Dynamic single-transistor memory element for relatively permanent memories

Claim 2

Dynamic single-transistor memory element connected to a word line and a bit line comprising: a transistor having at least two terminals and a gate terminal, connected at one of said terminals with said bit line and at said gate terminal with said word line; a capacitor having at least two electrodes connected at one of said electrodes in series to one of said two terminals of said transistor; wherein said single-transistor memory element comprises a write line, said capacitor is a metal dielectric semiconductor capacitor, said dielectric comprises a pluraliy of selective activation states and said electrode which is not connected with said transistor is connected with said write line.

Claim 3

Dynamic single-transistor memory element connected to a word line and a bit line comprising: a transistor having at least two terminals and a gate terminal, connected at one of said terminals with said bit line and at said gate terminal with said word line; a capacitor having at least two electrodes connected at one of said electrodes in series to one of said two terminals of said transistor; wherein said single-transistor memory element comprises a write line, said capacitor is a metal dielectric semiconductor capacitor, said dielectric comprises a plurality of selective activation states and said electrode which is not connected with said transistor is connected with said write line; and said transistor comprises a MOS field-effect transistor.

Claim 4

Dynamic single-transistor memory element connected to a word line and a bit line comprising: a transistor having at least two terminals and a gate terminal, connected at one of said terminals with said bit line and at said gate terminal with said word line; a capacitor having at least two electrodes connected at one of said electrodes in series to one of said two terminals of said transistor; wherein said single-transistor memory element comprises a write line, said capacitor is a metal dielectric semiconductor capacitor, said dielectric comprises a plurality of selective activation states and said electrode which is not connected with said transistor is connected with said write line; and said transistor comprises a MOS field-effect transistor.

Claim 5

Dynamic single-transistor memory element connected to a word line and a bit line comprising: a transistor having at least two terminals and a gate terminal, connected at one of said terminals with said bit line and at said gate terminal with said word line; a capacitor having at least two electrodes connected at one of said electrodes in series to one of said two terminals of said transistor; wherein said single-transistor memory element comprises a write line, said capacitor is a metal dielectric semiconductor capacitor, said dielectric comprises a plurality of selective activation states and said electrode which is not connected with said transistor is connected with said write line; said transistor comprises a MOS field-effect transistor; and said dielectric of said capacitor comprises two insulator layers.

Claim 6

Dynamic single-transistor memory element connected to a word line and a bit line comprising: a transistor having at least two terminals and a gate terminal, connected at one of said terminals with said bit line and at said gate terminal with said word line; a capacitor having at least two electrodes connected at one of said electrodes in series to one of said two terminals of said transistor; wherein said single-transistor memory element comprises a write line, said capacitor is a metal dielectric semiconductor capacitor, said dielectric comprises a plurality of selective activation states and said electrode which is not connected with said transistor is connected with said write line; said transistor comprises a MOS field-effect transistor; and said dielectric of said capacitor comprises two insulator layers.

Claim 7

Dynamic single-transistor memory element connected to a word line and a bit line comprising: a transistor having at least two terminals and a gate terminal, connected at one of said terminals with said bit line and at said gate terminal with said word line; a capacitor having at least two electrodes connected at one of said electrodes in series to one of said two terminals of said transistor; wherein said single-transistor memory element comprises a write line, said capacitor is a metal dielectric semiconductor capacitor, said dielectric comprises a plurality of selective activation states and said electrode which is not connected with said transistor is connected with said write line; said transistor comprises a MOS field-effect transistor; and said capacitor is a MNOS capacitor having a dielectric comprising an SiO 2 layer and an Si 3 N 4 layer.

Claim 8

Dynamic single-transistor memory element connected to a word line and a bit line comprising: a transistor having at least two terminals and a gate terminal, connected at one of said terminals with said bit line and at said gate terminal with said word line; a capacitor having at least two electrodes connected at one of said electrodes in series to one of said two terminals of said transistor; wherein said single-transistor memory element comprises a write line, said capacitor is a metal dielectric semiconductor capacitor, said dielectric comprises a plurality of selective activation states and said electrode which is not connected with said transistor is connected with said write line; said transistor comprises a MOS field-effect transistor; and said capacitor is a MNOS capacitor having a dielectric comprising an SiO 2 layer and an Si 3 N 4 layer.

