Field controlled thyristor with dual resistivity field layer

Claim 2

A three terminal FCT (field controlled thyristor) comprising (a) a semiconductor substrate having a pair of opposite main surfaces and having a first conductivity type, said semiconductor substrate comprising (1) a first emitter region having said first conductivity type and exposed in one of said main surfaces of said substrate, (2) a second emitter region having a second conductivity type and exposed in the other main surface of said substrate, and (3) a gate region having said second conductivity type, with at least a portion of said gate region exposed in said one main surface, said gate region having a slab-like portion formed between said first and second emitter regions and a part of which overlaps the projection of said first emitter region onto said other main surface; (4) a first base region having said first conductivity type and adjacent to said second emitter region, and (5) a second base region having said first conductivity type and a higher concentration of the impurity determining said first conductivity type and adjacent to said first emitter region; (b) An electrode formed on said other surface of said substrate and electrodes connected respectively with the exposed portions of said first emitter region and said gate region, wherein the current path between the electrodes connected with said first and second emitter region includes a thyristor structure comprising said first emitter region, second base region, slab-like portion of said gate region, first base region and second emitter region, and said current is blocked by the depletion region formed in said substrate by the voltage applied between the electrodes connected respectively with said first emitter region and said gate region.

Claim 3

An FCT as claimed in claim 1, wherein the maximum impurity concentration in said slab-like portion is not more than 1×10 18 cm -3 .

Claim 4

An FCT as claimed in claim 1, wherein carrier lifetime killer is doped in said substrate.

Claim 5

An FCT as claimed in claim 3, wherein said lifetime killer is gold atoms or lattice defects caused by the irradiation of said substrate by radioactive rays.

Claim 6

An FCT as claimed in claim 3, wherein the concentration of said lifetime killer is lower in the portion of said substrate overlapping the projection of said first emitter region onto said other main surface of said substrate and higher in the other portion of said substrate.

Claim 7

An FCT as claimed in claim 1, wherein an electrode is formed on said second emitter region with a polycrystalline semiconductor layer having said second conductivity type interposed between said second emitter region and said electrode.

Claim 8

An FCT as claimed in claim 1, wherein said electrode to be connected with said gate region is formed at the bottoms of grooves cut in said one main surface, the bottom of each of said grooves reaching said slab-like portion of said gate region.

Claim 9

A three terminal FCT (field controlled thyristor) comprising (a) semiconductor substrate having a pair of opposite main surfaces, said substrate comprising (1) a first emitter region having a first conductivity type and exposed in one of said main surfaces of said substrate, (2) a second emitter region having a second conductivity type and exposed in other main surface of said substrate, (3) a gate region having said second conductivity type, with a portion of said gate region exposed in said one main surface, said gate region having a slab-like portion formed between said first and second emitter regions and a part of which overlaps the projection of said first emitter region onto said other main surfaces, (4) a first base region having said first conductivity type and adjacent to said second emitter region, (5) a second base region having said first conductivity type and a lower concentration of the impurity determining said first conductivity type than that of said first base region and adjacent to said first base region, and (6) a third base region having said first conductivity type and a higher concentration of the impurity determining said first conductivity type than that of said second base region and adjacent to said first emitter region; (b) an electrode formed on said other surface of said substrate and electrodes connected respectively with the exposed portions of said first emitter region and said gate region, wherein the current path between the electrodes connected with said first and second emitter region includes a thyristor structure comprising said first emitter region second base region, slab-like portion of said gate region first base region and second emitter region, and said current is blocked by the depletion region formed in said substrate by the voltage applied between the electrodes connected respectively with said first emitter region and said gate region.

