US4069121A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for producing microscopic passages in a semiconductor body for electron-multiplication applications
Assignee: Thales SA
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Filing: 1976-06-21
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Granted: 1978-01-17
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Expires: 1996-06-21
Abstract
Abstract A method for drilling microscopic passages in a semiconductor body. The semiconductor 1 is incorporated into the anode of an electrolysis installation, one of its faces being in contact with the electrolyte 11 and the other containing a hole injection system. The holes migrate in the electric field from one face to the other; at the latter, dissolution of the semiconductor face in the electrolyte takes place. Gradually, passages are bored through the semiconductor along the trajectories of the holes. In the example, the holes are created photoelectrically in the gaps 2 between the opaque parts 4 applied to the transparent anode contact 3.
Inventors
- 👤 Christian Baud
- 👤 Yvan Raverdy
- 👤 Henri Hougeot
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 22:17
CPC Classifications
C; C25; C25F; C25F3/00; C25F3/02; C25F3/14; C25F3/12; H; H01; H01J; H01J43/00; H01J43/04; H01J43/06; H01J43/18; H01J43/24
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
201 words
A method for drilling microscopic passages between two substantially parallel opposite faces of a semiconductor body, utilizing an electrolysis installation comprising: a cathode and an anode in contact with an electrolyte, and mounted between said cathode and said anode a direct voltage source for bringing said anode to a positive potential Vo with respect to said cathode, said method comprising the steps of: forming a semiconductor body with two substantially parallel opposite faces; providing one of said faces with means for creating at said face hole injector points separated from one another and with connection means causing said hole injector points to be in electrical contact with one another; immersing said semiconductor body in said electrolytic solution in such a manner that its other face, opposite said one face, is in contact with said electrolyte; energizing said connection means to the positive terminal of said source; said source being so dimensioned that the positive potential Vo is greater than that potential required to establish in said semiconductor an electric field extending from said one face at least up to a distance from that face in contact with the electrolyte, lesser than the diffusion length of said microscopic passages in said semiconductor.
Claim 2
Independent Claim
201 words
A method for drilling microscopic passages between two substantially parallel opposite faces of a semiconductor body, utilizing an electrolysis installation comprising: a cathode and an anode in contact with an electrolyte, and mounted between said cathode and said anode a direct voltage source for bringing said anode to a positive potential Vo with respect to said cathode, said method comprising the steps of: forming a semiconductor body with two substantially parallel opposite faces; providing one of said faces with means for creating at said face hole injector points separated from one another and with connection means causing said hole injector points to be in electrical contact with one another; immersing said semiconductor body in said electrolytic solution in such a manner that its other face, opposite said one face, is in contact with said electrolyte; energizing said connection means to the positive terminal of said source; said source being so dimensioned that the positive potential Vo is greater than that potential required to establish in said semiconductor an electric field extending from said one face at least up to a distance from that face in contact with the electrolyte, lesser than the diffusion length of said microscopic passages in said semiconductor.
Claim 3
Dependent Claim
66 words
A method as claimed in claim 1, wherein said semiconductor has photoelectric properties; said means for creating said hole injector points consist of an incident photon radiation striking said one face which is covered with a transparent, conductive electrode connected to said positive terminal, and of parts opaque to said radiation applied to said conductive electrode, and of separating windows which are transparent vis-a-vis said radiation.
Claim 4
Dependent Claim
47 words
A method as claimed in claim 1, wherein said hole injector points consist of ohmic contacts which are applied to said one face in contact with an electrically conductive electrode connected to said positive terminal, said ohmic contacts being separated from one another by electrically insulating parts.
Claim 5
Dependent Claim
36 words
A method as claimed in claim 1, wherein said semiconductor is n-type gallium arsenide with 10 12 free charge carriers per cubic centimeter at the most, and said electrolyte is a basic solution of potassium chromate.
Claim 6
Dependent Claim
35 words
A method as claimed in claim 4, wherein said semiconductor is a chip whose thickness between said two faces is of the order of 200 microns, and wherein said voltage Vo is around 20 volts.
References Cited (Backward Citations)
US3265599A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1981-01-16 | 1981-07-18 | 1982-01-17 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1985-01-16 | 1985-07-18 | 1986-01-17 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1989-01-16 | 1989-07-18 | 1990-01-17 | $7700.00 | Window Closed / Lapsed |