Semiconductor device having oxygen doped polycrystalline passivation layer

Claim 1

An MOS inverter including an N-channel MOS-FET and a P-channel MOS-FET which comprises a monocrystalline silicon semiconductor substrate of N-type impurity having a planar face, a P-type island formed in said planar face, first and second N+ type laterally spaced regions formed in the planar face of said P-type island, first and second P+ type regions formed in the planar face of said substrate laterally spaced from said N+ type regions, a third P+ type region in said planar face of said substrate extending down to the PN junction between said P-type region and said N-type substrate which lies near the outer side edge of the substrate; a third N+ type region extending down from the planar face of said substrate into contact with said substrate, an oxygen doped polycrystalline semiconductor layer interfaced with the planar face of said substrate including said P+ and N+ regions, the oxygen content of said polycrystalline layer being between 2 and 45 atomic percent, the thickness of said polycrystalline layer over the substrate region lying between said first and second P+ regions and the thickness of said polycrystalline layer over the region of said first P-type region lying between said first and second N+ regions being substantially thinner than that lying over the remaining portions of the planar face, a layer of an insulating semiconductor material overlying the thicker portions of said polycrystalline layer, and in two regions in contact with said P-type island and said N-type substrate, a pair of gate electrodes extending down into complete surface contact with said two regions of insulating material, said gate electrodes being externally connected together, a source electrode extending through said insulating layer and said polycrystalline layer into contact with said first N+ region and said third P+ region, a drain electrode extending through said insulating layer and said polycrystalline layer into contact with said second P+ region and said third N+ region, a single contact extending through said insulating layers and said polycrystalline layers at two places into contact with said second N+ region and said first P+ region, the density of the surface states of the interface between said polycrystalline layer and said substrate being less than 10 10 states/(cm 2 .eV) in the center of the forbidden band, the electrical property of said layer reducing the influence of an electrical field.