US4137457A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of producing implanted areas in a substrate
Assignee: Siemens AG
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Filing: 1977-08-17
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Granted: 1979-01-30
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Expires: 1997-08-17
Abstract
Abstract Implanted areas are produced on a substrate by irradiating the surface of the substrate with two coherent high kinetic energy beams which are superimposed in relation to one another and spaced from the substrate surface in such a manner that maxima and/or minima of an interference pattern formed by the two particle streams are located on the substrate surface.
Inventors
- 👤 Eberhard Krimmel
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 18:50
CPC Classifications
H; H10; H10P; H10P30/00; H10P30/20; H10P30/21; C; C23; C23C; C23C14/00; C23C14/22; C23C14/48; H01; H01J; H01J37/00; H01J37/30; H01J37/317; H01J37/3171; H10P30/202; H10P30/204; Y; Y10; Y10S; Y10S148/00; Y10S148/061
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
90 words
A method of producing dopant material implanted areas in a semiconductor substrate, comprising: generating a main beam composed of relatively high kinetic energy dopant material ions; dividing said main beam into at least two coherent dopant material ion sub-beams which are superposed in relation to one another; and positioning said semiconductor substrate relative to said sub-beams so that said substrate is irradiated by said sub-beams and so that the maxima and/or minima of an interference pattern formed by said dopant ion sub-beams is located on a surface of said substrate.
Claim 2
Independent Claim
90 words
A method of producing dopant material implanted areas in a semiconductor substrate, comprising: generating a main beam composed of relatively high kinetic energy dopant material ions; dividing said main beam into at least two coherent dopant material ion sub-beams which are superposed in relation to one another; and positioning said semiconductor substrate relative to said sub-beams so that said substrate is irradiated by said sub-beams and so that the maxima and/or minima of an interference pattern formed by said dopant ion sub-beams is located on a surface of said substrate.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1982-01-29 | 1982-07-31 | 1983-01-30 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1986-01-29 | 1986-07-31 | 1987-01-30 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1990-01-29 | 1990-07-31 | 1991-01-30 | $7700.00 | Window Closed / Lapsed |