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US4124473A Expired / Lapsed US ⏱️ 0.0 years remaining

Fabrication of multi-level relief patterns in a substrate

Assignee: RCA Corp
•
Filing: 1977-06-17
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Granted: 1978-11-07
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Expires: 1997-06-17
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Abstract

Abstract Superposed multi-level diffraction gratings in photoresist can be etched into a substrate by using the photoresist as a masking pattern and by sputtering in a reactive fluoromethane plasma to a predetermined depth.

Inventors

  • 👤 Hans W. Lehmann
  • 👤 Roland W. Widmer

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 17:04
CPC Classifications
G; G02; G02B; G02B5/00; G02B5/18; G02B5/1842; G03; G03F; G03F7/00; G03F7/0035; G03F7/004; G03F7/022; G03F7/023; G03F7/26

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 182 words
In the method of making a multi-level straight walled square wave diffration grating having a periodicity of less than 5 microns on the surface of a substrate which comprises: coating said substrate with a photoresist, exposing said photoresist through a mask and developing said photoresist so as to provide a first surface relief pattern, etching said pattern into said substrate to a first depth corresponding to a predetermined primary color, recoating said etched substrate with photoresist, exposing said photoresist through a mask and developing said photoresist so as to provide a superposed second surface relief pattern, and etching said pattern into said substrate to a second depth corresponding to another predetermined primary color, the improvement which comprises carrying out said etching steps by sputter etching at a rate of about 200-400 angstroms per minute in the presence of a reactive gas at a pressure of from 2-20 millitorr, which gas has the formula CX n F 4-n wherein X is hydrogen or chlorine and n is an integer from 0-4 which forms volatile byproducts with the sputtered material and removing said byproducts.
Claim 2
Dependent Claim 182 words
In the method of making a multi-level straight walled square wave diffration grating having a periodicity of less than 5 microns on the surface of a substrate which comprises: coating said substrate with a photoresist, exposing said photoresist through a mask and developing said photoresist so as to provide a first surface relief pattern, etching said pattern into said substrate to a first depth corresponding to a predetermined primary color, recoating said etched substrate with photoresist, exposing said photoresist through a mask and developing said photoresist so as to provide a superposed second surface relief pattern, and etching said pattern into said substrate to a second depth corresponding to another predetermined primary color, the improvement which comprises carrying out said etching steps by sputter etching at a rate of about 200-400 angstroms per minute in the presence of a reactive gas at a pressure of from 2-20 millitorr, which gas has the formula CX n F 4-n wherein X is hydrogen or chlorine and n is an integer from 0-4 which forms volatile byproducts with the sputtered material and removing said byproducts.
Claim 3
Dependent Claim 22 words
A method according to claim 1 wherein the rate of etching is about the same for said photoresist and for said substrate.

References Cited (Backward Citations)

US3984301A Cited
US3971684A Cited
US3975252A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1981-11-06 1982-05-08 1982-11-07 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1985-11-06 1986-05-08 1986-11-07 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1989-11-06 1990-05-08 1990-11-07 $7700.00 Window Closed / Lapsed

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