Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
307 words
A Schottky-barrier diode structure comprising: a semiconductor substrate; a doped subdiffusion layer of relatively high conductivity disposed on said substrate; a layer of epitaxial material of relatively low conductivity disposed on said subdiffusion layer; an insulating region of recessed oxide disposed in said structure and extending down into said epitaxial layer, into said subdiffusion layer and into said substrate to form a recessed oxide isolation region surrounding an area of said subdiffusion layer and said epitaxial layer to define a perimeter, the interior area of said perimeter bounded by said recessed oxide being the active device area of said Schottky-barrier diode structure, and wherein said layer of epitaxial material in said active device area functions as the cathode electrode of said Schottky-barrier diode structure; a body of relatively highly doped polysilicon located on top of and in the center of said layer of epitaxial material in said active device area surrounded by said recessed oxide; an insulating layer of oxide material disposed on the top and sides of said body of relatively highly doped polysilicon; a diffusion region located below said body of highly doped polysilicon and extending into said layer of epitaxial material, said body of highly doped polysilicon and said diffusion region therebelow functioning as an electrical cathode contact for said epitaxial layer cathode electrode; and first and second regions of Schottky-barrier diode anode material disposed in said epitaxial layer in said active device area on either side of said body of polysilicon material, said first and second regions of said Schottky-barrier diode anode material being bounded by said recessed oxide and said oxide on the sides of said body of polysilicon material to form a Schottky-barrier diode structure wherein said cathode contact is disposed in between said anode contacts and is isolated from said anode contacts by said oxide insulation on the sides thereof.
Claim 2
Dependent Claim
307 words
A Schottky-barrier diode structure comprising: a semiconductor substrate; a doped subdiffusion layer of relatively high conductivity disposed on said substrate; a layer of epitaxial material of relatively low conductivity disposed on said subdiffusion layer; an insulating region of recessed oxide disposed in said structure and extending down into said epitaxial layer, into said subdiffusion layer and into said substrate to form a recessed oxide isolation region surrounding an area of said subdiffusion layer and said epitaxial layer to define a perimeter, the interior area of said perimeter bounded by said recessed oxide being the active device area of said Schottky-barrier diode structure, and wherein said layer of epitaxial material in said active device area functions as the cathode electrode of said Schottky-barrier diode structure; a body of relatively highly doped polysilicon located on top of and in the center of said layer of epitaxial material in said active device area surrounded by said recessed oxide; an insulating layer of oxide material disposed on the top and sides of said body of relatively highly doped polysilicon; a diffusion region located below said body of highly doped polysilicon and extending into said layer of epitaxial material, said body of highly doped polysilicon and said diffusion region therebelow functioning as an electrical cathode contact for said epitaxial layer cathode electrode; and first and second regions of Schottky-barrier diode anode material disposed in said epitaxial layer in said active device area on either side of said body of polysilicon material, said first and second regions of said Schottky-barrier diode anode material being bounded by said recessed oxide and said oxide on the sides of said body of polysilicon material to form a Schottky-barrier diode structure wherein said cathode contact is disposed in between said anode contacts and is isolated from said anode contacts by said oxide insulation on the sides thereof.
Claim 3
Dependent Claim
33 words
A Schottky-barrier diode structure according to claim 1 further including a metallic line disposed over the surface of said recessed oxide, said Schottky-barrier anode material and said oxide covered body of polysilicon material.
Claim 4
Dependent Claim
39 words
A Schottky-barrier diode structure according to claim 1 wherein said semiconductor substrate is composed of silicon, said recessed oxide is silicon dioxide and said oxide insulation of the top and sides of said body of polysilicon is silicon dioxide.
Claim 5
Dependent Claim
17 words
A Schottky-barrier diode structure according to claim 3 wherein said Schottky-barrier diode anode material is palladium silicide.
Claim 6
Dependent Claim
31 words
A Schottky-barrier diode structure according to claim 3 wherein said substrate is composed of p-type silicon and said subdiffusion layer on said body of polysilicon material are doped with n+ donors.
Claim 7
Dependent Claim
17 words
A Schottky-barrier diode structure according to claim 5 wherein said subdiffusion layer is doped with arsenic donors.
Claim 8
Dependent Claim
17 words
A Schottky-barrier diode structure according to claim 5 wherein said subdiffusion layer is doped with phosphorus donors.