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US4273594A Expired / Lapsed US ⏱️ 0.0 years remaining

Gallium arsenide devices having reduced surface recombination velocity

Assignee: AT&T Inc
•
Filing: 1979-10-05
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Granted: 1981-06-16
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Expires: 1999-10-05
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Abstract

Abstract Semiconductor devices using chemically treated n-type GaAs have greatly reduced surface recombination velocities. A preferred embodiment uses fractional monolayers of ruthenium on the GaAs surface.

Inventors

  • 👤 Adam Heller
  • 👤 Harry J. Leamy
  • 👤 Barry Miller
  • 👤 Ronald J. Nelson
  • 👤 Bruce A. Parkinson

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 08:33
CPC Classifications
H; H10; H10F; H10F10/00; H10F10/10; H10F10/18; H10D; H10D62/00; H10D62/80; H10D62/85; H10D62/854; H10F71/00; H10F71/127; Y; Y02; Y02E; Y02E10/00; Y02E10/50; Y02E10/544; Y10; Y10S; Y10S438/00; Y10S438/904; Y10T; Y10T428/00; Y10T428/12; Y10T428/12493; Y10T428/12528

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 60 words
A semiconductor device containing n-type GaAs, said n-type GaAs having a surface, a layer of material disposed on said surface, characterized in that said surface further contains material selected from the group consisting of ruthenium, rhodium, nickel, iridium and lead, said material being present in an amount equivalent to greater than one-hundredth of a monolayer and less than one monolayer.
Claim 2
Dependent Claim 60 words
A semiconductor device containing n-type GaAs, said n-type GaAs having a surface, a layer of material disposed on said surface, characterized in that said surface further contains material selected from the group consisting of ruthenium, rhodium, nickel, iridium and lead, said material being present in an amount equivalent to greater than one-hundredth of a monolayer and less than one monolayer.
Claim 3
Dependent Claim 20 words
A device as recited in claim 1 in which said material is present in an amount less than one monolayer.
Claim 4
Dependent Claim 29 words
A device as recited in claim 2 in which said material is ruthenium and said amount is greater than 0.001 μgm/cm 2 and less than 0.1 μgm/cm 2 .
Claim 5
Dependent Claim 19 words
A device as recited in claim 1 or 3 further characterized in that said layer comprises a noble metal.
Claim 6
Dependent Claim 23 words
A device as recited in claim 4 in which said noble metal is selected from the group consisting of gold, silver and platinum.
Claim 7
Dependent Claim 29 words
A device as recited in claim 4 in which said layer comprises an oxide layer, said oxide layer being disposed between said GaAs surface and said noble metal layer.

References Cited (Backward Citations)

US3340599A Cited
US4182796A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1984-06-15 1984-12-15 1985-06-16 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1988-06-15 1988-12-15 1989-06-16 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1992-06-15 1992-12-15 1993-06-16 $7700.00 Window Closed / Lapsed

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