US4228448A
Expired / Lapsed
US
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Bipolar integrated semiconductor structure including I2 L and linear type devices and fabrication methods therefor
Assignee: Burr Brown Research Corp
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Filing: 1977-10-07
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Granted: 1980-10-14
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Expires: 1997-10-07
Abstract
Abstract This disclosure relates to a bipolar integrated semiconductor structure that has incorporated therein both I 2 L and linear type bipolar devices. The integrated structure utilizes a double epitaxial layer deposited or formed on a starting substrate wherein at least one linear type bipolar device is incorporated in one portion of the final integrated structure and at least one I 2 L bipolar device is incorporated in another portion of the final double epitaxial layer integrated structure. For the linear type bipolar device, the subcollector region is selectively located between the starting substrate and the first epitaxial layer whereas for the I 2 L bipolar device, the sub-emitter region is selectively located between the first and the second epitaxial layers. Other features of the bipolar integrated semiconductor structure include polysilicon isolation for the I 2 L and linear devices, up and down diffused PN junction isolation type regions, up-diffused base region for the I 2 L device, Schottky type collectors for the I 2 L device, up and down diffused base regions for the I 2 L device isolate the collector contacts, and the use of another subcollector region selectively located between the first and the second epitaxial layer in the linear portion of the integrated semiconductor structure which functions to improve the current gain of the lateral PNP linear transistor device.
Inventors
- 👤 Thomas M. Lalumia
- 👤 James N. Fordemwalt
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 05:33
CPC Classifications
H; H03; H03K; H03K19/00; H03K19/02; H03K19/08; H03K19/082; H03K19/091; H10; H10D; H10D84/00; H10D84/01; H10D84/0112; H10D84/0116; H10D84/02; H10D84/03; H10D84/038; H10D84/60; H10D84/65; H10D84/658; Y; Y10; Y10S; Y10S148/00; Y10S148/087; Y10S148/088; Y10S257/00; Y10S257/918
Claims Analysis
Total Claims: 30
Claim 1
Independent Claim
173 words
A bipolar integrated semiconductor structure comprising, in combination, a first portion having at least one linear type bipolar device having emitter, base and collector regions; a second portion separated in said structure from said first portion and having at least one I 2 L type bipolar device having emitter, base and collector regions, said structure having a substrate, a first epitaxial layer located on said substrate, and a second epitaxial layer located on said first epitaxial layer, said linear type bipolar device having one of a subcollector and a subbase region located in a region encompassing a portion of the intersection between said substrate and said first epitaxial layer, said I 2 L type bipolar device having a subemitter region located in a region encompassing a portion of the intersection between said first epitaxial layer and said second epitaxial layer, said one of a subcollector and a subbase region of said linear type bipolar device and said subemitter region of said I 2 L type bipolar device being of the same conductivity type.
Claim 2
Dependent Claim
173 words
A bipolar integrated semiconductor structure comprising, in combination, a first portion having at least one linear type bipolar device having emitter, base and collector regions; a second portion separated in said structure from said first portion and having at least one I 2 L type bipolar device having emitter, base and collector regions, said structure having a substrate, a first epitaxial layer located on said substrate, and a second epitaxial layer located on said first epitaxial layer, said linear type bipolar device having one of a subcollector and a subbase region located in a region encompassing a portion of the intersection between said substrate and said first epitaxial layer, said I 2 L type bipolar device having a subemitter region located in a region encompassing a portion of the intersection between said first epitaxial layer and said second epitaxial layer, said one of a subcollector and a subbase region of said linear type bipolar device and said subemitter region of said I 2 L type bipolar device being of the same conductivity type.
Claim 3
Dependent Claim
41 words
A bipolar integrated semiconductor structure in accordance with claim 1 wherein said linear type bipolar device being a lateral type bipolar device, said linear lateral type bipolar device having a subbase region located between said substrate and said first epitaxial layer.
Claim 4
Dependent Claim
41 words
A bipolar integrated semiconductor structure in accordance with claim 1 wherein said linear type bipolar device being a vertical type bipolar device, said linear vertical type bipolar device having a subcollector region located between said substrate and said first epitaxial layer.
Claim 5
Dependent Claim
39 words
A bipolar integrated semiconductor structure in accordance with claim 1 including another linear lateral type bipolar device, said another linear lateral type bipolar device having a subbase region located between said first epitaxial layer and said second epitaxial layer.
Claim 6
Dependent Claim
31 words
A bipolar integrated semiconductor structure in accordance with claim 4 wherein said another linear lateral type bipolar device having both the emitter and collector regions in contact with said subbase region.
Claim 7
Dependent Claim
19 words
A bipolar integrated semiconductor structure in accordance with claim 5 wherein said collector region completely surrounds said emitter region.
Claim 8
Dependent Claim
43 words
A bipolar integrated semiconductor structure in accordance with claim 1 wherein said I 2 L type bipolar device comprising a vertical type device and a lateral type device, the base of said vertical type device being the collector of said lateral type device.
