US4263518A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Arrangement for correcting the voltage coefficient of resistance of resistors integral with a semiconductor body
Assignee: International Business Machines Corp
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Filing: 1979-06-07
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Granted: 1981-04-21
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Expires: 1999-06-07
Abstract
Abstract Arrangements are described for correcting the voltage coefficient of resistance (VCR) of resistors integral with a semiconductor body and, more particularly, for correcting the VCR of resistors implanted in a semi-conductor body. Resistors typically comprising a resistive region of a first conductivity type formed in an isolated layer of opposite conductivity type which isolated layer, in general, includes an epitaxial layer passivated by a dielectric layer. A metal layer is formed on the dielectric layer and covers, at least partially, the resistive layer. The metal layer is brought to a suitable potential to produce opposite variations in the resistance with respect to variations created by the epitaxial layer.
Inventors
- 👤 Daniel Ballatore
- 👤 Francois Delaporte
- 👤 Gerard Lebesnerais
- 👤 Jean-Paul Nuez
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 21:25
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/40; H10D1/43; H10D84/00; H10D84/201; H10D84/204; H10D84/209
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
170 words
A method of correcting the voltage coefficient of resistance of a resistor arrangement integral with a semiconductor body and arranged to include at least a resistive region of first conductivity type formed in an isolated portion of an epitaxial layer of opposite conductivity type with said resistive region passivated by a dielectric layer, the improvement comprising: a resistive region including N discrete resistive segments formed in isolated portions of said epitaxial layer and electrically coupled to one another; N discrete segments of conductive material formed on said dielectric layer over at least a portion of respective ones of said discrete resistive segments; and means to couple all said discrete segments of conductive material to a voltage point on said N discrete resistive segments to provide voltage potential to said discrete segments of conductive material to vary the resistance value of said N discrete resistive segments an amount equal to and opposite the amount of variation in resistance value caused by potential applied to said epitaxial layer of opposite conductivity type.
Claim 2
Independent Claim
170 words
A method of correcting the voltage coefficient of resistance of a resistor arrangement integral with a semiconductor body and arranged to include at least a resistive region of first conductivity type formed in an isolated portion of an epitaxial layer of opposite conductivity type with said resistive region passivated by a dielectric layer, the improvement comprising: a resistive region including N discrete resistive segments formed in isolated portions of said epitaxial layer and electrically coupled to one another; N discrete segments of conductive material formed on said dielectric layer over at least a portion of respective ones of said discrete resistive segments; and means to couple all said discrete segments of conductive material to a voltage point on said N discrete resistive segments to provide voltage potential to said discrete segments of conductive material to vary the resistance value of said N discrete resistive segments an amount equal to and opposite the amount of variation in resistance value caused by potential applied to said epitaxial layer of opposite conductivity type.
Claim 3
Dependent Claim
47 words
The method as set forth in claim 1 wherein said isolated portions of said epitaxial layer are electrically connected to respective ones of said discrete resistive segments at a point thereon which is of a potential opposite in polarity to the potential applied to said discrete segments.
Claim 4
Dependent Claim
17 words
The method according to claim 2 characterized in that said resistive region is formed by ion implantation.
Claim 5
Dependent Claim
204 words
In a resistance arrangement integral with a semiconductor body including resistor means of first conductivity type semiconductor formed in a layer of opposite conductivity type semiconductor with said resistor means passivated by a dielectric layer and having terminal means to apply a potential thereacross, the improvement residing in said resistor means including N discrete resistive regions formed in isolated portions of said layer of opposite conductivity type semiconductor and electrically coupled to one another with each of said N discrete resistive regions having a respective one of N discrete segments of conductive material formed on said dielectric layer over at least a portion thereof, and first means to couple each of said N discrete segments of conductive material to the said terminal means at the one end of said resistor means which provides a potential to said N discrete segments of conductive material to vary the resistance value of said resistive regions an amount equal to and opposite the amount of variation in resistance value caused by potential applied to said layer of opposite conductivity type semiconductor and second means to couple said layer of opposite conductivity type semiconductor to the end of said N discrete resistive regions opposite to the said one end.
Claim 6
Dependent Claim
204 words
In a resistance arrangement integral with a semiconductor body including resistor means of first conductivity type semiconductor formed in a layer of opposite conductivity type semiconductor with said resistor means passivated by a dielectric layer and having terminal means to apply a potential thereacross, the improvement residing in said resistor means including N discrete resistive regions formed in isolated portions of said layer of opposite conductivity type semiconductor and electrically coupled to one another with each of said N discrete resistive regions having a respective one of N discrete segments of conductive material formed on said dielectric layer over at least a portion thereof, and first means to couple each of said N discrete segments of conductive material to the said terminal means at the one end of said resistor means which provides a potential to said N discrete segments of conductive material to vary the resistance value of said resistive regions an amount equal to and opposite the amount of variation in resistance value caused by potential applied to said layer of opposite conductivity type semiconductor and second means to couple said layer of opposite conductivity type semiconductor to the end of said N discrete resistive regions opposite to the said one end.
Claim 7
Dependent Claim
16 words
The resistance arrangement of claim 4 wherein said resistor means is made of a P-type material.
Claim 8
Dependent Claim
52 words
The resistance arrangement of claim 5 wherein said first means to couple said N discrete segments of conductive material to the said terminal means at one end of said resistor means is coupled to that end of said resistor means which is at a negative potential with respect to the opposite end.
Claim 9
Dependent Claim
51 words
The resistance arrangement of claim 4 wherein said resistor means is made of an N-type material and wherein said N discrete segments of conductive material are coupled to the said terminal means at the end of said resistor means which is at a positive potential with respect to the opposite end.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1984-04-20 | 1984-10-20 | 1985-04-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1988-04-20 | 1988-10-20 | 1989-04-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1992-04-20 | 1992-10-20 | 1993-04-21 | $7700.00 | Window Closed / Lapsed |