Claim 10

A three terminal FCT (field controlled thyristor) comprising (a) semiconductor substrate having a pair of opposite main surfaces, said substrate comprising (1) a first emitter region having a first conductivity type and exposed in one of said main surfaces of said substrate, (2) a second emitter region having a second conductivity type and exposed in other main surface of said substrate, (3) a gate region having said second conductivity type, with a portion of said gate region exposed in said one main surface, said gate region having a slab-like portion formed between said first and second emitter regions and a part of which overlaps the projection of said first emitter region onto said other main surfaces, (4) a first base region having said first conductivity type and adjacent to said second emitter region, (5) a second base region having said first conductivity type and a lower concentration of the impurity determining said first conductivity type than that of said first base region and adjacent to said first base region, and (6) a third base region having said first conductivity type and a higher concentration of the impurity determining said first conductivity type than that of said second base region and adjacent to said first emitter region; (b) an electrode formed on said other surface of said substrate and electrodes connected respectively with the exposed portions of said first emitter region and said gate region, wherein the current path between the electrodes connected with said first and second emitter region includes a thyristor structure comprising said first emitter region second base region, slab-like portion of said gate region first base region and second emitter region, and said current is blocked by the depletion region formed in said substrate by the voltage applied between the electrodes connected respectively with said first emitter region and said gate region.

Claim 11

A three terminal FCT (field controlled thyristor) comprising (a) a semiconductor substrate having a pair of opposite main surfaces, said substrate comprising (1) a first emitter region having a first conductivity type and exposed in one of said main surfaces of said substrate, (2) a second emitter region having a second conductivity type and exposed in other main surface of said substrate, (3) a gate region having said second conductivity type, with a portion of said gate region exposed in said one main surface, said gate region having a slab-like portion formed between said first and second emitter regions and a part of which overlaps the projection of said first emitter region onto said other main surfaces, (4) a first base region having said first conductivity type and adjacent to said second emitter region, and (5 ) a second base region having said first conductivity type and a higher concentration of the impurity determining said first conductivity type and adjacent to said first emitter region, (6) a semiconductor region having said first conductivity type and exposed in part of said other main surface and adjacent to said second emitter region side by side, (b) an electrode formed on said other surface of said substrate and electrodes connected respectively with the exposed portions of said first emitter region and said gate region, wherein the current path between the electrodes connected with said first and second emitter region includes a thyristor structure comprising said first emitter region, second base region, slab-like portion of said gate region, first region and second emitter region, and said current is blocked by the depletion region formed in said substrate by the voltage applied between the electrodes connected respectively with said first emitter region and said gate region.

Claim 12

A three terminal FCT (field controlled thyristor) comprising (a) a semiconductor substrate having a pair of opposite main surfaces, said substrate comprising (1) a first emitter region having a first conductivity type and exposed in one of said main surfaces of said substrate, (2) a second emitter region having a second conductivity type and exposed in other main surface of said substrate, (3) a gate region having said second conductivity type, with a portion of said gate region exposed in said one main surface, said gate region having a slab-like portion formed between said first and second emitter regions and a part of which overlaps the projection of said first emitter region onto said other main surfaces, (4) a first base region having said first conductivity type and adjacent to said second emitter region, and (5 ) a second base region having said first conductivity type and a higher concentration of the impurity determining said first conductivity type and adjacent to said first emitter region, (6) a semiconductor region having said first conductivity type and exposed in part of said other main surface and adjacent to said second emitter region side by side, (b) an electrode formed on said other surface of said substrate and electrodes connected respectively with the exposed portions of said first emitter region and said gate region, wherein the current path between the electrodes connected with said first and second emitter region includes a thyristor structure comprising said first emitter region, second base region, slab-like portion of said gate region, first region and second emitter region, and said current is blocked by the depletion region formed in said substrate by the voltage applied between the electrodes connected respectively with said first emitter region and said gate region.

Claim 13

An FCT as claimed in claim 9, wherein said semiconductor region overlaps the projection of the exposed portion of said gate region onto said other main surface.

Claim 14

An FCT as claimed in claim 9, wherein said second emitter region overlaps the protection of both said first emitter region and said slab-like portion of said gate region.