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US4261698A Expired / Lapsed US ⏱️ 0.0 years remaining

Trace oxygen detector

Assignee: International Business Machines Corp
•
Filing: 1980-01-23
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Granted: 1981-04-14
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Expires: 2000-01-23
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Abstract

Abstract Apparatus and a method for measuring trace amounts of oxygen in an atmosphere is described. An oxygen free nitrogen gas is used as the carrier gas and nitrogen, ultra high purity, with approximately 10 ppm (parts per million) water is used as the reagent gas of an ionization source is operated at atmospheric pressure. A small electric field of approximately 200 volts per centimeter is applied across the length of the ionization chamber up to a pinhole entrance to a quadrupole mass spectrometer. The voltage is biased to repel negative ions towards the quadrupole mass spectrometer. Measurement of the peak height of the m/e value of 52 in the mass spectrum are integrated over a period of time. The results of the integration are then compared to a calibration chart which indicates the amount of oxygen that is present in the atmosphere being measured.

Inventors

  • 👤 Timothy W. Carr
  • 👤 Charles D. Needham
  • 👤 Edward C. Spaulding

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 01:25
CPC Classifications
G; G01; G01N; G01N27/00; G01N27/62; G01N27/68; G01N27/622; G01N27/623; Y; Y10; Y10T; Y10T436/00; Y10T436/20; Y10T436/207497; Y10T436/209163

Claims Analysis

Total Claims: 17
Claim 1
Independent Claim 71 words
Method for measuring trace amounts of oxygen comprising: (a) diluting said trace amounts of oxygen with inert gas carrier, (b) ionizing said oxygen to form ionized atomic oxygen, (c) reacting said ionized atomic oxygen with vapor to form ionized reaction products, (d) selectively separating said products into mass charge ratio values of 32, 50, 52, and 68, and, (e) measuring the quantities of said separated products in each of said values.
Claim 2
Dependent Claim 71 words
Method for measuring trace amounts of oxygen comprising: (a) diluting said trace amounts of oxygen with inert gas carrier, (b) ionizing said oxygen to form ionized atomic oxygen, (c) reacting said ionized atomic oxygen with vapor to form ionized reaction products, (d) selectively separating said products into mass charge ratio values of 32, 50, 52, and 68, and, (e) measuring the quantities of said separated products in each of said values.
Claim 3
Dependent Claim 33 words
The method of claim 1 wherein said oxygen is ionized at a source temperature of at least 210° C. to form a O(H 2 O) 2 - ion of mass charge ratio 52.
Claim 4
Dependent Claim 17 words
The method of claim 2 wherein said measuring is specific to said mass charge ratio of 52.
Claim 5
Dependent Claim 24 words
The method of claim 2 wherein said oxygen is also ionized to form a O 2 - ion of mass charge ratio of 32.
Claim 6
Dependent Claim 15 words
The method of claim 4 wherein said measuring includes said mass charge ratio of 32.
Claim 7
Dependent Claim 159 words
Apparatus for measuring low levels of oxygen comprising: (a) a chamber at atmospheric pressure and at a temperature of at least 210° C., (b) means to introduce at one end an oxygen containing inert gas, (c) means to ionize the oxygen, (d) means to introduce a standard amount of water vapor into said chamber for reaction with the ionized oxygen to form ionized products, (e) means to bias the chamber to drive said products to the opposite end thereof, (f) a second chamber under vacuum at said opposite end, (g) an aperture in said opposite end interconnecting with said chambers to inject a stream of said products into said vacuum chamber, and (h) means at the end of said vacuum chamber to detect and measure the intensity of ions selected from the group of O 2 - , O 2 (H 2 O) - , O(H 2 O) 2 - and O 2 (H 2 O) 2 - .
Claim 8
Dependent Claim 159 words
Apparatus for measuring low levels of oxygen comprising: (a) a chamber at atmospheric pressure and at a temperature of at least 210° C., (b) means to introduce at one end an oxygen containing inert gas, (c) means to ionize the oxygen, (d) means to introduce a standard amount of water vapor into said chamber for reaction with the ionized oxygen to form ionized products, (e) means to bias the chamber to drive said products to the opposite end thereof, (f) a second chamber under vacuum at said opposite end, (g) an aperture in said opposite end interconnecting with said chambers to inject a stream of said products into said vacuum chamber, and (h) means at the end of said vacuum chamber to detect and measure the intensity of ions selected from the group of O 2 - , O 2 (H 2 O) - , O(H 2 O) 2 - and O 2 (H 2 O) 2 - .
Claim 9
Dependent Claim 13 words
The apparatus of claim 6 wherein said means to ionize comprises 63 Ni.
Claim 10
Dependent Claim 20 words
The apparatus of claim 6 wherein the first said chamber is biased with an electric field strength of 200 V/cm.
Claim 11
Dependent Claim 13 words
The apparatus of claim 8 wherein said means to ionize comprises 63 Ni.
Claim 12
Dependent Claim 43 words
The apparatus of claim 6 including means to control said reaction to essentially the formation of the O(H 2 O) 2 - ion with a mass charge ratio of 52, and said filter is tuned to essentially a mass charge ratio of 52.
Claim 13
Dependent Claim 13 words
The apparatus of claim 10 wherein said means to ionize comprises 63 Ni.
Claim 14
Dependent Claim 20 words
The apparatus of claim 11 wherein the first said chamber is biased with an electric field strength of 200 V/cm.
Claim 15
Dependent Claim 40 words
The apparatus of claim 6 including means to control said reaction to the formation of a stable O 2 - ion having a mass charge ratio of 32, and said filter is tuned to said mass charge ratio of 32.
Claim 16
Dependent Claim 13 words
The apparatus of claim 13 wherein said means to ionize comprises 63 Ni.
Claim 17
Dependent Claim 20 words
The apparatus of claim 11 wherein the first said chamber is biased with an electric field strength of 200 V/cm.

References Cited (Backward Citations)

US3647387A Cited
US3752652A Cited
US4169708A Cited
US4147515A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1984-04-13 1984-10-13 1985-04-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1988-04-13 1988-10-13 1989-04-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1992-04-13 1992-10-13 1993-04-14 $7700.00 Window Closed / Lapsed

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