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US4213835A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for electrolytically etching of a recrystallized aluminum foil

Assignee: Siemens AG
•
Filing: 1979-01-12
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Granted: 1980-07-22
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Expires: 1999-01-12
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Abstract

Abstract A method of etching a recrystallized aluminum foil which utilizes potentiostatic etching to roughen the foil to obtain a particularly high roughening factor. The etching preferably occurs in two stages in which the etching current density of the first stage is above the current density which creates an undesired pitting of the aluminum and a second stage which utilizes an etching current density which is below the density which creates pitting of the aluminum.

Inventors

  • 👤 Horst Fickelscher

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 10:14
CPC Classifications
H; H01; H01G; H01G9/00; H01G9/004; H01G9/04; H01G9/048; H01G9/055; C; C25; C25F; C25F3/00; C25F3/02; C25F3/04

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 111 words
A method for electrolytically etching of a recrystallized aluminum foil comprising the steps of providing an etching bath with suitable electrode geometry for etching the foil approximately quasipotentiostatic according to the current density being attained when a constant anode potential is applied, positioning the foil in the bath, and potentiostatically etching the foil with a temporally constant anode potential, the step of etching including applying an anode potential for creating a current density above the current density for creating pitting of the aluminum during a first etching stage and in a following second etching stage reducing the anode potential to create a current density below the density at which pitting occurs.
Claim 2
Independent Claim 111 words
A method for electrolytically etching of a recrystallized aluminum foil comprising the steps of providing an etching bath with suitable electrode geometry for etching the foil approximately quasipotentiostatic according to the current density being attained when a constant anode potential is applied, positioning the foil in the bath, and potentiostatically etching the foil with a temporally constant anode potential, the step of etching including applying an anode potential for creating a current density above the current density for creating pitting of the aluminum during a first etching stage and in a following second etching stage reducing the anode potential to create a current density below the density at which pitting occurs.
Claim 3
Dependent Claim 13 words
A method according to claim 1, wherein the etching bath contains chloride ions.
Claim 4
Independent Claim 86 words
A method for electrolytically etching of a recrystallized aluminum foil comprising the steps of providing an etching bath, positioning the foil in the bath, and potentiostatically etching the foil with a temporally constant anode potential, the step of etching comprising performing a first etching stage with an etching current density which is above the current density for creating pitting in the aluminum and then performing a second etching stage wherein the etching current density is maintained below said current density for creating pitting in the aluminum.
Claim 5
Independent Claim 86 words
A method for electrolytically etching of a recrystallized aluminum foil comprising the steps of providing an etching bath, positioning the foil in the bath, and potentiostatically etching the foil with a temporally constant anode potential, the step of etching comprising performing a first etching stage with an etching current density which is above the current density for creating pitting in the aluminum and then performing a second etching stage wherein the etching current density is maintained below said current density for creating pitting in the aluminum.
Claim 6
Dependent Claim 13 words
A method according to claim 3, wherein the etching bath contains chloride ions.

References Cited (Backward Citations)

GB970572A Cited
FR1592815A Cited
US3876479A Cited
JPS518132A Cited
US3980539A Cited
US3935080A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1983-07-22 1984-01-21 1984-07-22 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1987-07-22 1988-01-21 1988-07-22 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1991-07-22 1992-01-21 1992-07-22 $7700.00 Window Closed / Lapsed

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