US4268750A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Realtime radiation exposure monitor and control apparatus
Assignee: The University of Texas System
•
Filing: 1979-05-14
•
Granted: 1981-05-19
•
Expires: 1999-05-14
Abstract
Abstract An apparatus for measuring radiation exposure in realtime by measuring the charge flowing in an external circuit when radiation creates electron hole pairs, and thus allows discharge, of a duo-dielectric detector.
Inventors
- 👤 Ronald W. Cowart
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 15:09
CPC Classifications
G; G03; G03G; G03G15/00; G03G15/22; G03G15/221; G03G15/222; G01; G01T; G01T1/00; G01T1/16; G01T1/26; G21; G21K; G21K4/00; H; H05; H05G; H05G1/00; H05G1/08; H05G1/26; H05G1/30; H05G1/38; H05G1/42; H10; H10F; H10F99/00
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
100 words
An exposure measuring apparatus comprising: a multilayered detector structure, in an electric potential field, said detector comprising a duo-dielectric sandwich including, a transparent conducting layer overlying a transparent insulating layer which overlays a high resistance photoconductor layer which overlays a conductive layer; an external circuit connecting said transparent conducting layer and said conducting layer; measuring means responsive to the flow of current in said external circuit for measuring the flow of current in said external circuit when said duo-dielectric detector structure is irradiated by radiation capable of forming electron hole pairs in the photoconductive layer of said multilayered detector structure.
Claim 2
Dependent Claim
100 words
An exposure measuring apparatus comprising: a multilayered detector structure, in an electric potential field, said detector comprising a duo-dielectric sandwich including, a transparent conducting layer overlying a transparent insulating layer which overlays a high resistance photoconductor layer which overlays a conductive layer; an external circuit connecting said transparent conducting layer and said conducting layer; measuring means responsive to the flow of current in said external circuit for measuring the flow of current in said external circuit when said duo-dielectric detector structure is irradiated by radiation capable of forming electron hole pairs in the photoconductive layer of said multilayered detector structure.
Claim 3
Dependent Claim
34 words
An apparatus as in claim 1 wherein the flow of current is measured from only a part of said detector structure, said small part being electrically segmented from the greater portion of the detector.
Claim 4
Dependent Claim
19 words
An apparatus as in claim 2 wherein current flow is measured from several small segmented portions of the detector.
Claim 5
Dependent Claim
29 words
An apparatus as in claim 1, 2 or 3 including control means responsive to said measuring means for stopping said irradiation when the total charge reaches a preselected limit.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1984-05-18 | 1984-11-17 | 1985-05-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1988-05-18 | 1988-11-17 | 1989-05-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1992-05-18 | 1992-11-17 | 1993-05-19 | $7700.00 | Window Closed / Lapsed |