US4169369A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and thin film semiconductor sensor for detecting NOx
Assignee: Motors Liquidation Co
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Filing: 1978-07-24
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Granted: 1979-10-02
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Expires: 1998-07-24
Abstract
Abstract The concentration of NO x in a gaseous mixture is measured using a solid state sensor comprising a surface thin film of semiconductive material. In a preferred embodiment, the thin film semiconductor comprises tin oxide having an oxygen to tin atomic ratio of between 1.5 and 1.95, preferably between 1.8 and 1.9, and is formed by reactive sputtering from a tin or tin oxide target in an argon-oxygen atmosphere. The electrical resistance of the tin oxide thin film is highly sensitive to NO x species, but is essentially unaffected by the presence of other common gases such as CO, H 2 , O 2 , SO 2 , NH 3 and hydrocarbons. Water vapor present in the mixture has a small effect upon the resistance of the film. The thin film tin oxide sensor may be used to measure NO x in air and, in one particularly advantageous aspect of this invention, is employed to measure NO x emissions in automotive exhaust gas.
Inventors
- 👤 Shih-Chia Chang
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 12:12
CPC Classifications
G; G01; G01N; G01N27/00; G01N27/02; G01N27/04; G01N27/12; H; H01; H01C; H01C17/00; H01C17/06; H01C17/075; H01C17/12
Claims Analysis
Total Claims: 18
Claim 1
Independent Claim
79 words
A method for detecting the presence of NO x species contained in a gaseous mixture comprising measuring the electrical resistance of a thin film semiconductor exposed to said mixture, said thin film semiconductor comprising polycrystalline tin oxide having an oxygen to tin atomic ratio between 1.5 and 1.95, said film having a known resistance to NO x free gas environment, a substantial increase in film resistance over said known value indicating the presence of NO x in the mixture.
Claim 2
Independent Claim
79 words
A method for detecting the presence of NO x species contained in a gaseous mixture comprising measuring the electrical resistance of a thin film semiconductor exposed to said mixture, said thin film semiconductor comprising polycrystalline tin oxide having an oxygen to tin atomic ratio between 1.5 and 1.95, said film having a known resistance to NO x free gas environment, a substantial increase in film resistance over said known value indicating the presence of NO x in the mixture.
Claim 3
Independent Claim
80 words
A method of analyzing a gaseous mixture for the concentration of NO x species comprising contacting said gaseous mixture with a thin film comprising polycrystalline tin oxide having an oxygen to tin atomic ratio between 1.5 and 1.95, maintaining the temperature of the film between 150° and 300° C., and measuring the electrical resistance of said thin film while exposed to said gaseous mixture, whereby the resistance measurement provides a measure of the NO x concentration of the gaseous mixture.
Claim 4
Independent Claim
80 words
A method of analyzing a gaseous mixture for the concentration of NO x species comprising contacting said gaseous mixture with a thin film comprising polycrystalline tin oxide having an oxygen to tin atomic ratio between 1.5 and 1.95, maintaining the temperature of the film between 150° and 300° C., and measuring the electrical resistance of said thin film while exposed to said gaseous mixture, whereby the resistance measurement provides a measure of the NO x concentration of the gaseous mixture.
Claim 5
Independent Claim
82 words
A method of measuring the concentration of NO x species contained in a gaseous mixture comprising contacting said gaseous mixture with a thin film comprising polycrystalline tin oxide having an oxygen to tin atomic ratio between 1.8 and 1.9, maintaining the temperature of the detecting element between 150° and 300° C., and measuring the electrical resistance of said thin film while exposed to said gaseous mixture, whereby the resistance measurement provides a measure of the NO x concentration of the gaseous mixture.
Claim 6
Independent Claim
82 words
A method of measuring the concentration of NO x species contained in a gaseous mixture comprising contacting said gaseous mixture with a thin film comprising polycrystalline tin oxide having an oxygen to tin atomic ratio between 1.8 and 1.9, maintaining the temperature of the detecting element between 150° and 300° C., and measuring the electrical resistance of said thin film while exposed to said gaseous mixture, whereby the resistance measurement provides a measure of the NO x concentration of the gaseous mixture.
