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US4282266A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for determining silicon content in layers of aluminum and silicon

Assignee: Intersil Corp
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Filing: 1980-05-29
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Granted: 1981-08-04
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Expires: 2000-05-29
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Abstract

Abstract The method provides an extremely fast and non-destructive method for determining whether an integrated circuit will have good bonding characteristics. The method entails immersion plating of copper onto aluminum areas. Then, the aluminum areas are observed visually to see if the copper plated thereon is continuous or discontinuous. If the copper is discontinuous, the aluminum film will have good bonding characteristics.

Inventors

  • 👤 Albert W. Fisher

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-25 03:59
CPC Classifications
H; H10; H10P; H10P74/00; H10P74/23; H10P74/235; H10P74/20; H10P74/203

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 73 words
A method for determining the silicon content in an aluminum film on a substrate comprising the steps of: (a) immersion plating said substrate in a solution comprising de-ionized water, hydrofluoric acid, and copper sulfate which will plate onto the silicon in the film while etching the aluminum film; then (b) removing said substrate from said solution and visually examining the aluminum film to determine whether the areas plated thereon are continuous or discontinuous.
Claim 2
Independent Claim 73 words
A method for determining the silicon content in an aluminum film on a substrate comprising the steps of: (a) immersion plating said substrate in a solution comprising de-ionized water, hydrofluoric acid, and copper sulfate which will plate onto the silicon in the film while etching the aluminum film; then (b) removing said substrate from said solution and visually examining the aluminum film to determine whether the areas plated thereon are continuous or discontinuous.
Claim 3
Dependent Claim 32 words
The method of claim 1 wherein said solution consists of 320 cc of de-ionized water, 8 cc of 49% hydroflouric acid, 8 cc of sulfuric acid and 8 g of copper sulfate.
Claim 4
Dependent Claim 26 words
The method of claim 1 wherein said solution consists of 320 cc of de-ionized water, 8 cc of hydroflouric acid and 8 g of copper sulfate.
Claim 5
Dependent Claim 26 words
The method of claim 1 wherein said solution consists of 320 cc of de-ionized water, 4 cc of hydroflouric acid and 4 g of copper sulfate.

References Cited (Backward Citations)

US3669734A Cited
US3672964A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1984-08-03 1985-02-02 1985-08-04 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1988-08-03 1989-02-02 1989-08-04 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1992-08-03 1993-02-02 1993-08-04 $7700.00 Window Closed / Lapsed

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