US4168990A
Expired / Lapsed
US
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Hot implantation at 1100°-1300° C. for forming non-gaussian impurity profile
Assignee: Infineon Technologies Americas Corp
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Filing: 1978-11-13
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Granted: 1979-09-25
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Expires: 1998-11-13
Abstract
Abstract A process is described for the particular control of process variables to produce any predetermined impurity concentration within a semiconductor body according to the relation ##EQU1## WHERE ∂M/∂T IS THE FLUX OF IMPURITIES AT ANY TIME T, X IS THE DEPTH INTO THE SEMICONDUCTOR BODY, AND D(t) is the difficulty of the impurity as a function of time.
Inventors
- 👤 Camille A. Lenie
- 👤 Vladimir Rodov
- 👤 Boris L. Hikin
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 13:22
CPC Classifications
H; H10; H10P; H10P32/00; H10P30/00; H10P30/20; H10P30/202; H10P30/204; H10P30/21; H10P95/00; H10P95/90
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
44 words
The process of forming a given non-Gaussian impurity distribution within a semiconductor body comprising the steps of applying an impurity ion beam to said semiconductor body, and simultaneously applying a relatively high diffusion temperature of about 1100° to 1300° C. to said semiconductor body.
Claim 2
Dependent Claim
44 words
The process of forming a given non-Gaussian impurity distribution within a semiconductor body comprising the steps of applying an impurity ion beam to said semiconductor body, and simultaneously applying a relatively high diffusion temperature of about 1100° to 1300° C. to said semiconductor body.
Claim 3
Dependent Claim
26 words
The process of claim 1, wherein a first beam of acceptor ions and a second beam of donor ions are simultaneously applied to said semiconductor body.
Claim 4
Dependent Claim
99 words
The process of claim 1, wherein said process comprises varying, during said process, the flux of impurity ions into the surface of said semiconductor body at least approximately according to the relation: ##EQU41## where I(t)=impurity ion flux, f 1 (x)=the closest approximate impurity distribution shape to that required within a required accuracy; x=the distance from the surface of the semiconductor body into any point within the body; t=time t*=the time at which the process is completed and the desired impurity distribution is achieved; ##EQU42## ΔE=activation energy; T=absolute temperature; and terminating said process at the end of said time t*.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1982-09-24 | 1983-03-26 | 1983-09-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1986-09-24 | 1987-03-26 | 1987-09-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1990-09-24 | 1991-03-26 | 1991-09-25 | $7700.00 | Window Closed / Lapsed |