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US4246510A Expired / Lapsed US ⏱️ 0.0 years remaining

Retina for pyroelectric vidicon

Assignee: United States Department of the Army
•
Filing: 1976-01-07
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Granted: 1981-01-20
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Expires: 1996-01-07
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Abstract

Abstract A retina is provided for a pyroelectric vidicon which is rugged, long liv and has increased resistance to contamination by normal environments encountered during testing and subsequent installation in the vidicon tube.

Inventors

  • 👤 Wellman L. Clark
  • 👤 John T. Cox
  • 👤 Gerald Klauber
  • 👤 Ferdinand C. Petito
  • 👤 John B. Ramsey, Jr.
  • 👤 John E. Waylonis

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 21:00
CPC Classifications
H; H01; H01J; H01J31/00; H01J31/08; H01J31/49; H01J29/00; H01J29/02; H01J29/10; H01J29/36; H01J29/39; H01J29/45; H01J29/458; H01J9/00; H01J9/20; H01J9/233

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 146 words
In an optical system, wherein a wafer of pyroelectric material chosen from the group comprising Triglycine Sulphate, Triglycine Tetrafluoroberyllate, Deuterated Triglycine Tetrafluoroberyllate, Lithium Tantallate, Lithium Niobate, and Lead Lanthanum Ziroconate is coated on one broad side with a thin layer of conductive material and an electronic means coupled to said thin layer is provided to scan the remaining broad side of said wafer with an electron beam whereby a thermal image induced on said one side is detected; the improvement comprising: a single layer only of dielectric material entirely covering said remaining side of said wafer, said layer having a secondary emission coefficient greater than one and having a sheet resistance greater than 10 12 ohm/square, and said dielectric layer being formed of a compound chosen from the group consisting of SiO 2 , BaF 2 , MgO, MgF, KCl, BaO 2 , spinel and Ge.
Claim 2
Dependent Claim 146 words
In an optical system, wherein a wafer of pyroelectric material chosen from the group comprising Triglycine Sulphate, Triglycine Tetrafluoroberyllate, Deuterated Triglycine Tetrafluoroberyllate, Lithium Tantallate, Lithium Niobate, and Lead Lanthanum Ziroconate is coated on one broad side with a thin layer of conductive material and an electronic means coupled to said thin layer is provided to scan the remaining broad side of said wafer with an electron beam whereby a thermal image induced on said one side is detected; the improvement comprising: a single layer only of dielectric material entirely covering said remaining side of said wafer, said layer having a secondary emission coefficient greater than one and having a sheet resistance greater than 10 12 ohm/square, and said dielectric layer being formed of a compound chosen from the group consisting of SiO 2 , BaF 2 , MgO, MgF, KCl, BaO 2 , spinel and Ge.
Claim 3
Dependent Claim 95 words
In an optical system, wherein a wafer of pyroelectric material chosen from the group comprising Triglycine Sulphate, Triglycine Tetrafluoroberyllate, Deuterated Triglycine Tetrafluoroberyllate, Lithium Tantallate, Lithium Niobate, and Lead Lanthanum Ziroconate is coated on one broad side with a thin layer of conductive material and an electronic means coupled to said thin layer is provided to scan the remaining broad side of said wafer with an electron beam whereby a thermal image induced on said one side is detected; the improvement comprising: a single layer consisting only of silicon dioxide entirely covering said remaining broad side.
Claim 4
Dependent Claim 95 words
In an optical system, wherein a wafer of pyroelectric material chosen from the group comprising Triglycine Sulphate, Triglycine Tetrafluoroberyllate, Deuterated Triglycine Tetrafluoroberyllate, Lithium Tantallate, Lithium Niobate, and Lead Lanthanum Ziroconate is coated on one broad side with a thin layer of conductive material and an electronic means coupled to said thin layer is provided to scan the remaining broad side of said wafer with an electron beam whereby a thermal image induced on said one side is detected; the improvement comprising: a single layer consisting only of silicon dioxide entirely covering said remaining broad side.
Claim 5
Dependent Claim 142 words
In an optical system, wherein a wafer of pyroelectric material chosen from the gorup comprising Triglycine Sulphate, Triglycine Tetrafluoroberyllate, Deuterated Triglycine Tetrafluoroberyllate, Lithium Tantallate, Lithium Niobate, and Lead Lanthanum Ziroconate is coated on one broad side with a thin layer of conductive material and an electronic means coupled to said thin layer is provided to scan the remaining broad side of said wafer with an electron beam whereby a thermal image induced on said is detected; the improvement comprising: a single layer only of dielectric material entirely covering said remaining broad side of said wafer, said layer having a secondary emission coefficient greater than one and having a sheet resistance greater than 10 12 ohm/square, and said dielectric layer being formed of a compound chosen from the group consisting of BaF 2 , MgO, MgF, KCl, BaO 2 , spinel and Ge.
Claim 6
Dependent Claim 142 words
In an optical system, wherein a wafer of pyroelectric material chosen from the gorup comprising Triglycine Sulphate, Triglycine Tetrafluoroberyllate, Deuterated Triglycine Tetrafluoroberyllate, Lithium Tantallate, Lithium Niobate, and Lead Lanthanum Ziroconate is coated on one broad side with a thin layer of conductive material and an electronic means coupled to said thin layer is provided to scan the remaining broad side of said wafer with an electron beam whereby a thermal image induced on said is detected; the improvement comprising: a single layer only of dielectric material entirely covering said remaining broad side of said wafer, said layer having a secondary emission coefficient greater than one and having a sheet resistance greater than 10 12 ohm/square, and said dielectric layer being formed of a compound chosen from the group consisting of BaF 2 , MgO, MgF, KCl, BaO 2 , spinel and Ge.

References Cited (Backward Citations)

US3082340A Cited
US3350595A Cited
US3725711A Cited
US3930157A Cited
US3928768A Cited
US4019084A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1984-01-20 1984-07-21 1985-01-20 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1988-01-20 1988-07-21 1989-01-20 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1992-01-20 1992-07-21 1993-01-20 $7700.00 Window Closed / Lapsed

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