a high voltage pulse at said load, said concentration being sufficient to maintain the resistivity of said body in the presence of said voltage and absence of said light pulse.

Claim 12

The invention as set forth in claim 9 wherein said trapping centers are provided by a deep-lying impurity.

Claim 13

The invention as set forth in claim 10 wherein semiconductor material is Si, said impurity is Au, and said cryogenic temperature is liquid nitrogen temperature.

Claim 14

The invention as set forth in claim 9 wherein said material is selected from the group consisting of Ge, Si, GaAs, CdS and InP and said temperature is liquid nitrogen temperature.

Claim 15

The invention as set forth in claim 10 wherein said material is selected from the group consisting of Ge, Si, GaAs and InP and said impurity has a concentration of at least 10 15 atoms of said impurity per cubic centimeter of said semiconductor material.

Claim 16

The invention as set forth in claim 9 wherein said concentration is, N, and is such that the recovery time, τ, of charge carriers and said semiconductor material does not exceed the duration of said pulse where τ=(1/ΣνN) wherein Σ is the capture cross-section and ν is the thermal velocity of said charge carriers at the liquid nitrogen temperature.

Claim 17

The invention as set forth in claim 9 wherein said means for applying said light pulse is a laser.

Claim 18

The invention as set forth in claim 9 wherein said body is a length of semiconductor material having a cross-section of about 0.5 mm 2 , and said gap is about 2 mm long between said electrodes.

Claim 19

The invention as set forth in claim 9 wherein said cryogenic means includes a metal member, an insulating member, said body being disposed on said metal member with said insulating member therebetween.

Claim 20

The invention as set forth in claim 17 wherein said insulating member is a plate.

Claim 21

The invention as set forth in claim 18 wherein said plate is about 1 mm in thickness between said body and said metal member.

Claim 22

The invention as set forth in claim 9 wherein said means for applying said bias voltage includes a series resistor having a value of resistance lower than the resistance of said body between said electrodes in the absence of said light pulse.

Claim 23

The invention as set forth in claim 9 wherein said means for applying said DC voltage includes transmission means for controlling the duration of the pulse which is generated upon occurrence of said light pulse.