Claim 9
Dependent Claim
29 words
A bipolar integrated semiconductor structure in accordance with claim 7 wherein said vertical type device being a NPN type device, said lateral type device being a PNP type device.
Claim 10
Dependent Claim
24 words
A bipolar integrated semiconductor structure in accordance with claim 8 wherein said base of said NPN vertical type device being a P- type region.
Claim 11
Dependent Claim
24 words
A bipolar integrated semiconductor structure in accordance with claim 8 wherein said emitter of said PNP lateral type device being a P- type region.
Claim 12
Dependent Claim
24 words
A bipolar integrated semiconductor structure in accordance with claim 9 wherein said emitter of said PNP lateral type device being a P- type region.
Claim 13
Dependent Claim
41 words
A bipolar integrated semiconductor structure in accordance with claim 7 wherein said linear type bipolar device being a lateral type bipolar device, said linear lateral type bipolar device having a subbase region located between said substrate and said first epitaxial layer.
Claim 14
Dependent Claim
41 words
A bipolar integrated semiconductor structure in accordance with claim 7 wherein said linear type bipolar device being a vertical type bipolar device, said linear vertical type bipolar device having a subcollector region located between said substrate and said first epitaxial layer.
Claim 15
Dependent Claim
39 words
A bipolar integrated semiconductor structure in accordance with claim 13 including another linear lateral type bipolar device, said another linear lateral type bipolar device having a subbase region located between said first epitaxial layer and said second epitaxial layer.
Claim 16
Dependent Claim
31 words
A bipolar integrated semiconductor structure in accordance with claim 14 wherein said another linear lateral type bipolar device having both the emitter and collector regions in contact with said subbase region.
Claim 17
Dependent Claim
19 words
A bipolar integrated semiconductor structure in accordance with claim 15 wherein said collector region completely surrounds said emitter region.
Claim 18
Dependent Claim
31 words
A bipolar integrated semiconductor structure in accordance with claim 1 wherein said I 2 L type bipolar device having a polysilicon isolation ring surrounding said I 2 L type bipolar device.
Claim 19
Dependent Claim
23 words
A bipolar integrated semiconductor structure in accordance with claim 17 including a high conductivity semiconductor region in contact with said polysilicon isolation ring.
Claim 20
Dependent Claim
23 words
A bipolar integrated semiconductor structure in accordance with claim 18 including a metal ohmic contact in contact with said high conductivity semiconductor region.
Claim 21
Dependent Claim
48 words
A bipolar integrated semiconductor structure in accordance with claim 7 wherein said base region of said vertical type device of said I 2 L type bipolar device having a higher resistivity portion and a lower resistivity portion, said higher resistivity portion being in contact with said subemitter region.
Claim 22
Dependent Claim
44 words
A bipolar integrated semiconductor structure in accordance with claim 7 wherein said emitter region of said lateral type device having a higher resistivity portion and a lower resistivity portion, said higher resistivity portion being in contact with said subemitter of said vertical type device.
Claim 23
Dependent Claim
30 words
A bipolar integrated semiconductor structure in accordance with claim 20 wherein said higher resistivity portion being a P- type region and said lower resistivity portion be a P type region.
Claim 24
Dependent Claim
30 words
A bipolar integrated semiconductor structure in accordance with claim 21 wherein said higher resistivity portion being a P- type region and said lower resistivity portion being a P type region.
Claim 25
Dependent Claim
31 words
A bipolar integrated semiconductor structure in accordance with claim 20 wherein said I 2 L type bipolar device having a polysilicon isolation ring surrounding said I 2 L type bipolar device.
Claim 26
Dependent Claim
31 words
A bipolar integrated semiconductor structure in accordance with claim 21 wherein said I 2 L type bipolar device having a polysilicon isolation ring surrounding said I 2 L type bipolar device.
Claim 27
Dependent Claim
34 words
A bipolar integrated semiconductor structure in accordance with claim 20 wherein said collector of said vertical type device of said I 2 L type bipolar device being at least one Schottky type collector diode.
Claim 28
Dependent Claim
34 words
A bipolar integrated semiconductor structure in accordance with claim 21 wherein said collector of said vertical type device of said I 2 L type bipolar device being at least one Schottky type collector diode.
Claim 29
Dependent Claim
37 words
A bipolar integrated semiconductor structure in accordance with claim 26 including a Schottky type base-collector anti-saturation diode connected to the base and collector regions of said vertical type device of said I 2 L type bipolar device.
Claim 30
Dependent Claim
37 words
A bipolar integrated semiconductor structure in accordance with claim 27 including a Schottky type base-collector anti-saturation diode connected to the base and collector regions of said vertical type device of said I 2 L type bipolar device.
References Cited (Backward Citations)
US4081697A
Cited
US4087900A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1983-10-14 | 1984-04-14 | 1984-10-14 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1987-10-14 | 1988-04-14 | 1988-10-14 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1991-10-14 | 1992-04-14 | 1992-10-14 | $7700.00 | Window Closed / Lapsed |