Calibration method for lumped capacitance measurement of complex permittivity at HF, VHF and UHF frequencies

Claim 2

Method for calibrating a sample holder and its transmission line used in conjunction with a network analyzer for measuring complex permittivity of unknown dielectrics placed in the sample holder at frequencies in the HF, VHF and UHF bands comprising: a. measuring the complex reflection coefficient of the sample holder by an automatic network analyzer for a sample holder filled with air; b. measuring the complex reflection coefficient of the sampler holder and its transmission line for said sample holder filled with a dielectric material of known complex permittivity; and c. calculating the capacitance for the air-filled sample holder and the line attenuation and propagation constants of the transmission line from said measurement whereby measurement of the complex reflection coefficient of the sample holder and the transmission line for the sample holder filled with unknown dielectric may be used to calculate the complex permittivity of materials placed in the sample holder at frequencies in said bands wherein the maximum dimensions of the sample holder is less than 1% of a wavelength in said unknown dielectric material.

Claim 3

The method of claim 1 wherein the dielectric material of known permittivity is water or carbon tetrachloride.

Claim 4

The method of claim 1 wherein the capacitance of the air-filled sample holder is about 0.83 picofarads.

Claim 5

The method of claim 1 wherein the complex permittivity is in the range of about 2 to 80 MHz and the maximum frequency varies inversely proportional thereto in the range from 500 to 200 MHz.

Claim 6

The method of claim 1 wherein the frequency does not exceed 200 MHz for water dominated dielectrics as shown in FIG. 5.

Claim 7

Method for calibrating an instrument for measuring complex permittivity of ionic type solutions at frequencies in the HF and VHF bands between 1 and 100 megahertz using polarizable electrode surfaces comprising the steps of: a. measuring the complex reflection coefficient by the lumped capacitance method in an automatic network analyzer for a capacitor terminal filled with air; b. measuring the complex reflection coefficient for said capacitor filled with a dielectric material of known complex permittivity; c. calculating the capacitance for the air-filled capacitor and the line attenuation and propagation constants from said measurement; d. measuring the complex permittivity of the solution with platinum/platinum black electrode surfaces; e. measuring the complex permittivity of the solution with untreated electrode surfaces; f. comparing the differences in complex permittivity between the measurements obtained in steps (d). and (e); g. using the difference in complex permittivity obtained in step (f) as the correction factor; h. applying the corrector factor obtained in step (g) to the complex permittivity obtained when using polarizable electrode surfaces; and i. using the measurement of the complex reflection coefficient of the unknown dielectric to calculate the complex permittivity at frequencies in said bands wherein the maximum dimension of the capacitor is less than 1% of a wavelength in said unknown dielectric material.

Claim 8

Method for calibrating an instrument for measuring complex permittivity of ionic type solutions at frequencies in the HF and VHF bands between 1 and 100 megahertz using polarizable electrode surfaces comprising the steps of: a. measuring the complex reflection coefficient by the lumped capacitance method in an automatic network analyzer for a capacitor terminal filled with air; b. measuring the complex reflection coefficient for said capacitor filled with a dielectric material of known complex permittivity; c. calculating the capacitance for the air-filled capacitor and the line attenuation and propagation constants from said measurement; d. measuring the complex permittivity of the solution with platinum/platinum black electrode surfaces; e. measuring the complex permittivity of the solution with untreated electrode surfaces; f. comparing the differences in complex permittivity between the measurements obtained in steps (d). and (e); g. using the difference in complex permittivity obtained in step (f) as the correction factor; h. applying the corrector factor obtained in step (g) to the complex permittivity obtained when using polarizable electrode surfaces; and i. using the measurement of the complex reflection coefficient of the unknown dielectric to calculate the complex permittivity at frequencies in said bands wherein the maximum dimension of the capacitor is less than 1% of a wavelength in said unknown dielectric material.

Claim 9

The method of claim 6 wherein the surface of the polarizable untreated electrode is copper.

Claim 10

The method of claim 6 wherein the surface of the polarizable untreated electrode is platinum.