US4255656A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Apparatus for charged particle spectroscopy
Assignee: Kratos Ltd
•
Filing: 1979-05-25
•
Granted: 1981-03-10
•
Expires: 1999-05-25
Abstract
Abstract Charged-particle spectroscopy apparatus for the chemical analysis of a sample in which an apertured plate receives charged particles emitted from the sample and transmits them to an analyzer for analyzing the energies of the particles, the aperture of the plate being such as to restrict the particles passing therethrough to a pencil beam of particles from a selected area of the sample.
Inventors
- 👤 Andrew Barrie
- 👤 Quentin C. Herd
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 14:48
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/22; G01N2223/00; G01N2223/07; G01N2223/084; G01N2223/085; G01N2223/30; G01N2223/316; G01N2223/323
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
110 words
Apparatus for charged-particle spectroscopy for chemical analysis of a sample comprising a laser or light directing means for irradiating a selected restricted area of a sample so as to release charged particles from the selected area by photon excitation, and to visibly identify the irradiated area of the sample, an apertured plate mounted adjacent the sample to receive charged particles therefrom and to transmit a pencil beam of said particles received from the selected restricted area, charged particle focusing means for forming a charged particle image of said selected area in an image plane, and an energy analyser for analysing the energies of the particles passing through the apertured plate.
Claim 2
Dependent Claim
110 words
Apparatus for charged-particle spectroscopy for chemical analysis of a sample comprising a laser or light directing means for irradiating a selected restricted area of a sample so as to release charged particles from the selected area by photon excitation, and to visibly identify the irradiated area of the sample, an apertured plate mounted adjacent the sample to receive charged particles therefrom and to transmit a pencil beam of said particles received from the selected restricted area, charged particle focusing means for forming a charged particle image of said selected area in an image plane, and an energy analyser for analysing the energies of the particles passing through the apertured plate.
Claim 3
Dependent Claim
142 words
Apparatus for charged-particle spectroscopy for chemical analysis of a sample comprising means for irradiating an extended area of a sample so as to release charged particles from the whole of that extended area, an apertured plate mounted adjacent the sample to receive charged particles therefrom and to transmit a pencil beam of said particles received from a selected restricted part of that extended area, charged particle focusing means for forming a charged particle image of said selected area in an image plane, an energy analyser for analysing the energies of the particles passing through the apertured plate, and a laser, or light-directing means, arranged to direct a beam of radiation through the apertured plate on the axis of said pencil beam to form an illuminated spot on said selected area of the sample thereby providing a visual identification of said selected area.
Claim 4
Dependent Claim
142 words
Apparatus for charged-particle spectroscopy for chemical analysis of a sample comprising means for irradiating an extended area of a sample so as to release charged particles from the whole of that extended area, an apertured plate mounted adjacent the sample to receive charged particles therefrom and to transmit a pencil beam of said particles received from a selected restricted part of that extended area, charged particle focusing means for forming a charged particle image of said selected area in an image plane, an energy analyser for analysing the energies of the particles passing through the apertured plate, and a laser, or light-directing means, arranged to direct a beam of radiation through the apertured plate on the axis of said pencil beam to form an illuminated spot on said selected area of the sample thereby providing a visual identification of said selected area.
Claim 5
Dependent Claim
29 words
Apparatus according to claim 1 or claim 2 wherein the analyser has an internally-convex wall containing an aperture and said laser or light-directing means is located opposite said aperture.
Claim 6
Dependent Claim
38 words
Apparatus according to claim 1, or claim 2 wherein said laser, or light-directing means, is arranged to direct a beam of radiation through the apertured plate on the axis of said pencil beam to impinge on the sample.
References Cited (Backward Citations)
US2642537A
Cited
GB1332207A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1984-03-09 | 1984-09-08 | 1985-03-10 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1988-03-09 | 1988-09-08 | 1989-03-10 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1992-03-09 | 1992-09-08 | 1993-03-10 | $7700.00 | Window Closed / Lapsed |