US4271353A
Expired / Lapsed
US
⏱️ 0.0 years remaining
X-ray spectroscope
Assignee: Rigaku Corp
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Filing: 1979-06-27
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Granted: 1981-06-02
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Expires: 1999-06-27
Abstract
Abstract An X-ray Spectroscope comprising a pair of soller slits disposed such that one end of each faces an X-ray emitting portion of a sample, a pair of total reflection mirrors disposed such that one end of each face the other end of the respective soller slits and that the reflecting surfaces thereof face each other and make a predetermined angle with respect to X-rays passed through the respective soller slits and an X-ray detector disposed at a position, at which X-rays reflected by the total reflection mirrors intersect each other. If necessary, it further provides a pair of auxiliary soller slits between the X-ray detector and the total reflection mirrors and a filter capable of absorbing only characteristic X-rays from a particular substance. Such an X-ray spectroscope has an extremely improved efficiency of detection compared to the conventional spectroscope of this kind and can also permit size reduction of the entire device.
Inventors
- 👤 Nobuo Ohtsuki
- 👤 Eiji Yamada
- 👤 Tadashi Utaka
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 06:42
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/22; G01N23/223
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
103 words
An X-ray spectroscope comprising a means for causing emission of characteristic X-rays from a sample to be analyzed, a pair of soller slits disposed such that one end of each faces said sample, a pair of total reflection mirrors disposed such that one end of each faces the other end of said respective soller slits and that the reflecting surfaces thereof face each other and an X-ray detector disposed at a position at which X-rays reflected by said total reflection mirrors intersect each other, with said total reflection mirrors making a predetermined angle with respect to X-rays passed through said respective soller slits.
Claim 2
Dependent Claim
103 words
An X-ray spectroscope comprising a means for causing emission of characteristic X-rays from a sample to be analyzed, a pair of soller slits disposed such that one end of each faces said sample, a pair of total reflection mirrors disposed such that one end of each faces the other end of said respective soller slits and that the reflecting surfaces thereof face each other and an X-ray detector disposed at a position at which X-rays reflected by said total reflection mirrors intersect each other, with said total reflection mirrors making a predetermined angle with respect to X-rays passed through said respective soller slits.
Claim 3
Dependent Claim
29 words
The X-ray spectroscope according to claim 1, which further provides a pair of sub-soller slits between the other end of each of said total reflection mirrors and said detector.
Claim 4
Dependent Claim
20 words
The X-ray spectroscope according to claim 1, wherein said total reflection mirrors are made of silicon oxide (SiO 2 ).
Claim 5
Dependent Claim
18 words
The X-ray spectroscope according to claim 1, wherein said pair of soller slits are integral with each other.
Claim 6
Dependent Claim
18 words
The X-ray spectroscope according to claim 2, wherein said pair of sub-soller slits are integral with each other.
Claim 7
Dependent Claim
41 words
The X-ray spectroscope according to claim 1, wherein said pair of soller slits are constituted by single crystal, mirror surface finished silicon oxide (SiO 2 ) blocks and thin metal foils arranged parallel at a small interval in their X-ray paths.
Claim 8
Dependent Claim
88 words
The X-ray spectroscope according to claim 1, wherein the critical angle θ c of said total reflection mirrors is given as following formula: ##EQU2## (wherein e is the electric charge of electron, m is the mass of electron, c is the velocity of light, N is the Avogadro's number of the material constituting said mirrors, Z is the number of electrons per molecule, M is the molecular weight in grams, ρ is the density in g/cm 3 and λ is the wavelength of the incident X-rays in nm.)
Claim 9
Dependent Claim
29 words
The X-ray spectroscope according to claim 1, which further provides a filter capable of absorbing characteristic X-rays of a particular substance between said detector and said total reflection mirrors.
Claim 10
Dependent Claim
19 words
The X-ray spectroscope according to claim 1, which further provides a scatter stop means in the total reflection mirrors.
References Cited (Backward Citations)
US3160747A
Cited
US3160749A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1984-06-01 | 1984-12-01 | 1985-06-02 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1988-06-01 | 1988-12-01 | 1989-06-02 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1992-06-01 | 1992-12-01 | 1993-06-02 | $7700.00 | Window Closed / Lapsed |