US4075037A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Tailoring of recovery charge in power diodes and thyristors by irradiation
Assignee: Westinghouse Electric Corp
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Filing: 1976-05-17
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Granted: 1978-02-21
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Expires: 1996-05-17
Abstract
Abstract The recovery charge of power diodes and thyristors is tailored and matched by irradiation through a major surface of the semiconductor body with a given radiation source, preferably of electron radiation, to a dosage corresponding to between about 1 × 10 12 and 8 × 10 12 electrons per centimeter square with 2 MeV electron radiation. Preferably, the recovery charge of each device of a group of a type of diode or thyristor is first measured, and the group divided into subgroups according to the measured recovery charge of each device. The devices of at least one subgroup is then irradiated with said given radiation source to dosages corresponding to between about 1 × 10 12 and 8 × 10 12 electrons per centimeter square with 2 MeV electron radiation, and the recovery charge of each irradiated device is again measured to determine the incremental change of recovery charge as a function of irradiation dosage. A recovery charge of another device of said type of diode or thyristor is then measured, and the device irradiated with said radiation source to a determined dosage corresponding to a desired incremental change in recovery charge to tailor the recovery charge of said device to a desired value.
Inventors
- 👤 Krishan S. Tarneja
- 👤 Joseph E. Johnson
- 👤 John Bartko
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 05:48
CPC Classifications
H; H10; H10D; H10D62/00; H10D62/50; H10D62/53; H10D8/00; H10P; H10P34/00; H10P34/40
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
76 words
A method of tailoring the recovery charge of a device of a type of diode or thyristor comprising the steps of: A. positioning a junction diode or thyristor semiconductor body with a major surface thereof to be exposed to a radiation source; B. thereafter irradiating said semiconductor body with the radiation source to a dosage between about 1 × 10 12 and 8 × 10 12 electrons/cm 2 to reduce the recovery charge of the device.
Claim 2
Independent Claim
76 words
A method of tailoring the recovery charge of a device of a type of diode or thyristor comprising the steps of: A. positioning a junction diode or thyristor semiconductor body with a major surface thereof to be exposed to a radiation source; B. thereafter irradiating said semiconductor body with the radiation source to a dosage between about 1 × 10 12 and 8 × 10 12 electrons/cm 2 to reduce the recovery charge of the device.
Claim 3
Dependent Claim
48 words
A method of tailoring the recovery charge of a device of a type of diode or thyristor as set forth in claim 1 wherein: the irradiation of step B is to a dosage corresponding to between 1 × 10 12 and 5 × 10 12 electrons/cm 2 .
Claim 4
Dependent Claim
33 words
A method of tailoring the recovery charge of a device of a type of diode or thyristor as set forth in claim 1 wherein: the radiation source of step B is electron radiation.
Claim 5
Dependent Claim
34 words
A method of tailoring the recovery charge of a device of a type of diode or thyristor as set forth in claim 3 wherein: the electron radiation has an energy greater than 1 MeV.
Claim 6
Dependent Claim
48 words
A method of tailoring the recovery charge of a device of a type of diode or thyristor as set forth in claim 4 wherein: the irradiation of step B is to a dosage corresponding to between 1 × 10 12 and 5 × 10 12 electrons/cm 2 .
Claim 7
Independent Claim
165 words
A method of tailoring the recovery charge of a device of a type of diode or thyristor comprising the steps of: A. measuring the recovery charge of each device of a group of a type of diode or thyristor and dividing said devices into subgroups according to the measured recovery charge of each device; B. irradiating devices of at least one subgroup with a given radiation source to dosages corresponding to between about 1 × 10 12 and 8 × 10 12 electrons/cm 2 with 2 MeV electron radiation; C. measuring the recovery charge of each irradiated device of each subgroup to determine the incremental change of recovery charge as a function of irradiation dosage; D. measuring the recovery charge of another device of said type of diode or thyristor; and E. thereafter irradiating said device with said radiation source to a determined dosage corresponding to a desired incremental change in recovery charge to tailor the recovery charge of said device to a desired value.
Claim 8
Independent Claim
165 words
A method of tailoring the recovery charge of a device of a type of diode or thyristor comprising the steps of: A. measuring the recovery charge of each device of a group of a type of diode or thyristor and dividing said devices into subgroups according to the measured recovery charge of each device; B. irradiating devices of at least one subgroup with a given radiation source to dosages corresponding to between about 1 × 10 12 and 8 × 10 12 electrons/cm 2 with 2 MeV electron radiation; C. measuring the recovery charge of each irradiated device of each subgroup to determine the incremental change of recovery charge as a function of irradiation dosage; D. measuring the recovery charge of another device of said type of diode or thyristor; and E. thereafter irradiating said device with said radiation source to a determined dosage corresponding to a desired incremental change in recovery charge to tailor the recovery charge of said device to a desired value.
Claim 9
Dependent Claim
48 words
A method of tailoring the recovery charge in a device of a type of diode or thyristor as set forth in claim 6 wherein: the irradiation of step B is to a dosage corresponding to between 1 × 10 12 and 5 × 10 12 electrons/cm 2 .
Claim 10
Dependent Claim
30 words
A method of tailoring the recovery charge of a device of a type of diode or thyristor as set forth in claim 6 wherein: the radiation source is electron radiation.
Claim 11
Dependent Claim
36 words
A method of tailoring the recovered charge of a device of a type of diode or thyristor as set forth in claim 6 wherein: the energy of the electron radiation source is greater than 1 MeV.
Claim 12
Dependent Claim
48 words
A method of tailoring the recovery charge of a device of a type of diode or thyristor as set forth in claim 9 wherein: the irradiation of step B is to a dosage corresponding to between 1 × 10 12 and 5 × 10 12 electrons/cm 2 .
References Cited (Backward Citations)
US3809582A
Cited
US3933527A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1981-02-20 | 1981-08-22 | 1982-02-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1985-02-20 | 1985-08-22 | 1986-02-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1989-02-20 | 1989-08-22 | 1990-02-21 | $7700.00 | Window Closed / Lapsed |