Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
185 words
In a method for focusing the objective lens of a scanning transmission-type corpuscular-beam microscope in which the beam of the microscope is deflected by a deflection system excited in sawtooth fashion and generates a raster consisting of parallel lines on a specimen to be examined, said microscope including a beam radiation detector disposed behind the specimen along the beam path which generates an output signal which controls the brightness of a picture tube monitor operated synchronously with said raster, the improvement comprising the steps of, measuring, during the exposure of a specimen point, partial beam radiation intensities in a cone of the beam at two points disposed symmetrical with respect to the longitudinal axis of said beam cone by means of said detector, the effective input area of said detector being smaller than the cross-sectional area of said cone at the same height in said microscope, and adjusting the lens current of the objective lens of said microscope so that output signals generated by said detector are equal for both of said beam radiation measurements at said points thereby focusing said beam on said specimen.
Claim 2
Dependent Claim
185 words
In a method for focusing the objective lens of a scanning transmission-type corpuscular-beam microscope in which the beam of the microscope is deflected by a deflection system excited in sawtooth fashion and generates a raster consisting of parallel lines on a specimen to be examined, said microscope including a beam radiation detector disposed behind the specimen along the beam path which generates an output signal which controls the brightness of a picture tube monitor operated synchronously with said raster, the improvement comprising the steps of, measuring, during the exposure of a specimen point, partial beam radiation intensities in a cone of the beam at two points disposed symmetrical with respect to the longitudinal axis of said beam cone by means of said detector, the effective input area of said detector being smaller than the cross-sectional area of said cone at the same height in said microscope, and adjusting the lens current of the objective lens of said microscope so that output signals generated by said detector are equal for both of said beam radiation measurements at said points thereby focusing said beam on said specimen.
Claim 3
Dependent Claim
36 words
The method recited in claim 1, wherein said step of measuring comprises measuring said partial beam radiation intensities by a pair of beam radiation detectors disposed symmetrically with respect to the optical axis of said microscope.
Claim 4
Dependent Claim
97 words
The method recited in claim 1, wherein said step of measuring comprises measuring said partial beam radiation intensities by a beam radiation detector disposed in the optical axis of said microscope, and further comprising the step of alternately exciting said deflection system of said microscope in alternating current fashion so as to deflect the microscope beam in two opposite directions through two opposite and equal angles with respect to the optical axis of said microscope, said deflection system deflecting said beam at a deflection frequency which is high compared to the line frequency of said specimen raster.
Claim 5
Dependent Claim
31 words
The method recited in claim 3, further comprising the step of amplifying said output signals generated by said detector by a narrow-band amplifier tuned to the frequency of said deflection system.
Claim 6
Dependent Claim
54 words
The method recited in claim 3, further comprising the steps of superimposing an alternating current having a frequency which is low compared to said deflection frequency on said lens current, and comparing the phase differences of said alternating current and said deflection output signals to determine the direction of a required lens current change.
Claim 7
Dependent Claim
43 words
The method recited in claim 1, further comprising the step of rotating said deflection system in azimuth so that the lens current for correct focusing of said objective lens is the same for all azimuth directions for correcting astigmatism of said objective lens.
Claim 8
Independent Claim
245 words
An apparatus for automatically focusing the objective lens of a scanning transmission-type corpuscular-beam microscope including deflection means for deflecting the beam of said microscope and generating a raster consisting of parallel lines on a specimen to be examined, said apparatus comprising: beam radiation detector means, disposed behind a specimen to be examined in the microscope along the beam path, on the optical axis of said microscope for measuring partial beam radiation intensities of said beam; beam deflection means, disposed between said specimen and said radiation detector means; a wobble generator, coupled to said beam deflection means, for generating a square-wave output signal for deflecting a ray cone of said beam in two deflection directions disposed symmetrical with respect to the optical axis of said microscope, the frequency of said output signal being high compared to the line frequency of said specimen raster; means, coupled to said objective lens, for regulating the current of said objective lens so that the beam radiation intensities measured by said detector means are equal thereby focusing said beam on said specimen; a lens current wobble generator, coupled to said lens current regulating means, for superimposing an alternating current on said lens current; and a phase discriminator, coupled to said lens current wobble generator, said lens and said detector means, for comparing the phase between output signals generated by said lens current wobble generator and said detector means, said discriminator generating an output signal for controlling said lens current regulating means.
Claim 9
Independent Claim
245 words
An apparatus for automatically focusing the objective lens of a scanning transmission-type corpuscular-beam microscope including deflection means for deflecting the beam of said microscope and generating a raster consisting of parallel lines on a specimen to be examined, said apparatus comprising: beam radiation detector means, disposed behind a specimen to be examined in the microscope along the beam path, on the optical axis of said microscope for measuring partial beam radiation intensities of said beam; beam deflection means, disposed between said specimen and said radiation detector means; a wobble generator, coupled to said beam deflection means, for generating a square-wave output signal for deflecting a ray cone of said beam in two deflection directions disposed symmetrical with respect to the optical axis of said microscope, the frequency of said output signal being high compared to the line frequency of said specimen raster; means, coupled to said objective lens, for regulating the current of said objective lens so that the beam radiation intensities measured by said detector means are equal thereby focusing said beam on said specimen; a lens current wobble generator, coupled to said lens current regulating means, for superimposing an alternating current on said lens current; and a phase discriminator, coupled to said lens current wobble generator, said lens and said detector means, for comparing the phase between output signals generated by said lens current wobble generator and said detector means, said discriminator generating an output signal for controlling said lens current regulating means.
Claim 10
Dependent Claim
42 words
The apparatus recited in claim 7, further comprising means for rotating said deflection system in azimuth so that the lens current for correct focusing of said objective lens is the same for all azimuth directions, for correcting astigmatism of said objective lens.
Claim 11
Dependent Claim
23 words
The apparatus recited in claim 8, wherein said rotating means comprises a pair of magnetic deflection coils for electrically rotating said deflection system.