Claim 9

Dynamic single-transistor memory element connected to a word line and a bit line comprising: a transistor having at least two terminals and a gate terminal, connected at one of said terminals with said bit line and at said gate terminal with said word line; a capacitor having at least two electrodes connected at one of said electrodes in series to one of said two terminals of said transistor; wherein said single-transistor memory element comprises a write line, said capacitor is a metal dielectric semiconductor capacitor, said dielectric comprises a plurality of selective activation states and said electrode which is not connected with said transistor is connected with said write line; said transistor comprises a MOS field-effect transistor; said capacitor is a MNOS capacitor having a dielectric comprising an SiO 1 layer and an Si 3 N 4 layer; and said SiO 2 layer has a thickness of 1 through 3 nm.

Claim 10

Dynamic single-transistor memory element connected to a word line and a bit line comprising: a transistor having at least two terminals and a gate terminal, connected at one of said terminals with said bit line and at said gate terminal with said word line; a capacitor having at least two electrodes connected at one of said electrodes in series to one of said two terminals of said transistor; wherein said single-transistor memory element comprises a write line, said capacitor is a metal dielectric semiconductor capacitor, said dielectric comprises a plurality of selective activation states and said electrode which is not connected with said transistor is connected with said write line; said transistor comprises a MOS field-effect transistor; said capacitor is a MNOS capacitor having a dielectric comprising an SiO 1 layer and an Si 3 N 4 layer; and said SiO 2 layer has a thickness of 1 through 3 nm.

Claim 11

Dynamic single-transistor memory element connected to a word line and a bit line comprising: a transistor having at least two terminals and a gate terminal, connected at one of said terminals with said bit line and at said gate terminal with said word line; a capacitor having at least two electrodes connected at one of said electrodes in series to one of said two terminals of said transistor; wherein said single-transistor memory element comprises a write line, said capacitor is a metal dielectric semiconductor capacitor, said dielectric comprises a plurality of selective activation states and said electrode which is not connected with said transistor is connected with said write line; said transistor comprises a MOS field-effect transistor; and said capacitor is a MNOS capacitor having a dielectric comprising an SiO 2 layer having a thickness of 1 to 3 nm and an SiN 4 layer having a thickness of 40 to 60 nm.

Claim 12

Dynamic single-transistor memory element connected to a word line and a bit line comprising: a transistor having at least two terminals and a gate terminal, connected at one of said terminals with said bit line and at said gate terminal with said word line; a capacitor having at least two electrodes connected at one of said electrodes in series to one of said two terminals of said transistor; wherein said single-transistor memory element comprises a write line, said capacitor is a metal dielectric semiconductor capacitor, said dielectric comprises a plurality of selective activation states and said electrode which is not connected with said transistor is connected with said write line; said transistor comprises a MOS field-effect transistor; and said capacitor is a MNOS capacitor having a dielectric comprising an SiO 2 layer having a thickness of 1 to 3 nm and an SiN 4 layer having a thickness of 40 to 60 nm.

Claim 13

Dynamic single-transistor memory element as defined in claim 1, wherein the write line is galvanically connected with the write lines of the respective elements.

Claim 14

Dynamic single-transistor memory element as defined in claim 1, wherein the write line is galvanically connected with the write lines of different group elements of a memory matrix combined in groups.

Claim 15

Dynamic single-transistor memory element as defined in claim 2, wherein the write line is galvanically connected with the write lines of the respective elements.

Claim 16

Dynamic single-transistor memory element as defined in claim 2, wherein the write line is galvanically connected with the write lines of different group elements of a memory matrix combined in groups.

Claim 17

Dynamic single-transistor memory element as defined in claim 3, wherein the write line is galvanically connected with the write lines of the respective elements.

