Method and apparatus for sorting and stacking conductor plates tested in a conductor plate tester and an apparatus for carrying out the same

Claim 1

Apparatus for sorting and stacking tested conductor plates comprising: stacking means for forming from the bottom up a stack of conductor plates which have passed the tests, said stacking means including a pair of side walls and a pair of gripping means disposed opposite each other for gripping and for lifting and lowering the stacked conductor plates relative to a support plane, each said gripping means having an angle member which is laterally movable and moving means secured to said angle member for moving it vertically toward and away from the support plane and for moving it laterally parallel to the support plane, lifting means for raising from the bottom the entire stack each time a tested conductor plate approaches the bottom of said stack, plate feeding means for feeding each tested conductor plate beneath said raised stack, temporary support means to which the latest tested plate is fed by said plate feeding means, comprising a series of parallel spaced-apart rods and said angle members comprise a comb-like horizontal member with tines aligned to the spaces between the rods of the temporary support means, ejecting means for actuating said temporary support means to eject a failed said plate, lowering means for lowering said stack after an ejection opportunity has passed, and stack unifying means for lowering said lifting means below a latest-tested plate that has passed the test, so that such a plate is incorporated into the stack before said lifting means is next activated.