US4170490A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Process for thermal gradient zone melting utilizing a beveled wafer edge
Assignee: General Electric Co
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Filing: 1978-12-07
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Granted: 1979-10-09
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Expires: 1998-12-07
Abstract
Abstract When a body of semiconductor material is to be processed by thermal gradient zone melting, the outer peripheral side surface of the body is beveled to form an included angle α with the bottom surface of the body. The measure of the angle α is such that the radiant heat impinging on the beveled side peripheral surface is equal to the radiant heat emitted by the beveled side peripheral surface of the body.
Inventors
- 👤 Thomas R. Anthony
- 👤 Harvey E. Cline
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 20:15
CPC Classifications
C; C30; C30B; C30B13/00; C30B13/02; H; H10; H10P; H10P95/00; H10P95/50
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
347 words
In an improved method for processing semiconductor wafers by thermal gradient zone melting comprising the steps of a. providing a radiant heat source having a lateral dimension L; b. selecting a body of single crystal semiconductor material so that the body has a first type conductivity, a selected level of resistivity, an outer side peripheral surface, two major opposed substantially parallel surfaces which are the top and bottom surfaces thereof, and at least one major surface having a preferred planar crystal structure orientation which is one selected from the group consisting of (100), (110) and (111), and a vertical axis of the body being substantially aligned at a predetermined angle with a first axis of the crystal structure; c. the surface having the preferred planar crystal structure orientation to accommodate one or more physical configurations of a layer of metal thereon; d. depositing a layer of metal on the selected surface of the body of semiconductor material; e. disposing the body a predetermined distance d from the radiant heat source; f. heating the body and the metal deposited to a temperature sufficient to form a melt of metal-rich material on the surface of the body; g. establishing a temperature gradient along substantially the vertical axis of the body and the first axis of the crystal structure, and h. migrating the metal-rich melt through the body along the first axis of the crystal structure to divide the body into a plurality of regions of first type conductivity and to form at least one array of regions of recrystallized material of the body having solid solubility of the vapor deposited metal therein, the metal including at least one dopant impurity material therein to impart a second and opposite type conductivity and a selected level of resistivity thereto, the improvement consisting of beveling the outer side peripheral surface at a predetermined included angle α with the bottom surface of the body, in order that the radiant heat impinging on the beveled side peripheral surface is equal to the radiant heat emitted by the beveled side peripheral surface of the body.
Claim 2
Dependent Claim
347 words
In an improved method for processing semiconductor wafers by thermal gradient zone melting comprising the steps of a. providing a radiant heat source having a lateral dimension L; b. selecting a body of single crystal semiconductor material so that the body has a first type conductivity, a selected level of resistivity, an outer side peripheral surface, two major opposed substantially parallel surfaces which are the top and bottom surfaces thereof, and at least one major surface having a preferred planar crystal structure orientation which is one selected from the group consisting of (100), (110) and (111), and a vertical axis of the body being substantially aligned at a predetermined angle with a first axis of the crystal structure; c. the surface having the preferred planar crystal structure orientation to accommodate one or more physical configurations of a layer of metal thereon; d. depositing a layer of metal on the selected surface of the body of semiconductor material; e. disposing the body a predetermined distance d from the radiant heat source; f. heating the body and the metal deposited to a temperature sufficient to form a melt of metal-rich material on the surface of the body; g. establishing a temperature gradient along substantially the vertical axis of the body and the first axis of the crystal structure, and h. migrating the metal-rich melt through the body along the first axis of the crystal structure to divide the body into a plurality of regions of first type conductivity and to form at least one array of regions of recrystallized material of the body having solid solubility of the vapor deposited metal therein, the metal including at least one dopant impurity material therein to impart a second and opposite type conductivity and a selected level of resistivity thereto, the improvement consisting of beveling the outer side peripheral surface at a predetermined included angle α with the bottom surface of the body, in order that the radiant heat impinging on the beveled side peripheral surface is equal to the radiant heat emitted by the beveled side peripheral surface of the body.
Claim 3
Dependent Claim
41 words
The method of claim 1 wherein the lateral dimension L of the radiant heat source is less then twenty times the diameter of the body of semiconductor material and/or the predetermined distance d between the radiant heat source and the body.
Claim 4
Dependent Claim
16 words
The method of claim 2 wherein the angle α is expressed by the following formula: ##EQU5##
Claim 5
Dependent Claim
23 words
The method of claim 1 wherein a transparent sheet of refractory material is placed between the radiant heat source and the semiconductor body.
Claim 6
Dependent Claim
27 words
The method of claim 4 wherein the bevel angle α is equal to the critical angle of total internal reflection for the material comprising the transparent sheet.
Claim 7
Dependent Claim
14 words
The method of claim 5 wherein the material comprising the transparent sheet is quartz.
Claim 8
Dependent Claim
14 words
The method of claim 6 wherein the bevel angle α is forty-one degrees±3 degrees.
Claim 9
Dependent Claim
27 words
The method of claim 7 wherein the finish of the beveled surface of the semiconductor wafer is less than the wavelength of the radiation impinging upon it.
Claim 10
Dependent Claim
17 words
The method of either claim 3 or 8 wherein the material of the semiconductor body is silicon.
References Cited (Backward Citations)
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1982-10-08 | 1983-04-09 | 1983-10-09 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1986-10-08 | 1987-04-09 | 1987-10-09 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1990-10-08 | 1991-04-09 | 1991-10-09 | $7700.00 | Window Closed / Lapsed |