Claim 7
Independent Claim
136 words
A method of measuring the concentration of NO x species contained in a gaseous mixture, said NO x species comprising at least one compound selected from the group consisting of NO and NO 2 , said method comprising measuring the electrical resistance of a semiconductor thin film exposed to said mixture and maintained at a temperature between 150° and 300° C., said semiconductor thin film consisting essentially of a polycrystalline tin oxide material having an oxygen to tin atomic ratio of between 1.5 and 1.95 and being further characterized as being formed by reactive sputtering in a low pressure atmosphere comprising argon and oxygen using a target selected from the group consisting of tin and oxides of tin, the electrical resistance of said film being a measure of the concentration of NO x in the mixture.
Claim 8
Independent Claim
136 words
A method of measuring the concentration of NO x species contained in a gaseous mixture, said NO x species comprising at least one compound selected from the group consisting of NO and NO 2 , said method comprising measuring the electrical resistance of a semiconductor thin film exposed to said mixture and maintained at a temperature between 150° and 300° C., said semiconductor thin film consisting essentially of a polycrystalline tin oxide material having an oxygen to tin atomic ratio of between 1.5 and 1.95 and being further characterized as being formed by reactive sputtering in a low pressure atmosphere comprising argon and oxygen using a target selected from the group consisting of tin and oxides of tin, the electrical resistance of said film being a measure of the concentration of NO x in the mixture.
Claim 9
Independent Claim
127 words
A method of measuring the concentration of NO x species contained in a gaseous mixture, said NO x species being selected from the group consisting of NO and NO 2 , said method comprising measuring the electrical resistance of a semiconductor thin film exposed to said mixture and maintained at a temperature between 150° and 300° C., said semiconductor thin film consisting essentially of a polycrystalline tin oxide material having an oxygen to tin atomic ratio of between 1.8 and 1.9 and formed by reactive sputtering in a low pressure atmosphere comprising argon and oxygen using a target selected from the group consisting of tin and oxides of tin, the electrical resistance of said film being a measure of the concentration of NO x in the mixture.
Claim 10
Independent Claim
127 words
A method of measuring the concentration of NO x species contained in a gaseous mixture, said NO x species being selected from the group consisting of NO and NO 2 , said method comprising measuring the electrical resistance of a semiconductor thin film exposed to said mixture and maintained at a temperature between 150° and 300° C., said semiconductor thin film consisting essentially of a polycrystalline tin oxide material having an oxygen to tin atomic ratio of between 1.8 and 1.9 and formed by reactive sputtering in a low pressure atmosphere comprising argon and oxygen using a target selected from the group consisting of tin and oxides of tin, the electrical resistance of said film being a measure of the concentration of NO x in the mixture.
Claim 11
Independent Claim
97 words
A device for detecting the presence of NO x species contained in a gaseous mixture, said device comprising an electrically insulating substrate, a NO x -sensitive thin film on a surface of said substrate, said film comprising polycrystalline tin oxide semiconductor having an oxygen to tin atomic ratio between 1.5 and 1.95, heating means for maintaining the film-substrate assembly at a temperature of between 150° and 300° C., and means for measuring the electrical resistance of the NO x -sensitive thin film, the resistance being a measure of the concentration of NO x in the gas mixture.
Claim 12
Independent Claim
97 words
A device for detecting the presence of NO x species contained in a gaseous mixture, said device comprising an electrically insulating substrate, a NO x -sensitive thin film on a surface of said substrate, said film comprising polycrystalline tin oxide semiconductor having an oxygen to tin atomic ratio between 1.5 and 1.95, heating means for maintaining the film-substrate assembly at a temperature of between 150° and 300° C., and means for measuring the electrical resistance of the NO x -sensitive thin film, the resistance being a measure of the concentration of NO x in the gas mixture.
