Method and apparatus for regulating evaporating rate and layer build up in the production of thin layers

Claim 2

Apparatus for regulating the evaporation rate and layer buildup in the production of optically thin layers comprising, in combination, a vacuum chamber; evaporator means in said vacuum chamber; substrate holding means in said chamber; means for applying electric power to said evaporator means; regulating means for regulating said power applied to said evaporator means; means for measuring continuously the optical characteristics of the layer deposited on said substrate and including amplifier means, and single differentiating means for differentiating the signal corresponding to the optical characteristics of the layer during buildup; signal generator means for providing a sine-shaped signal reproducing the time rate of change of the optical characteristics of the layer during buildup under predetermined optimum conditions and being independent from the optical characteristics of the layer being deposited; comparator means connected to the output of said differentiating means and the output of said signal generator means, the output of said comparator means being connected to said means for regulating said electric power to increase the evaporation rate when layer buildup lags and to reduce the evaporation rate when layer buildup is too rapid.

Claim 3

The apparatus as defined in claim 1 wherein said signal generator means generates a switching pulse when evaporation has been completed for releasing said evaporator means.

Claim 4

The apparatus as defined in claim 2 including aperture drive means for releasing said evaporator means.

Claim 5

The apparatus as defined in claim 3 including diaphragm means actuated by said aperture drive means.

Claim 6

Apparatus for regulating the evaporation rate and layer buildup in the production of optically thin layers comprising, in combination, a vacuum chamber; evaporator means in said vacuum chamber; substrate holding means in said chamber; means for applying electric power to said evaporator means; regulating means for regulating said power applied to said evaporator means; means for measuring continuously the optical characteristics of the layer deposited on said substrate and including amplifier means, and means for differentiating the signal corresponding to the optical characteristics of the layer during buildup, signal generator means for providing a sine-shaped signal reproducing the time rate of change of the optical characteristics of the layer during buildup under predetermined optimum conditions and being independent from the optical characteristics of the layer being deposited; comparator means connected to the output of said differentiating means and the output of said signal generator means, the output of said comparator means being connected to said means for regulating said electric power to increase the evaporation rate when layer buildup lags and to reduce the evaporation rate when layer buildup is too rapid; said regulating means for regulating the evaporation rate including a measuring device for measuring the electric power input of the evaporation means, said power regulating means having control means, the output of said measuring device being connected to said control means, the output of said comparator means for comparing the signal produced by the optical characteristics of the layer with the signal produced by the signal generator being additionally connected to the output of said control means.

Claim 7

Apparatus for regulating the evaporation rate and layer buildup in the production of optically thin layers comprising, in combination, a vacuum chamber; evaporator means in said vacuum chamber; substrate holding means in said chamber; means for applying electric power to said evaporator means; regulating means for regulating said power applied to said evaporator means; means for measuring continuously the optical characteristics of the layer deposited on said substrate and including amplifier means, and means for differentiating the signal corresponding to the optical characteristics of the layer during buildup, signal generator means for providing a sine-shaped signal reproducing the time rate of change of the optical characteristics of the layer during buildup under predetermined optimum conditions and being independent from the optical characteristics of the layer being deposited; comparator means connected to the output of said differentiating means and the output of said signal generator means, the output of said comparator means being connected to said means for regulating said electric power to increase the evaporation rate when layer buildup lags and to reduce the evaporation rate when layer buildup is too rapid; said regulating means for regulating the evaporation rate including a measuring device for measuring the electric power input of the evaporation means, said power regulating means having control means, the output of said measuring device being connected to said control means, the output of said comparator means for comparing the signal produced by the optical characteristics of the layer with the signal produced by the signal generator being additionally connected to the output of said control means.

Claim 8

The apparatus as defined in claim 5, wherein said measuring device comprises means for converting electric power into electromagnetic radiation; and radiation receiver means for receiving said electromagnetic radiation.