High-temperature microscope

Claim 2

A high-temperature microscope comprising: (a) a vacuum tank consisting of a sealed chamber having an observation window; (b) an exhauster to evacuate said tank; (c) an electron gun to emit electron beams to heat a specimen, said gun being located in said tank; (d) electron beam control means for regulating the radiation intensity and diameter of said electron beams emitted by said electron gun; (e) specimen holder means for holding said specimen such that a first side of said specimen faces the beam radiation direction, while a second side of said specimen faces said observation window; (f) inert gas inlet means to introduce inert gas and form an inert gas curtain between said specimen and said observation window; (g) illumination means to illuminate the observed area of said specimen with beams containing short wave components of a first band and no long wave components of a second band, said first band being located in the visible range in which heat radiation beams have low brightness, and said second band including heat radiation beams and being separate from said first band; (h) an observation system and a photographic system including means for introducing therein only components of said first band in beams reflected from said observed area of said specimen; and (i) a temperature-measuring system operatively connected to said electron beam control means and including means for introducing therein only components of said second band in beams radiated from said observed area of said specimen.

Claim 3

A high-temperature microscope as claimed in claim 1, wherein said electron gun includes a cathode, a wehnelt and an anode.

Claim 4

A high-temperature microscope as claimed in claim 1, wherein said electron gun includes means for emitting beams having a radiation distribution which is sparse at the center of the beam and dense at the fringe of the beam.

Claim 5

A high-temperature microscope as claimed in claim 1, further comprising: means for supplying the temperature detected by said temperature-measuring system to said electron beam control means; means for defining a preset specimen heating temperature; means for adjusting the radiation intensity of beams emitted by said electron gun such that, upon a comparison between said temperature detected by said temperaturemeasuring system and said preset specimen heating temperature, said detected temperature is adjusted to agree with said preset temperature; means for focusing said electron beams and means for deflecting said electron beams, said focusing and deflecting means being disposed along the path of said electron beams.

Claim 6

A high-temperature microscope as claimed in claim 1, wherein said specimen holder means comprises a specimen-hold tube mounted for movement into and out of said vacuum tank without disturbing the vacuum therein, a specimen-hold mechanism formed at the forward portion of said specimen-hold tube, and a specimen dish detachable mounted on said specimen-hold mechanism, said dish having a partial opening in the bottom thereof.

Claim 7

A high-temperature microscope as claimed in claim 5, wherein said inert gas inlet comprises a nozzle extending between said observation window and said specimen-hold tube.

Claim 8

A high-temperature microscope as claimed in claim 1, wherein said first band is in the visible range and said second band is in the infrared range.

Claim 9

A high-temperature microscope as claimed in claim 7, wherein said illumination means comprises a xenon lamp light source, an infrared absorbing filter to filter the components of said first band from the beams of said xenon lamp and absorb the components of said second band, and a first beam splitter to reflect the beams from said filter in the specimen observing direction and transmit the beams from the observed area of said specimen; said observation system comprises an objective lens located between said first beam splitter and said specimen, a second beam splitter located in the direction of the beams from said specimen which have passed through said objective lens passing through said first beam splitter, a first bandpass filter located in the reflecting direction of said second beam splitter and transmitting only the components of said first band, an eyepiece and said first beam splitter; said photographic system comprises a dichroic mirror located in the direction of the beams from said first beam splitter passing through said second beam splitter for the purpose of transmitting only infrared components and reflecting other components, a second bandpass filter located in the reflecting direction of said dichroic mirror for the purpose of transmitting only the components of said first band, a third beam splitter located in the transmitting direction of said second bandpass filter for the purpose of reflecting a part of beams transmitted thereby and of passing the remainder of such beams, an exposure meter located in the reflecting direction of said third beam splitter, a photo-lens located in the transmitting direction of said third beam splitter, said objective lens, said first beam splitter and said second beam splitter; and said temperature-measuring system comprises a full-reflecting mirror located in the direction of the beams from said second beam splitter passing through said dichroic mirror, a focusing lens located in the reflecting direction of said full-reflecting mirror, an infrared radiation pyrometer exclusively responsive to the components of said second band, said objective lens, said first beam splitter, said second beam splitter and said dichroic mirror.

Claim 10

A high-temperature microscope as claimed in claim 1, wherein said first band has a wavelength in the range of 500-540 nm, and said second band has a wavelength in the range of 1800-2500 nm.