Claim 13
Independent Claim
97 words
A device for detecting the presence of NO x species contained in a gaseous mixture, said device comprising an electrically insulating substrate, a NO x -sensitive thin film on a surface of said substrate, said film comprising polycrystalline tin oxide semiconductor having an oxygen to tin atomic ratio between 1.8 and 1.9, heating means for maintaining the film-substrate assembly at a temperature of between 150° and 300° C., and means for measuring the electrical resistance of the NO x -sensitive thin film, the resistance being a measure of the concentration of NO x in the gas mixture.
Claim 14
Independent Claim
97 words
A device for detecting the presence of NO x species contained in a gaseous mixture, said device comprising an electrically insulating substrate, a NO x -sensitive thin film on a surface of said substrate, said film comprising polycrystalline tin oxide semiconductor having an oxygen to tin atomic ratio between 1.8 and 1.9, heating means for maintaining the film-substrate assembly at a temperature of between 150° and 300° C., and means for measuring the electrical resistance of the NO x -sensitive thin film, the resistance being a measure of the concentration of NO x in the gas mixture.
Claim 15
Independent Claim
130 words
A device for measuring the concentration of NO x species contained in a gaseous mixture, said device comprising an electrically insulating substrate, a NO x -sensitive thin film on a surface of said substrate, said film consisting essentially of polycrystalline tin oxide having an oxygen to tin atomic ratio between 1.5 and 1.95, said film being further characterized as having been deposited by reactive sputtering in an atmosphere containing argon and oxygen from a target selected from the group consisting of tin and oxides of tin, heating means for maintaining the film-substrate assembly at a temperature of between 150° and 300° C., and means for measuring the resistance of the NO x -sensitive thin film, the resistance being a measure of the concentration of NO x in the gas mixture.
Claim 16
Independent Claim
130 words
A device for measuring the concentration of NO x species contained in a gaseous mixture, said device comprising an electrically insulating substrate, a NO x -sensitive thin film on a surface of said substrate, said film consisting essentially of polycrystalline tin oxide having an oxygen to tin atomic ratio between 1.5 and 1.95, said film being further characterized as having been deposited by reactive sputtering in an atmosphere containing argon and oxygen from a target selected from the group consisting of tin and oxides of tin, heating means for maintaining the film-substrate assembly at a temperature of between 150° and 300° C., and means for measuring the resistance of the NO x -sensitive thin film, the resistance being a measure of the concentration of NO x in the gas mixture.
Claim 17
Independent Claim
131 words
A device for measuring the concentration of NO x species contained in a gaseous mixture, said device comprising an electrically insulating substrate, a NO x -sensitive thin film on the surface of said substrate, said film consisting essentially of polycrystalline tin oxide semiconductor having an oxygen to tin atomic ratio between 1.8 and 1.9, said film being further characterized as having been deposited by reactive sputtering in an atmosphere containing argon and oxygen from a target selected from the group consisting of tin and oxides of tin, heating means for maintaining the film-substrate assembly at a temperature of between 150° and 300° C., and means for measuring the resistance of the NO x sensitive thin film, the resistance being a measure of the concentration of NO x in the gas mixture.
Claim 18
Independent Claim
131 words
A device for measuring the concentration of NO x species contained in a gaseous mixture, said device comprising an electrically insulating substrate, a NO x -sensitive thin film on the surface of said substrate, said film consisting essentially of polycrystalline tin oxide semiconductor having an oxygen to tin atomic ratio between 1.8 and 1.9, said film being further characterized as having been deposited by reactive sputtering in an atmosphere containing argon and oxygen from a target selected from the group consisting of tin and oxides of tin, heating means for maintaining the film-substrate assembly at a temperature of between 150° and 300° C., and means for measuring the resistance of the NO x sensitive thin film, the resistance being a measure of the concentration of NO x in the gas mixture.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1982-10-01 | 1983-04-02 | 1983-10-02 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1986-10-01 | 1987-04-02 | 1987-10-02 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1990-10-01 | 1991-04-02 | 1991-10-02 | $7700.00 | Window Closed / Lapsed |