← Back to Patent Explorer
US4191473A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of and apparatus for measuring the absolute wavelength of a source of unknown frequency radiation

Assignee: Individual
•
Filing: 1978-01-09
•
Granted: 1980-03-04
•
Expires: 1998-01-09
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract The invention constitutes a method of and apparatus for measuring the absolute wavelength of a source of unknown frequency radiation through directing radiant energy of known frequency against a diffraction grating of predetermined pattern so as to image a calibrated scale on a suitable screen or the like, and then directing the radiant energy from the unknown frequency source along the same path to the diffraction grating and onto the screen, where a visually available easy-to-read measurement of the wavelength appears.

Inventors

  • 👤 Theodor W. Hansch

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 21:18
CPC Classifications
G; G01; G01J; G01J9/00; G01J3/00; G01J3/12; G01J3/18; G01J3/28; G01J2003/2866

Claims Analysis

Total Claims: 16
Claim 1
Independent Claim 82 words
Apparatus for measuring the absolute wavelength of a source of unknown frequency radiation which comprises a diffraction grating having a predetermined grating pattern with periodic variations in at least some of its grating lines and arranged to receive radiation from the radiation source, a reference source of radiation of known wavelength (frequency) arranged to direct its radiation against said diffraction grating, and means for imaging the diffracted radiation from both sources, the imaged radiation from said reference source providing a calibration scale.
Claim 2
Dependent Claim 82 words
Apparatus for measuring the absolute wavelength of a source of unknown frequency radiation which comprises a diffraction grating having a predetermined grating pattern with periodic variations in at least some of its grating lines and arranged to receive radiation from the radiation source, a reference source of radiation of known wavelength (frequency) arranged to direct its radiation against said diffraction grating, and means for imaging the diffracted radiation from both sources, the imaged radiation from said reference source providing a calibration scale.
Claim 3
Dependent Claim 31 words
Apparatus for measuring absolute wavelength according to claim 1 wherein said diffraction grating has predetermined variations in the characteristics of its grating lines, such as length, width, phase and the like.
Claim 4
Dependent Claim 17 words
Apparatus for measuring absolute wavelength according to claim 2 wherein said line variations constitute different line lengths.
Claim 5
Dependent Claim 17 words
Apparatus for measuring absolute wavelength according to claim 2 wherein said line variations constitute different line widths.
Claim 6
Dependent Claim 34 words
Apparatus for measuring absolute wavelength according to claim 1 wherein the grating lines on said diffraction grating are spaced to provide a calibration scale in a whole number of angstroms at said imaging means.
Claim 7
Dependent Claim 23 words
Apparatus for measuring absolute wavelength according to claim 1 which comprises means for masking some of the grating lines on said diffraction grating.
Claim 8
Dependent Claim 23 words
Apparatus for measuring absolute wavelength according to claim 1 wherein said diffraction grating has grating lines with different spacings on different areas thereof.
Claim 9
Dependent Claim 26 words
Apparatus for measuring absolute wavelength according to claim 1 wherein both sources of radiation traverse a common path through at least a portion of their travel.
Claim 10
Dependent Claim 17 words
Apparatus for measuring absolute wavelength according to claim 1 wherein said diffraction grating constitutes a holographic grating.
Claim 11
Dependent Claim 21 words
Apparatus for measuring absolute wavelength according to claim 9 wherein said holographic grating includes indicia for presentation on said imaging means.
Claim 12
Independent Claim 66 words
The method of measuring the absolute wavelength of a source of unknown frequency radiation which comprises the steps of positioning a diffraction grating in the path of radiation from the unknown source, imaging radiation dispersed from the diffraction grating, and directing a source of known frequency radiation against the diffraction grating to provide a wavelength calibration scale superimposed on the imaged radiation source of unknown frequency.
Claim 13
Independent Claim 66 words
The method of measuring the absolute wavelength of a source of unknown frequency radiation which comprises the steps of positioning a diffraction grating in the path of radiation from the unknown source, imaging radiation dispersed from the diffraction grating, and directing a source of known frequency radiation against the diffraction grating to provide a wavelength calibration scale superimposed on the imaged radiation source of unknown frequency.
Claim 14
Dependent Claim 49 words
A diffraction grating which comprises a plate, and means forming a plurality of grooves on said plate in a predetermined pattern so as to produce a divided wavelength scale when illuminated by a reference source of radiation, said predetermined pattern including grooves with a periodic variation in groove characteristics.
Claim 15
Dependent Claim 49 words
A diffraction grating which comprises a plate, and means forming a plurality of grooves on said plate in a predetermined pattern so as to produce a divided wavelength scale when illuminated by a reference source of radiation, said predetermined pattern including grooves with a periodic variation in groove characteristics.
Claim 16
Dependent Claim 19 words
A diffraction grating according to claim 12 wherein said variation constitutes a variation in groove length at decimal intervals.

References Cited (Backward Citations)

US3171882A Cited
US3359850A Cited
US3523734A Cited
US3653765A Cited
US3791737A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1983-03-04 1983-09-03 1984-03-04 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1987-03-04 1987-09-03 1988-03-04 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1991-03-04 1991-09-03 1992-03-04 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag