Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
193 words
An ion beam buncher--debuncher of the type having a resonant structure supplied by a high frequency or hyperfrequency generator, said structure comprising a cylindrical wall closed by two lateral faces respectively traversed by a supply pipe and a discharge pipe for the beam, together with a sliding tube arranged between the said pipes and defining with the supply pipe a first gap and with the discharge pipe a second gap, the ion beam being introduced into the said structure by the supply pipe firstly undergoing in the first gap a first action on the part of the electrical field therein, then traversing the sliding tube and finally undergoing in the second gap a second action on the part of the electrical field therein and leaving the structure by the discharge pipe, wherein the supply and discharge pipes have different cross-sections, the sliding tube having a flared shape passing from a small cross-section equal to that of one of the pipes to a large cross-section equal to that of the other pipe. one of the two gaps affecting the ion beam with a substantial weaker electric field than that affected by the other gap.
Claim 2
Dependent Claim
193 words
An ion beam buncher--debuncher of the type having a resonant structure supplied by a high frequency or hyperfrequency generator, said structure comprising a cylindrical wall closed by two lateral faces respectively traversed by a supply pipe and a discharge pipe for the beam, together with a sliding tube arranged between the said pipes and defining with the supply pipe a first gap and with the discharge pipe a second gap, the ion beam being introduced into the said structure by the supply pipe firstly undergoing in the first gap a first action on the part of the electrical field therein, then traversing the sliding tube and finally undergoing in the second gap a second action on the part of the electrical field therein and leaving the structure by the discharge pipe, wherein the supply and discharge pipes have different cross-sections, the sliding tube having a flared shape passing from a small cross-section equal to that of one of the pipes to a large cross-section equal to that of the other pipe. one of the two gaps affecting the ion beam with a substantial weaker electric field than that affected by the other gap.
Claim 3
Dependent Claim
185 words
An ion beam buncher--debuncher of the type having a resonant structure supplied by a high frequency or hyperfrequency generator, said structure comprising a cylindrical wall closed by two lateral faces respectively traversed by a supply pipe and a discharge pipe for the beam, together with a sliding tube arranged between the said pipes and defining with the supply pipe a first gap and with the discharge pipe a second gap, the ion beam being introduced into the said structure by the supply pipe firstly undergoing in the first gap a first action on the part of the electrical field therein, then traversing the sliding tube and finally undergoing in the second gap a second action on the part of the electrical field therein and leaving the structure by the discharge pipe, wherein one of said first and second gaps has a length such that it is traversed by the ion beam in a long time compared with the resonant half-cycle of the structure one of the two gaps affecting the ion beam with a substantial weaker electric field than that affected by the other gap.
Claim 4
Dependent Claim
185 words
An ion beam buncher--debuncher of the type having a resonant structure supplied by a high frequency or hyperfrequency generator, said structure comprising a cylindrical wall closed by two lateral faces respectively traversed by a supply pipe and a discharge pipe for the beam, together with a sliding tube arranged between the said pipes and defining with the supply pipe a first gap and with the discharge pipe a second gap, the ion beam being introduced into the said structure by the supply pipe firstly undergoing in the first gap a first action on the part of the electrical field therein, then traversing the sliding tube and finally undergoing in the second gap a second action on the part of the electrical field therein and leaving the structure by the discharge pipe, wherein one of said first and second gaps has a length such that it is traversed by the ion beam in a long time compared with the resonant half-cycle of the structure one of the two gaps affecting the ion beam with a substantial weaker electric field than that affected by the other gap.