Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
193 words
A method of obtaining by means of optical components a high resolution scattering spectrum from irradiation of a sample without disturbing the position of the sample, said spectrum being free of artifacts due to the presence of optical components which distort the intensities of the scattered spectrum, which comprises (a) irradiating the sample with monochromatic light to produce scattered light, (b) simultaneously passing the scattered light from the sample and light from a white light source of known emissivity through the optical components, (c) selectively intercepting the light from the white light source and the scattered light from the sample, (d) dispersing into a plurality of wavelengths the scattered light from the sample and the light from the white light source, (e) measuring at each wavelength through the optical components the intensities of the scattered light from the irradiated sample and the light from the white light source, (f) ratioing the so-measured light intensities from the irradiated sample and the white light source to yield a light intensity at each wavelength representative solely of the scattered light from the irradiated sample, and (g) displaying the so-ratioed light intensity as a function of wavelength.
Claim 2
Independent Claim
193 words
A method of obtaining by means of optical components a high resolution scattering spectrum from irradiation of a sample without disturbing the position of the sample, said spectrum being free of artifacts due to the presence of optical components which distort the intensities of the scattered spectrum, which comprises (a) irradiating the sample with monochromatic light to produce scattered light, (b) simultaneously passing the scattered light from the sample and light from a white light source of known emissivity through the optical components, (c) selectively intercepting the light from the white light source and the scattered light from the sample, (d) dispersing into a plurality of wavelengths the scattered light from the sample and the light from the white light source, (e) measuring at each wavelength through the optical components the intensities of the scattered light from the irradiated sample and the light from the white light source, (f) ratioing the so-measured light intensities from the irradiated sample and the white light source to yield a light intensity at each wavelength representative solely of the scattered light from the irradiated sample, and (g) displaying the so-ratioed light intensity as a function of wavelength.
Claim 3
Dependent Claim
28 words
The method of claim 1 wherein the light from the white light source of known emissivity is passed through a polarizer prior to passing through the optical components.
Claim 4
Dependent Claim
13 words
The method of claim 2 wherein the optical components include an optical filter.
Claim 5
Dependent Claim
16 words
The method of claim 3 wherein said optical filter is a cell containing hot iodine vapor.
Claim 6
Dependent Claim
58 words
The method of claim 3 wherein the scattered light from the irradiated sample is passed through a polaroid beam combiner positioned between the irradiated sample and the optical filter at an angle approximately 45 degrees to the optic axis and the light from the white light source is reflected from said polaroid beam combiner through the optical filter.
Claim 7
Dependent Claim
32 words
The method of claim 1 wherein the optical components include a computer controlled analyzer which selectively intercepts the scattered light from the irradiated sample and the light from the white light source.
Claim 8
Dependent Claim
25 words
The method of claim 1 wherein the sample is irradiated by an Argon Laser and the artifacts include stray light due to intense Rayleigh scattering.
Claim 9
Independent Claim
209 words
An apparatus for obtaining by means of optical components a high resolution scattering spectrum from irradiation of a sample without disturbing the position of the sample, said spectrum being free of artifacts due to the presence of said optical components, which comprises in combination (a) means for irradiating the sample with monochromatic light to produce scattered light, (b) means for collecting the scattered light from the irradiated sample, (c) a white light source of known emissivity, (d) means for polarizing the light from the white light source, (e) means for passing the scattered light from the irradiated sample and the light from the white light source simultaneously through the optical components, (f) means for dispersing into a plurality of wavelengths the so-passed scattered light and light from the white light source, (g) means for selectively measuring at each wavelength the intensities of the scattered light from the sample and the light from the white light source, (h) means for ratioing the so-measured light intensities from the irradiated sample and the white light source to yield light intensities representative solely of the scattered light from the irradiated sample, (i) means for storing the so-ratioed light intensities, and (j) means for displaying the so-ratioed light intensities as a function of wavelength.
Claim 10
Independent Claim
209 words
An apparatus for obtaining by means of optical components a high resolution scattering spectrum from irradiation of a sample without disturbing the position of the sample, said spectrum being free of artifacts due to the presence of said optical components, which comprises in combination (a) means for irradiating the sample with monochromatic light to produce scattered light, (b) means for collecting the scattered light from the irradiated sample, (c) a white light source of known emissivity, (d) means for polarizing the light from the white light source, (e) means for passing the scattered light from the irradiated sample and the light from the white light source simultaneously through the optical components, (f) means for dispersing into a plurality of wavelengths the so-passed scattered light and light from the white light source, (g) means for selectively measuring at each wavelength the intensities of the scattered light from the sample and the light from the white light source, (h) means for ratioing the so-measured light intensities from the irradiated sample and the white light source to yield light intensities representative solely of the scattered light from the irradiated sample, (i) means for storing the so-ratioed light intensities, and (j) means for displaying the so-ratioed light intensities as a function of wavelength.
Claim 11
Dependent Claim
11 words
The apparatus of claim 8 which further includes an optical filter.
Claim 12
Dependent Claim
16 words
The apparatus of claim 9 wherein the optical filter is a cell containing hot iodine vapor.
Claim 13
Dependent Claim
51 words
The apparatus of claim 9 wherein the means for passing the scattered light from the sample and the light from the white light source through the optical components includes a polaroid beam combiner positioned between the sample and the optical filter at an angle approximately 45 degrees to the optic axis.