Claim 18

Dynamic single-transistor memory element as defined in claim 3, wherein the write line is galvanicaly connected with the write lines of different group elements of a memory matrix combined in groups.

Claim 19

Dynamic single-transistor memory element as defined in claim 4, wherein the write line is galvanically connected with the write lines of the respective elements.

Claim 20

Dynamic single-transistor memory element as defined in claim 4, wherein the write line is galvanically connected with the write lines of different group elements of a memory matrix combined in groups.

Claim 21

Dynamic single-transistor memory element as defined in claim 5, wherein the write line is galvanically connected with the write lines of the respective elements.

Claim 22

Dynamic single-transistor memory element as defined in claim 5, wherein the write line is galvanically connected with the write lines of different group elements of a memory matrix combined in groups.

Claim 23

Dynamic single-transistor memory element as defined in claim 6, wherein the write line is galvanically connected with the write lines of the respective elements.

Claim 24

Dynamic single-transistor memory element as defined in claim 6, wherein the write line is galvanically connected with the write lines of different group elements of a memory matrix combined in groups.

Claim 25

In a single-transistor memory element connected to a word line and a bit line and comprising a write line, a transistor, and a capacitor having a silicon surface, connected in series thereto, a method of: switch connecting said transistor for writing-in information via the word line; applying a negative voltage to said write line for writing-in information through said bit line while using a p-channel transistor as said transistor, such that a flat-band voltage of said capacitor remains constant during storage of information "1" in the memory element and such that said flat-band voltage of said capacitor is sifted (instant t 1 ) during storage of information "0" in said memory element; applying a negative read voltage to said capacitor for reading out information through said write line, said read voltage being referenced so that in a case of said stored information "1" an inversion boundary layer is formed at the silicon surface of said capacitor, and in case of said stored information "0" a depletion layer is formed (instant t 2 ) at said silicon surface at said capacitor; and applying a positive voltage pulse (instant t 3 ) to said write line to erase the information stored in said capacitor.

Claim 26

In a single-transistor memory element connected to a word line and a bit line and comprising a write line, a transistor, and a capacitor having a silicon surface, connected in series thereto, a method of: switch connecting said transistor for writing-in information via the word line; applying a negative voltage to said write line for writing-in information through said bit line while using a p-channel transistor as said transistor, such that a flat-band voltage of said capacitor remains constant during storage of information "1" in the memory element and such that said flat-band voltage of said capacitor is sifted (instant t 1 ) during storage of information "0" in said memory element; applying a negative read voltage to said capacitor for reading out information through said write line, said read voltage being referenced so that in a case of said stored information "1" an inversion boundary layer is formed at the silicon surface of said capacitor, and in case of said stored information "0" a depletion layer is formed (instant t 2 ) at said silicon surface at said capacitor; and applying a positive voltage pulse (instant t 3 ) to said write line to erase the information stored in said capacitor.

Claim 29

The method as defined in claim 20, wherein the method further comprises the steps of: applying said negative voltage to write line for said read-out opeation such that for said stored information "0" a depletion layer is formed at the silicon surface of said capacitor and for said stored information "1" an inversion boundary layer is formed at said silicon surface of said capacitor.

Claim 30

The method as defined in claim 20, wherein the method further comprises the steps of: applying said negative voltage to said write line for read-out operation, where said negative voltage applied has an absolute value greater than two values of the flat-band voltages of the capacitors and integrating it such that the surface potential of said inversion boundary layer, in a case of the constant flat-band voltage of the capacitor adjusts itself to the value of the voltage of the write line less the flat-band voltage, and in a case of the shifted flat-band voltage of the capacitor, it adjusts itself to the value of the voltage present at the write line less the value of the shifted flat-band voltage; and directing said integrated voltage of the write line to the bit line by way of said transistor for purposes of read-out.

Claim 31

The method as defined in claim 20, wherein the method further comprises the step of applying voltages of opposite polarity in a case of using an n-channel transistor as said transistor.