Field effect transistor having an extremely short channel length

Claim 2

Field effect transistor having a short channel length, comprising a doped semiconductor layer of a first conductivity type provided with doped source and drain zones of the opposite conductivity type inserted on the surface side of said substrate, a first gate electrode separated from the semiconductor surface by a first insulating layer, said doped semiconductor layer having a surface-side counter zone doping extending over the entire semiconductor zone between said source and said drain zones with the exception of a narrow strip-like semiconductor zone which directly adjoins said source zone, said strip-like semiconductor zone and at least an adjoining part of the surface-side counter-doped semiconductor zone being covered by a first gate electrode, a second insulating layer on said first gate electrode and on the drain side edge face of said first gate electrode, a coating on said second insulating layer which also covers that portion of said first insulating layer not covered by said first gate electrode, the source-side edge of said coating determining the drain side boundary of said strip-like semiconductor zone, the source-side edge of said first gate electrode determining the source-side boundary of said strip-like semiconductor zone, and said first gate electrode being provided with a control voltage terminal.

Claim 3

Field effect transistor as claimed in claim 1, in which said coating is electrically conductive and in which a terminal thereto provided for connection to a bias voltage source.

Claim 4

Field effect transistor as claimed in claim 2, in which said first gate electrode and said electrically conductive coating consists of strongly doped polysilicon.

Claim 5

Field effect transistor as claimed in claim 2, in which said first gate electrode or said electrically conductive coating consists of strongly doped polysilicon.

Claim 6

Field effect transistor as claimed in claim 2, in which said first gate electrode and said electrically conductive coating consists of strongly doped semiconductor material.

Claim 7

Field effect transistor as claimed in claim 2, in which said first gate electrode or said electrically conductive coating consists of strongly doped semiconductor material.

Claim 8

Field effect transistor as claimed in claim 2, in which said first gate electrode and said electrically conductive coating consists of a metallic coating composed of aluminum.

Claim 9

Field effect transistor as claimed in claim 1, in which said coating serves merely as implantation mask and that said drain zone extends to beneath said drain-side edge of said first gate electrode.

Claim 10

Field effect transistor as claimed in claim 1, in which said counter doping is such that the conductivity type of said semiconductor layer reverses on the surface side.

Claim 11

Field effect transistor as claimed in claim 6, in which said narrow strip-like semiconductor zone has a higher surface-side doping than the remaining part of said semiconductor layer.

Claim 12

Process for the production of a field effect transistor as claimed in claim 1, in which said doped semiconductor layer is first provided with a surface-side counter doping, that following the application of said insulating layer which covers the semiconductor layer said first gate electrode is applied above said insulating layer and its outline is formed, that following the application of a second insulating layer which covers said gate electrode, an electrically conductive coating is applied above said second insulating layer and its outline is formed, that the drain-side outline of said coating is established to be such that it determines the boundary of said drain zone, that in the region of said narrow strip-like semiconductor zone and said source zone a first ion implantation is carried out as a result of which the surface-side counter doping is selectively cancelled, the ion acceleration being selected to be such that all those parts of said semiconductor layer which are not simultaneously covered by said first gate electrode and said electrically conductive coating are subjected on the surface side to implanted ions, and that a second ion implantation is carried out approximately in said source and drain region, as a result of which the oppositely doped source and drain zones are produced, ion acceleration being selected to be such that only those parts of said semiconductor layer being covered neither by said first gate electrode nor by said electrically conductive coating are subjected on the surface side to implanted ions.

Claim 13

Process for the production of a field effect transistor as claimed in claim 8, in which said doped semiconductor layer is first provided with a surface counter doping, that following the application of a first insulating layer which covers said semiconductor layer said first gate electrode being applied above said first insulating layer and its outline is formed, that following the application of a second insulating layer which covers said first gate electrode, a coating is applied above said second insulating layer and its outline is formed, that in the region of said narrow, said strip-like semiconductor zone and said source zone a first ion implantation is carried out as a result of which the surface-side counter doping is selectively cancelled, where the ion acceleration is selected to be such that all those parts of said semiconductor layer not covered simultaneously by said first gate electrode and said coating are subjected on the surface side to implanted ions, that at least those parts of said coating which project beyond said first gate electrode on the drain side are removed, and that a second ion implantation is carried out approximately in one region of said source and said drain, as a result of which said oppositely doped source and drain zones are produced, where the ion acceleration is selected to be such that those parts of said semiconductor layer not covered by said first gate electrode are subjected on the surface side to implanted ions.