← Back to Patent Explorer
US4293373A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of making transducer

Assignee: International Standard Electric Corp
•
Filing: 1980-02-26
•
Granted: 1981-10-06
•
Expires: 2000-02-26
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A silicon transducer including a silicon frame with one or more lands extending from a diaphragm or the like. The lands are interconnected by two thin strips formed integrally with the lands. The strips are essentially the transducer. The transducer is constructed by etching a boron doped wafer with a mixture of catechol, ethylene diamine and water.

Inventors

  • 👤 John C. Greenwood

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 13:04
CPC Classifications
H; H10; H10D; H10D48/00; H10D48/50; G; G01; G01L; G01L9/00; G01L9/0001; G01L9/0008; G01L9/0019; G01L9/0041; G01L9/0042; Y; Y10; Y10S; Y10S438/00; Y10S438/928

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 121 words
The method of making a silicon pressure transducer, said method comprising the steps of: selectively boron doping both faces of a silicon wafer; etching one face of said wafer to define a cavity within a frame forming a closed loop and two lands spaced from each other and from said frame, said diaphragm connecting said lands; and selectively etching the other face of said wafer opposite said groove so as to define a silicon diaphragm to which both of said lands are fixed, said etching steps leaving at least two filaments having a first pair of adjacent ends fixed to one land and a second pair of adjacent ends fixed to the other land in a plane spaced from said diaphragm.
Claim 2
Independent Claim 121 words
The method of making a silicon pressure transducer, said method comprising the steps of: selectively boron doping both faces of a silicon wafer; etching one face of said wafer to define a cavity within a frame forming a closed loop and two lands spaced from each other and from said frame, said diaphragm connecting said lands; and selectively etching the other face of said wafer opposite said groove so as to define a silicon diaphragm to which both of said lands are fixed, said etching steps leaving at least two filaments having a first pair of adjacent ends fixed to one land and a second pair of adjacent ends fixed to the other land in a plane spaced from said diaphragm.
Claim 3
Dependent Claim 23 words
A process as claimed in claim 1, in which said selective etching is effected with a mixture of catechol, ethylene diamine and water.

References Cited (Backward Citations)

US3888708A Cited
US3912563A Cited
US4108715A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1984-10-05 1985-04-06 1985-10-06 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1988-10-05 1989-04-06 1989-10-06 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1992-10-05 1993-04-06 1993-10-06 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag